Skip to main content
Log in

On the Optimal Pattern for Displacement Field Measurement: Random Speckle and DIC, or Checkerboard and LSA?

  • Research paper
  • Published:
Experimental Mechanics Aims and scope Submit manuscript

Abstract

This paper deals with the optimal pattern that can be used to retrieve displacement fields by minimizing the optical residual calculated over small regions of contrasted images. This minimization is generally performed in the spatial domain by processing speckle patterns with DIC. Another option is also considered here. It consists in switching this minimization to the Fourier domain. The benefit is that periodic patterns can be processed, which is generally not possible with DIC. It turns out that the optimal pattern in terms of sensor noise propagation is theoretically the checkerboard if it is correctly sampled, and this pattern is periodic. The reason why checkerboard is optimal is that the image gradient is maximum in this case. In addition, the minimization of the image residual in this case has a quasi-direct solution, which considerably speeds up the calculations. We first recall the basics of the different techniques used in the paper, namely classic subset-based DIC, and a spectral method called Localized Spectrum Analysis (LSA). A recent deconvolution procedure introduced to enhance the metrological performance of DIC and LSA is also briefly recalled and used in this study. Synthetic images are considered to assess in different cases the displacement resolution, as well as other sources of spurious spatial fluctuations observed in the displacement fields such as the pattern-induced bias with DIC. The main conclusion is that using checkerboards instead of random speckles leads to measurements featuring a better compromise between spatial resolution and measurement resolution.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10
Fig. 11
Fig. 12
Fig. 13
Fig. 14
Fig. 15
Fig. 16
Fig. 17
Fig. 18
Fig. 19
Fig. 20
Fig. 21

Similar content being viewed by others

References

  1. Schreier HW, Sutton M, Michael A (2002) Systematic errors in digital image correlation due to undermatched subset shape functions. Exp Mech 42(3):303–310

    Article  Google Scholar 

  2. Yu L, Pan B (2015) The errors in digital image correlation due to overmatched shape functions. Meas Sci Technol 26(4):045202

    Article  Google Scholar 

  3. Bornert M, Brémand F, Doumalin P, Dupré J-C, Fazzini M, Grédiac M, Hild F, Mistou S, Molimard J, Orteu J-J, Robert L, Surrel Y, Vacher P, Wattrisse B (2009) Assessment of digital image correlation measurement errors: methodology and results. Exp Mech 49(3):353–370

    Article  Google Scholar 

  4. Tong W (2013) Formulation of Lucas-Kanade digital image correlation algorithms for non-contact deformation measurements: a review. Strain 49(4):313–334

    Article  Google Scholar 

  5. Su Y, Zhang Q, Gao Z, Xu X, Wu X (2015) Fourier-based interpolation bias prediction in digital image correlation. Opt Express 23(15):19242–19260

    Article  Google Scholar 

  6. Réthoré J (2010) A fully integrated noise robust strategy for the identification of constitutive laws from digital images. Int J Numer Methods Eng 84(6):631–660

    Article  MATH  Google Scholar 

  7. Blaysat B, Grédiac M, Sur F (2016) Effect of interpolation on noise propagation from images to DIC displacement maps. Int J Numer Methods Eng 108(3):213–232

    Article  MathSciNet  Google Scholar 

  8. Crammond G, Boyd SW, Dulieu-Barton JM (2013) Speckle pattern quality assessment for digital image correlation. Opt Lasers Eng 51:1368–1378

    Article  Google Scholar 

  9. Su Y, Zhang Q, Xu X, Gao Z (2016) Quality assessment of speckle patterns for DIC by consideration of both systematic errors and random errors. Opt Lasers Eng 86:132–142

    Article  Google Scholar 

  10. Dong YL, Pan B (2017) A review of speckle pattern fabrication and assessment for digital image correlation. Exp Mech 57(8):1161–1181

    Article  Google Scholar 

  11. Chen Z, Shao X, Xu X, He X (2018) Optimized digital speckle patterns for digital image correlation by consideration of both accuracy and efficiency. Appl Opt 57(4):884–893

    Article  Google Scholar 

  12. Bomarito GF, Hochhalter JD, Ruggles TJ, Cannon AH (2017) Increasing accuracy and precision of digital image correlation through pattern optimization. Opt Lasers Eng 91:73– 85

    Article  Google Scholar 

  13. Blaysat B, Grédiac M, Sur F (2016) On the propagation of camera sensor noise to displacement maps obtained by DIC. Exp Mech 56(6):919–944

    Article  Google Scholar 

  14. Pan B, Lu Z, Xie H (2010) Mean intensity gradient: an effective global parameter for quality assessment of the speckle patterns used in digital image correlation. Opt Lasers Eng 48(4):469– 477

