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Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials

  • Symposium: Bulk Metallic Glasses VI
  • Published:
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Abstract

Residual stresses in crystalline or glassy materials often play a key role in the performance of advanced devices and components. However, stresses in amorphous materials cannot easily be determined at the micron scale by diffraction, or by other conventional laboratory methods. In this article, a technique for mapping residual stress profiles in amorphous materials with high spatial definition is presented. By applying a focused ion beam (FIB)–based semidestructive mechanical relaxation method, the stresses are mapped in a peened and fatigued bulk metallic glass (BMG) (Zr50Cu40Al10 at. pct). The residual stresses are inferred using finite element analysis (FEA) of the surface relaxations, as measured by digital image correlation (DIC), that occur when a microslot is micromachined by FIB. Further, we have shown that acceptable accuracy can in most cases be achieved using a simple analytical model of the slot. It was found that the fatigue cycling significantly changes the distribution of compressive residual stresses with depth in the plastically deformed surface layer. Our observations point to the scalability of this method to map residual stresses in volumes as small as 1 × 1 × 0.2 μm3 or less.

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Acknowledgments

The stress measurements were made within the Stress and Damage Characterization Unit at the University of Manchester supported by the Light Alloys Towards Environmentally Sustainable Transport (LATEST) Engineering and Physical Sciences Research Council (EPSRC) Portfolio Project. Two of the authors (JT and PKL) are supported by the National Science Foundation International Materials Institutes (IMI) and Combined Research and Curriculum Development (CRCD) Programs, Tennessee. The nanoindentation results were obtained from Reference 27 and were developed by Professor L.L. Shaw of the University of Connecticut, Connecticut.

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Author notes

  1. Richard M. Langford (Senior Experimental Officer, Facility Manager)

    Present address: Electron Microscopy Suite, The Canvendish Laboratory, University of Cambridge, Cambridge, CB3 0HE, United Kingdom

Authors and Affiliations

  1. The School of Materials, The University of Manchester, Grosvenor St, Manchester, M1 7HS, United Kingdom

    Bartlomiej Winiarski (Postdoctoral Research Associate), Richard M. Langford (Senior Experimental Officer, Facility Manager) & Philip J. Withers (Professor)

  2. Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN, 37996, USA

    Jiawan Tian (Postdoctoral Scholar) & Peter K. Liaw (Professor and Ivan Racheff Chair of Excellence)

  3. Materials Science and Engineering Department, Himeji Institute of Technology, Shosha, 2167, Himeji, Japan

    Yoshihiko Yokoyama (Associate Professor)

Authors
  1. Bartlomiej Winiarski
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  2. Richard M. Langford
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  3. Jiawan Tian
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  6. Philip J. Withers
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Corresponding author

Correspondence to Philip J. Withers.

Additional information

This article is based on a presentation given in the symposium “Bulk Metallic Glasses VI,” which occurred during the TMS Annual Meeting, February 15–19, 2009, in San Francisco, CA, under the auspices of TMS, the TMS Structural Materials Division, TMS/ASM: Mechanical Behavior of Materials Committee.

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Winiarski, B., Langford, R.M., Tian, J. et al. Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials. Metall Mater Trans A 41, 1743–1751 (2010). https://doi.org/10.1007/s11661-009-0127-4

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