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Nanoscale fretting wear study by scanning probe microscopy

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Nanoscale fretting wear was studied by using scanning probe microscopy (SPM) and a newly proposed unified approach of slip index. The production of SiO2 colloidal probes and the SPM calibration are described. Partial and gross slip fretting with displacement amplitudes from 5 to 500 nm were used for the study. Friction coefficient and nanowear results are presented showing a substantial increase of the friction at the transition from partial to gross slip and a significant difference between damaged surfaces in the two fretting regimes.

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Authors and Affiliations

  1. Department of Mechanical Engineering, Technion, Haifa, 32000, Israel

    M. Varenberg, I. Etsion & G. Halperin

Authors
  1. M. Varenberg
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  2. I. Etsion
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  3. G. Halperin
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Correspondence to I. Etsion.

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Varenberg, M., Etsion, I. & Halperin, G. Nanoscale fretting wear study by scanning probe microscopy. Tribol Lett 18, 493–498 (2005). https://doi.org/10.1007/s11249-005-3609-6

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  • DOI: https://doi.org/10.1007/s11249-005-3609-6

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