    Article  Google Scholar 

  15. Lecompte D, Smits A, Bossuyt S, Sol H, Vantomme J, Van Hemelrijck D, Habraken AM (2006) Quality assessment of speckle patterns for digital image correlation. Opt Lasers Eng 44(11):1132–1145

    Article  Google Scholar 

  16. Bossuyt S (2013) Optimized patterns for digital image correlation. In: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, Vol 3: Imaging Methods for Novel Materials and Challenging Applications

  17. Lavatelli A, Balcaen R, Zappa E, Debruyne D (2019) Closed-loop optimization of DIC speckle patterns based on simulated experiments. IEEE Transactions on Instrumentation and Measurement, pp 1–11 On line (early access article). https://doi.org/10.1109/TIM.2019.2890890

  18. Grédiac M, Blaysat B, Sur F (2017) A critical comparison of some metrological parameters characterizing local digital image correlation and grid method. Exp Mech 57(3):871–903

    Article  Google Scholar 

  19. Grédiac M, Blaysat B, Sur F (2019) Extracting displacement and strain fields from checkerboard images with the localized spectrum analysis. Exp Mech 59(2):207–218

    Article  Google Scholar 

  20. International vocabulary of metrology. Basic and general concepts and associated terms, 2008. Third edition

  21. Chrysochoos A, Surrel Y (2012) Chapter 1. Basics of metrology and introduction to techniques. In: GrÈdiac M, Hild F (eds) Full-field Measurements and Identification in Solid Mechanics. Wiley, Hoboken, pp 1–29

  22. Wittevrongel L, Lava P, Lomov SV, Debruyne D (2015) A self adaptive global digital image correlation algorithm. Exp Mech 55(2):361–378

    Article  Google Scholar 

  23. DIC challenge: http://sem.org/dic-challenge/

  24. Blaber J, Adair B, Antoniou A (2015) Ncorr: Open-source 2d digital image correlation matlab software. Experimental Mechanics. https://doi.org/10.1007/s11340-015-0009-1

  25. Badulescu C, Bornert M, Dupré J-C, Equis S, Grédiac M, Molimard J, Picart P, Rotinat R, Valle V (2013) Demodulation of spatial carrier images: Performance analysis of several algorithms. Exp Mech 53(8):1357–1370

    Article  Google Scholar 

  26. Grédiac M, Sur F, Badulescu C, Mathias J-D (2013) Using deconvolution to improve the metrological performance of the grid method. Opt Lasers Eng 51(6):716–734

    Article  Google Scholar 

  27. Sutton M, Orteu JJ, Schreier H (2009) Image Correlation for Shape, Motion and Deformation Measurements. Basic Concepts, Theory and Applications. Springer

  28. Neggers J, Blaysat B, Hoefnagels JPM, Geers MGD (2016) On image gradients in digital image correlation. Int J Numer Methods Eng 105(4):243–260

    Article  MathSciNet  Google Scholar 

  29. Sur F, Grédiac M (2016) Influence of the analysis window on the metrological performance of the grid method. J Math Imaging Vis 56(3):472–498

    Article  MathSciNet  MATH  Google Scholar 

  30. Grafarend EW (2006) Linear and Nonlinear models: Fixed Effects, Random Effects, and Mixed Models Walter de Gruyter

  31. Grédiac M, Sur F, Blaysat B (2016) The grid method for in-plane displacement and strain measurement: a review and analysis. Strain 52(3):205–243

    Article  Google Scholar 

  32. Sur F, Grédiac M (2014) Towards deconvolution to enhance the grid method for in-plane strain measurement. Inverse Probl Imag 8(1):259–291

    Article  MathSciNet  MATH  Google Scholar 

  33. Grédiac M, Blaysat B, Sur F (2019) A robust-to-noise deconvolution algorithm to enhance displacement and strain maps obtained by local DIC and LSA. Exp Mech 59(2):219–243

    Article  Google Scholar 

  34. Blaysat B, Neggers J, Grédiac M, Sur F (2019) Towards criteria characterizing the metrological performance of full-field measurement techniques. Application to the comparison between local and global versions of DIC. Accepted, https://doi.org/10.1007/s11340-019-00566-4

  35. Reu P (2014) All about speckles: Aliasing. Exp Tech 38(5):1–3

    Article  Google Scholar 

  36. Sur F, Blaysat B, Grédiac M (2018) Rendering deformed speckle images with a Boolean model. J Math Imaging Vis 60(5):634–650

    Article  MathSciNet  MATH  Google Scholar 

  37. Reu PL, Blaysat B, Helm J, Jones EMC, Iadicola M (2019) Update on the DIC challenge 2.0 and the stereo-DIC challenge. In: SEM Annual Conference Expanding the Boundaries of Mechanics, Reno, USA. Proceedings of the conference

  38. Pan B, Xie H, Wang Z, Qian K, Wang Z (2008) Study on subset size selection in digital image correlation for speckle patterns. Opt Express 16(10):7037–7048

