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Influence of substrate on film thickness, microstructural, compositional and optical properties of iron diselenide thin films

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Abstract

In the present communication, we have reported the effect of substrate on electrodeposited iron diselenide thin films. The deposited films have been characterized by X-ray diffraction, Energy dispersive analysis by X-rays, Scanning electron microscopy, Ultraviolet Visible Infrared spectroscopic techniques for the determination of structural, morphological, compositional and optical properties. Structural properties indicated that the prepared films possess orthorhombic structure. The parameters such as crystallite size, strain, dislocation density and stacking fault probability are determined for the deposited films. Compositional analysis indicated that the prepared films found to be nearly stoichiometry. The band gap value of the deposited films is in the range between 1.03 and 1.08 eV.

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References

  1. A.U. Ubale, N.R. Weelkar, A.V. Mitkari, Mater. Sci. Semicond. Process. 27, 280 (2014)

    Article  Google Scholar 

  2. A.K. Dutta, S.K. Maji, A. Mondal, B. Karmaker, P. Biswas, D. Adikary, Sens. Actuators Chem. B 173, 724 (2012)

    Article  Google Scholar 

  3. A.U. Ubale, Y.S. Sakhare, M.R. Belkhedkar, Mater. Lett. 92, 111 (2013)

    Article  Google Scholar 

  4. A.U. Ubale, Y.S. Sakhare, A. Singh, Mater. Res. Bull. 48, 863 (2013)

    Article  Google Scholar 

  5. J.J. Hassan, M.A. Mahdi, A. Ramizy, H.A. Hassan, Z. Hassan, Superlattices Microstruct. 53, 31 (2013)

    Article  Google Scholar 

  6. S. Thanikaikarasan, Ionics, 1–8 (in press) https://doi.org/10.1007/s11581-017-2292-6

  7. P. Jeyakumar, S. Thanikaikarasan, B. Natarajan, J. Mater Sci. Mater. Electron. 28, 2538 (2017)

    Article  Google Scholar 

  8. S. Thanikaikarasanan, T. Mahalingam, M. Raja, S. Velumani, Mater. Sci. Semicond. Proc. 37, 215 (2015)

    Article  Google Scholar 

  9. Joined Council for Powder Diffracted System—International Centre for Diffraction Data, File No. 21-0432, USA, (2003)

  10. A.U. Ubale, S.G. Ibrahim, J. Saudi Chem. Soc. 19, 667 (2015)

    Article  Google Scholar 

  11. B.N. Ezealigo, A.C. Nwanya, A. Simo, R.U. Osuji, R. Bucher, M. Maaza, F.I. Ezema, Arab. J. Chem. https://doi.org/10.1016/j.arabjc.2017.01.008

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Acknowledgements

One of the authors (S. Thanikaikarasan) gratefully acknowledge the Council of Scientific and Industrial Research (CSIR), New Delhi, India for providing the award of Senior Research Fellowship with File No. 9/688 (0010) 2008 to carry out this research work.

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Authors and Affiliations

  1. Department of Physics, Saveetha School of Engineering, Saveetha Institute of Medical and Technical Sciences, Chennai, Tamil Nadu, 602 105, India

    Sethuramachandran Thanikaikarasan & Rajagembu Perumal

  2. School of Physics, Alagappa University, Karaikudi, Tamil Nadu, 630 004, India

    Thaiyan Mahalingam

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  1. Sethuramachandran Thanikaikarasan
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  2. Rajagembu Perumal
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  3. Thaiyan Mahalingam
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Correspondence to Sethuramachandran Thanikaikarasan.

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Thanikaikarasan, S., Perumal, R. & Mahalingam, T. Influence of substrate on film thickness, microstructural, compositional and optical properties of iron diselenide thin films. J Mater Sci: Mater Electron 29, 15693–15698 (2018). https://doi.org/10.1007/s10854-018-9174-1

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  • DOI: https://doi.org/10.1007/s10854-018-9174-1

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