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Structural, optical and microscopic properties of chemically deposited Mo0.5W0.5Se2 thin films

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Abstract

Mo0.5W0.5Se2 thin films were obtained by using relative simple chemical route at room temperature. Various preparative conditions of the thin films are outlined. The films were characterized by X-ray diffraction, scanning electron microscope, optical and electrical properties. The grown films were found to be uniform, well adherent to substrate and brown in color. The X-ray diffraction pattern shows that thin films have a hexagonal phase. Optical properties show a direct band gap nature with band gap energy 1.44 eV and having specific electrical conductivity in the order of 10−5 (Ωcm)−1.

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Authors and Affiliations

  1. Department of Chemistry, Solid State Laboratory, Shivaji University, Kolhapur, Maharashtra, India

    P. P. Hankare

  2. Department of Chemistry, Walchand College, Solapur, Maharashtra, India

    A. H. Manikshete

  3. Department of Chemistry, KIT’s College of Engineering, Kolhapur, Maharashtra, India

    D. J. Sathe

  4. Department of Chemistry, J.S.M. College, Alibag, Maharashtra, India

    P. A. Chate

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  1. P. P. Hankare
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  2. A. H. Manikshete
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  3. D. J. Sathe
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  4. P. A. Chate
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Correspondence to D. J. Sathe.

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Hankare, P.P., Manikshete, A.H., Sathe, D.J. et al. Structural, optical and microscopic properties of chemically deposited Mo0.5W0.5Se2 thin films. J Mater Sci: Mater Electron 21, 698–701 (2010). https://doi.org/10.1007/s10854-009-9980-6

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  • DOI: https://doi.org/10.1007/s10854-009-9980-6

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