    Article  Google Scholar 

  39. Wang YQ, Sutton M, Bruck H, Schreier HW (2009) Quantitative error assessment in pattern matching: effects of intensity pattern noise, interpolation, strain and image contrast on motion measurements. Strain 45(2):160–178

    Article  Google Scholar 

  40. Sur F, Blaysat B, Grédiac M (2016) Determining displacement and strain maps immune from aliasing effect with the grid method. Opt Lasers Eng 86:317–328

    Article  Google Scholar 

  41. Foi A, Trimeche M, Katkovnik V, Egiazarian K (2008) Practical Poissonian-Gaussian noise modeling and fitting for single-image raw-data. IEEE Trans Image Process 17(10):1737– 1754

    Article  MathSciNet  MATH  Google Scholar 

  42. Hild F, Roux S (2012) Comparison of local and global approaches to digital image correlation. Exp Mech 52(9):1503–1519

    Article  Google Scholar 

  43. Savitzky A, Golay MJE (1964) Smoothing and differentiation of data by simplified least-squares procedures. Anal Chem 36(3):1627–1639

    Article  Google Scholar 

  44. Lehoucq RB, Reu PL, Turner DZ (2017) The effect of the ill-posed problem on quantitative error assessment in digital image correlation. Experimental Mechanics. Accepted

  45. Fayad S, Reu PL (2019) Pattern-induced bias in out-of-plane motion in digital image correlation. In: SEM annual conference Expanding the Boundaries of Mechanics, Reno, USA. Proceedings of the conference

  46. Fayad SS, Seidl DT, Reu PL (2019) Spatial DIC errors due to pattern-induced bias and grey level discretization. Experimental Mechanics. Accepted, https://doi.org/10.1007/s11340-019-00553-9

  47. Sur F, Blaysat B, Grédiac M (2019) On biases in displacement estimation for image registration, with a focus on photomechanics. Submitted

  48. Piro JL, Grédiac M (2004) Producing and transferring low-spatial-frequency grids for measuring displacement fields with moiré and grid methods. Exp Tech 28(4):23–26

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to M. Grédiac.

Additional information

Publisher’s Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Appendix

Appendix

The aim of this section is to show how to determine the value of used in LSA, which is equivalent to the value of 2M + 1 used in DIC. “Equivalent” means here that DIC used with a subset size equal to 2M + 1 features the same bias and spatial resolution as LSA used with a standard deviation equal to . As mentioned earlier, it does not mean that the outputs of DIC and LSA with these equivalent parameters give the same estimates of a real displacement field featuring strain gradients.

Predicting the bias for given values of 2M + 1 and can be made as follows. Assuming the real (and sought) displacement is a sine function of amplitude A, the bias as defined in “Definitions and Techniques Used in the Present Study” can be directly estimated with the transfer function of the filter characterizing the measuring technique. This filter is the Savitzky-Golay filter for DIC [1] and a Gaussian filter for LSA [18]. By definition, the transfer function of the filter is equal to its Fourier transform. Indeed, in linear translation-invariant signal processing, the transfer function of any linear filter is defined as the Fourier transform of its impulse response.

Case of DIC

With DIC, we deal by definition with the discrete form of the transfer function, which can be written as follows as a function of the frequency f of the prescribed displacement

$$ \widehat{h}^{DIC}(f)=h(0)+2\sum\limits_{i=1}^{M} h(i)\cos \left( 2i \pi f\right) $$
(13)

Since we deal with images, we have sampled signals. Hence f lies in this equation between 0 and the Nyquist frequency, equal here to 0.5 pixel− 1. The h(i) coefficients, i ∈ [0 M], are the Savitzky-Golay coefficients defined in [43] for DIC, as explained in [1] and demonstrated in [47]. These coefficients depend on M and on the degree of the matching function used to express the displacement field within the subset. In the common case, for which the matching function is linear, the Savitzky-Golay coefficients are all equal to \(\frac {1}{2M+1}\) [43].

Case of LSA

With LSA, the same discrete form could be chosen for the Fourier transform, but a continuous form of the Fourier transform is also available, which is not the case for DIC. This continuous form can therefore be used for the sake of convenience. Since a Gaussian window of standard deviation is used here in the WFT, the Fourier transform of the filter used with LSA is also a Gaussian function. Indeed, the Fourier transform of a Gaussian function is also a Gaussian function, which is a classic result in signal processing. This transfer function can be written as follows [31]:

$$ \widehat{h}^{LSA}(f)=e^{-2\pi^{2}\ell^{2}f^{2}} $$
(14)

Equivalence Between 2M + 1 and for a Given Value of λ

As a consequence of the two preceding equations, finding the standard deviation of a Gaussian window used in LSA, which is equivalent, in terms of bias and spatial resolution, to a subset size 2M + 1 used in DIC, consists of the following steps:

