Abstract
Sn-doped In2S3 thin films are deposited on Pyrex. Tin is incorporated in the solution using SnCl2·2H2O. The properties of the films are investigated by X-ray diffraction (XRD), atomic force microscopy, scanning electron microscopy, spectrophotometry, and thermally stimulated current (TSC) measurements. XRD analysis reveals that the films become almost amorphous when tin exceeds well determined optimum quantity. The investigation of optical properties shows that the band gap depends on the value of the Sn concentration. It is also observed that upon adding the optimum quantity of tin, the maximum of the TSC intensity increased by 2 orders of magnitude. These results are discussed with respect to introduce the effect of tin incorporated in the physical properties.
Similar content being viewed by others
References
Lajnef M, Ezzouia H (2009) Open Appl Phys J 2:23
Barreau N, Marsillac S, Bernède JC (2000) Vaccum 56:101
John TT, Bini S, Kashiawaba Y, Abe T, Yasuhiro Y, Kartha CS, Vijayakumar KP (2003) Semicond Sci Technol 18:491
Hariskos D, Ruckh M, Rqhle U, Walter T, Schock HW, Hedstrfm J, Stolt L (1996) Sol Energy Mater Sol Cells 345:41
John TT, Mathew M, Kartha CS, Vijayakumara KP, Abeb T, Kashiwaba Y (2005) Sol Energy Mater Sol Cells 89(1):27
Li Z, Tao X, Wu Z, Zhang P, Zhang Z (2009) Ultrason Sonochem 16:221
Asenjo B, Sanz C, Guillén C, Chaparro AM, Gutiérrez MT, Herrero J (2007) Thin Solid Films 515:6041
Lokhande CD, Ennaoui A, Patil PS, Giersig M, Diesner K, Muller M, Tributsch H (1999) Thin Solid Films 340:18
Barreau N, Bernede JC, Deudon C, Brohen L, Marsillac S (2002) Thin Solid Films 241:4
Becker S, Zheng T, Elton J, Saeki M (1986) Solar Energy Mater 13:97
Mathew M, Kartha CS, Vijayakumar KP (2009) J Mater Sci Mater Electron 20:294
Puspitasari I, Gujar TP, Jung K, Joo O (2008) J Mater Process Technol 201:775
Ho CH (2010) J Cryst Growth 312:2718
Mathew M, Gopinath M, Kartha CS, Vijayakumar KP, Kashiwaba Y, Abe T (2010) Sol Energy 84:888
Yahmadi B, Kamoun N, Guasch C, Bennaceur R (2011) Mater Chem Phys 127:239
Kilani M, Yahmadi B, Kamoun N, Castagné M (2011) J Mater Sci 46:6293. doi:10.1007/s10853-011-5521-9
Buerger MJ (1960) X-ray crystallography. Wiley, New York, p 23
Couzinié-Devy F, Arzel L, Barreau N, Guilliot-Dedon C, Harel S, Lafond A, Kessler J (2010) J Cryst Growth 312:502
Cherian AS, Mathew M, Kartha CS, Vijayakumar KP (2010) Thin Solid Films 518:1779
Barreau N (2009) Solar Enegy 83:363
Sandoval-Paz MG, Sotelo-Lerma M, Valenzuela-Jàuregui JJ, Flores-Acosta M, Ramrez-Bon R (2005) Thin Solid Films 472:5
Filliard JP, Gasiot J, Jimenez J, Sanz LF, Desaja JA (1997) J Electrost 3:133
Zeenath NA, Pillai PKV, Bindu K, Lakshmi M, Vijayakumar KP (2000) J Mater Sci 35:2619. doi:10.1023/A:1004783517595
Castro RA, Nasredinov FS (2006) Glass Phys Chem 32:412
Acknowledgement
The authors wish to thank the Agence Universitaire de la Francophonie for financial support from under the interuniversity scientific cooperation projects PCSI 59113PS019 number.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Kilani, M., Guasch, C., Castagné, M. et al. Structural, optical, and electrical properties of In2S3:Sn thin films grown by chemical bath deposition on Pyrex. J Mater Sci 47, 3198–3203 (2012). https://doi.org/10.1007/s10853-011-6155-7
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10853-011-6155-7