Abstract
We present the results of studies of the 1/f noise spectrum in light-emitting diodes and lasers with nanoscale structures based on GaAs and its solid solutions. Leakage current was detected from an analysis of I–V characteristics and voltage noise spectrum dependences on the current. Leakage current appeared to be the main source of noise in the samples and leads to intensity fluctuations of the spontaneous radiation.
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Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Radiofizika, Vol. 51, No. 2, pp. 149–161, February 2008.
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Belyakov, A.V., Klyuev, A.V. & Yakimov, A.V. Manifestation of 1/f leakage noise in nanoscale light-emitting structures. Radiophys Quantum El 51, 134–144 (2008). https://doi.org/10.1007/s11141-008-9014-x
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DOI: https://doi.org/10.1007/s11141-008-9014-x