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Characterization of electroplated FeSe thin films

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Abstract

Thin films of iron selenide (FeSe) were electrodeposited on tin oxide coated conducting glass substrates at various bath temperatures, deposition potential and solution pH values. The deposited films were characterized by X-ray diffraction, energy dispersive X-ray analysis, scanning electron microscopy and optical absorption techniques, respectively. The structure was found to be hexagonal with preferential orientation along {002} plane. X-ray line profile analysis technique by the method of variance has been used to evaluate the microstructural parameters. The variation of microstructural parameters with bath temperature, deposition potential and solution pH values were studied. The observed results are discussed in detail.

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Authors and Affiliations

  1. Department of Physics, Alagappa University, Karaikudi, 630 003, India

    S. Thanikaikarasan, T. Mahalingam & M. Raja

  2. Department of Electrical and Computer Engineering, The University of Arizona, Tucson, AZ, 85721, USA

    Taekyu Kim

  3. Department of Electrical and Computer Engineering, Ajou University, Suwon, 443 749, Korea

    Yong Deak Kim

Authors
  1. S. Thanikaikarasan
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  2. T. Mahalingam
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  3. M. Raja
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  4. Taekyu Kim
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  5. Yong Deak Kim
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Correspondence to T. Mahalingam.

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Thanikaikarasan, S., Mahalingam, T., Raja, M. et al. Characterization of electroplated FeSe thin films. J Mater Sci: Mater Electron 20, 727–734 (2009). https://doi.org/10.1007/s10854-008-9794-y

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  • DOI: https://doi.org/10.1007/s10854-008-9794-y

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