  1. 1.

    choosing the same value for the bias λ for both DIC and LSA, which gives:

    $$ \widehat{h}^{DIC}(f)=\widehat{h}^{LSA}(f)=1-\lambda $$
    (15)
  2. 2.

    for a given subset size 2M + 1, finding numerically (no analytical solution is available) the highest frequency f, which is the solution of Eq. 13. Thus

    $$ h(0)+2\sum\limits_{i=1}^{M} h(i)\cos \left( 2i \pi f\right)=1-\lambda $$
    (16)
  3. 3.

    inverting Eq. 14 in order to deduce the corresponding standard deviation for the Gaussian window used in the WFT. Since \(d=\frac {1}{f}\), we have

    $$ \ell=\frac{d}{\pi}\sqrt{\frac{-\log\left( 1-\lambda\right)}{2}}, \quad \text{with}~0<\lambda<1 $$
    (17)

Influence of λ

Choosing a bias λ = 10% for both techniques is somewhat arbitrary. Changing the value of the bias, for instance by considering λ = 5% and λ = 20% instead of λ = 10%, has a great impact on the spatial resolution d but does not really influence the standard deviation of the Gaussian window used in the WFT, as illustrated in the examples shown in Table 3 in a particular (but representative) case, namely 2M + 1 = 21 pixels. d and are calculated for various values of λ fixed a priori. It can be seen that the value of equivalent to 2M + 1 is nearly unaffected when the bias λ changes. This makes the results nearly independent of this arbitrary choice.

Particular Case of Small Values of λ and DIC Used with Linear Matching Functions

We demonstrate here that if linear matching functions are considered in DIC, a closed-form expression giving as a function of M is available. In addition, does not depend, at first approximation, on the bias λ when λ is small. We consider first again Eq. 16. Assuming that 2Mπf is small enough, the cosines involved in this equation can be replaced by their third-order approximation. Thus Eq. 16 becomes

$$ h(0)+2\sum\limits_{i=1}^{M} h(i)\left( 1-\frac{(2i \pi f)^{2}}{2}\right)=1-\lambda $$
(18)

Since \(h(0)+2\sum \limits _{i=1}^{M} h(i) =1\) [43], we have

$$ 4\pi^{2} f^{2}\sum\limits_{i=1}^{M} i^{2}h(i)=\lambda $$
(19)

Let us now focus on linear matching functions. In this case the Savitzky-Golay coefficients are all equal to \(h(i)=\frac {1}{2M+1},~\forall i \in \{1{\dots } M\}\) [43]. Hence

$$ \sum\limits_{i=1}^{M} i^{2}h(i)=\frac{1}{2M+1}\sum\limits_{i=1}^{M} i^{2} $$
(20)

According to the Faulhaber’s formula, we have \(\sum \limits _{i=1}^{M} i^{2}=\frac {2M^{3}+3M^{2}+M}{6}\), so after simplification, we can deduce from Eq. 19

$$ f=\frac{1}{2\pi }\sqrt{\frac{6\lambda }{M(M+1)}} $$
(21)

It can be checked that the third-order approximation of the cosines made in Eq. 18 still remains acceptable for significant values of M. For instance, with M = 10, which is the case considered in the examples discussed in this paper, the error made by substituting the quantity corresponding to the greatest value of the index i of the sum is equal to 11%. The error made on the other terms of this approximated sum is automatically lower. In addition, the weight of these terms in the sum is higher than the weight of the last term, the cosine being a decreasing function just after 0.

Plugging Eq. 21 into Eq. 17, where \(f=\frac {1}{d}\), leads to

$$ \ell=\sqrt{\frac{M(M+1)}{3}}\times \sqrt{\frac{-log\left( 1-\lambda\right)}{\lambda}}, \quad \text{with}~0<\lambda<1 $$
(22)

If λ is small, then \(\frac {-log\left (1-\lambda \right )}{\lambda }\simeq 1\) and Eq. 22 reduces to

$$ \ell=\sqrt{\frac{M(M+1)}{3}} $$
(23)

For instance, in the case 2M + 1 considered in Table 3 above, Eq. 23 gives = 6.05 pixels, which is very close to the values of given in this table for various values of λ. This result shows that in the particular case of DIC used with linear matching functions, does not really depend on λ when λ is small. and thus the width of the Gaussian window used in LSA only depend on the size of the subset 2M + 1 used in DIC.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Grédiac, M., Blaysat, B. & Sur, F. On the Optimal Pattern for Displacement Field Measurement: Random Speckle and DIC, or Checkerboard and LSA?. Exp Mech 60, 509–534 (2020). https://doi.org/10.1007/s11340-019-00579-z

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11340-019-00579-z

Keywords

Navigation