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van der waals interactions of graphene membranes with a sharp silicon tip

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Abstract

Adhesive interactions of suspended graphene membranes were studied by using non-contact atomic force microscopy (AFM) with a sharp silicon tip. Circular graphene membranes were prepared by transferring large-area monolayer graphene onto a perforated substrate. The non-contact AFM imaging showed a fluctuation of the graphene membrane. The maximum deflection of a 2.7- μm-diameter membrane was about 26.8 nm. The dynamic deflection of the membrane is attributed to the van der Waals interactions between the graphene membrane and the silicon tip of the AFM, and the interaction force was estimated to be about 3.0 nN.

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Authors and Affiliations

  1. School of Mechanical Engineering, Sungkyunkwan University, Suwon, 16419, Korea

    Ji Won Suk

  2. Department of Bionanotechnology, Gachon University, Seongnam, 13120, Korea

    TaeYoung Kim

  3. The Materials and Science Program, The University of Texas at Austin, Austin, Texas, 78712, USA

    Richard D. Piner

Authors
  1. Ji Won Suk
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  2. TaeYoung Kim
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  3. Richard D. Piner
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Correspondence to Ji Won Suk.

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Suk, J.W., Kim, T. & Piner, R.D. van der waals interactions of graphene membranes with a sharp silicon tip. Journal of the Korean Physical Society 67, 2003–2006 (2015). https://doi.org/10.3938/jkps.67.2003

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  • DOI: https://doi.org/10.3938/jkps.67.2003

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