Abstract
Finite element method (FEM) simulations of the adhesive contact between a nanoscale tip and a silicon oxide substrate covered with graphene were performed, modelling experimental atomic force microscopy pull-off measurements. Simulations showed a slight increase in the pull-off force as layer number increased. This small enhancement was within reported experimental error, agreeing with the experimental findings of layer-independent adhesion forces. Pull-off forces did not vary with the elastic strain in the system for a given number of layers, but were influenced by the greater adhesive stresses for tip–graphene interaction compared with tip–substrate interactions. FEM simulations were also performed on suspended graphene and showed that the adhesive forces increased slightly beyond one layer of graphene, but then varied little from two to four layers of graphene. The results indicate that while there is some local delamination of the graphene sheets from the substrate, the adhesive stresses between the graphene layers in multilayer graphene effectively prevent out-of-plane mechanical deformation of the graphene layers that could result from tip–graphene interactions. Thus, the increased pull-off forces observed beyond one monolayer results from a change in the amount of material between the tip and substrate, or in this case the number of graphene layers, thus increasing the van der Waals force between tip and graphene.
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Acknowledgements
P.G. and P.E. would like to acknowledge funding from the Natural Sciences and Engineering Research Council (NSERC) of Canada through the Discovery Grant program, funding from the University of Calgary Seed Grant program and University of Calgary Startup Funding. The authors would also like to acknowledge fruitful conversations with Dr. Salvatore Federico at the University of Calgary. Q.L. would like to thank the support from the National Natural Science Foundation of China (11422218, 11432008) and the Research Fund of State Key Laboratory of Tribology of Tsinghua University (SKLT2015D01). R.W.C. acknowledges support from the National Science Foundation, Grant Number CMMI-1401164.
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Appendix
Additional pull-off simulations have been conducted with a 7.5 nm radius on both supported and suspended graphene. The results from these additional simulations show the same trend in terms of an increasing pull-off force with number of graphene layers, as well as a slight increase in the observed work of adhesion. These results are graphically depicted in Fig. 10 as well as Tables 6, 7, 8, and 9.
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Gong, P., Li, Q., Liu, XZ. et al. Adhesion Mechanics between Nanoscale Silicon Oxide Tips and Few-Layer Graphene. Tribol Lett 65, 61 (2017). https://doi.org/10.1007/s11249-017-0837-5
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DOI: https://doi.org/10.1007/s11249-017-0837-5