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X-ray line broadening and photoelectrochemical studies on CdSe thin films

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Abstract

Cadmium Selenide (CdSe) thin films have been prepared on Indium doped tin oxide coated conducting glass (ITO) substrates at various deposition potential and solution pH values using potentiostatic cathodic electrodeposition technique. The deposited films are characterized using X-ray diffraction, scanning electron microscopy, energy dispersive analysis by X-rays, optical absorption, and photoelectrochemical techniques, respectively. X-ray diffraction pattern revealed that the deposited films are found to exhibit hexagonal structure with preferential orientation along (002) plane. X-ray line profile analysis technique by the method of variance has been used to evaluate the microstructural parameters such as crystallite size, rms microstrain, dislocation density, and stacking fault probability. The variation of microstructural parameters with deposition potential, solution pH values, and annealing temperature are studied. Surface morphology and film composition are investigated by scanning electron microscopy and energy dispersive analysis by X-rays, respectively. Optical absorption analysis has been carried out to evaluate the optical parameters such as refractive index, extinction coefficient, real and imaginary dielectric constants, and packing density, respectively. Photoelectrochemical solar cells are constructed using as-deposited and annealed CdSe thin films as photocathode, and their power output characteristics are studied. The experimental observations are discussed in detail.

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References

  1. Hodes G (1995) In: Rubinstein I (ed) Physical electrochemistry: principles, methods and applications. Marcel Dekker Inc., New York

    Google Scholar 

  2. Pandey RK, Sahu SN, Chandra Suresh (1996) Handbook of semiconductor electrodeposition. Marcel Dekker Inc., New York

    Google Scholar 

  3. Perna G, Capozzi V, Ambrico M, Augelli V, Ligonzo T, Minafra A, Schiavulli L, Pallara M (2004) Appl Surf Sci 233:366

    Article  CAS  Google Scholar 

  4. Hankare PP, Bhuse VM, Garadkar KM, Delekar SD, Mulla IS (2004) Semicond Sci Technol 19:70

    Article  CAS  Google Scholar 

  5. Mahalingam T, Thanikaikarasan S, Raja M, Sanjeeviraja C, Lee Soonil, Deak Kim Yong, Sebastian PJ (2007) J New Mater Electrochem Syst 10:33

    CAS  Google Scholar 

  6. Kirk-Othemer (1982) Encyclopedia of Chemical Technology, vol 20. Wiley, New York

  7. Thanikaikarasan S, Sundaram K, Mahalingam T, Velumani S, Rhee Jin-Koo (2010) Mater Sci Eng B 174:242

    Article  CAS  Google Scholar 

  8. Singh K, Mishra SSD (2002) Sol Energy Mater Sol Cells 71:115

    Article  CAS  Google Scholar 

  9. Pal U, Samanta D, Ghorai S, Samantaray BK, Chaudhuri AK (1992) J Phys D Appl Phys 25:1455

    Article  Google Scholar 

  10. Zhou XW, Lin RF, Xiao XR (1997) Appl Surf Sci 119:203

    Article  CAS  Google Scholar 

  11. Rouleau CM, Lowndes DH (1998) Appl Surf Sci 127–129:418

    Article  Google Scholar 

  12. Velumani S, Narayandass SaK, Mangalaraj D (1998) Semicond Sci Technol 13:1016

    Article  CAS  Google Scholar 

  13. Baban C, Rusu GI (2003) Appl Surf Sci 211:6

    Article  CAS  Google Scholar 

  14. Mahalingam T, Thanikaikarasan S, Dhanasekaran V, Mariappan R, Jayamurugan P, Velumani S, Rhee J-K (2010) Mater Sci Eng B 174:249

    Article  CAS  Google Scholar 

  15. Klug HR, Alexander LE (1974) X-ray diffraction procedures, 2nd edn. Wiley, New York, p 966

    Google Scholar 

  16. Shen C, Zhang X, Li H-L (2001) Mater Sci Eng B 84:265

    Article  Google Scholar 

  17. Joined Council for Powder Diffracted System-International Centre for Diffraction Data 08-0459, 2003

  18. Thanikaikarasan S, Mahalingam T, Raja M, Kim Taekyu, Kim YD (2009) J Mater Sci Mater Electron 20:24

    Article  Google Scholar 

  19. Cullity BD (1969) Elements of X-ray diffraction, 2nd edn. Addison-Wesley Publishing Company, Massachusetts

    Google Scholar 

  20. Mitra GB (1965) Acta Crystallogr 17:765

    Article  Google Scholar 

  21. Mitra GB, Misra NK (1966) Br J Appl Phys 17:1319

    Article  CAS  Google Scholar 

  22. Williamson GK, Smallman RE (1956) Philos Mag 1:34

    Article  CAS  Google Scholar 

  23. Hirsch PB (1956) Prog Math Phys 6:236

    Article  CAS  Google Scholar 

  24. Datta J, Bhattacharya C, Bandyopadhyay S (2006) Appl Surf Sci 253:2289

    Article  CAS  Google Scholar 

  25. Pawar SM, Moholkar AV, Rajpure KY, Bhosale CH (2006) J Phys Chem Solids 67:2386

    Article  CAS  Google Scholar 

  26. Harris M, Macleod HA, Ogura S, Pelletier E, Vidal B (1979) Thin Solid Films 57:173

    Article  CAS  Google Scholar 

  27. Guenther KH (1984) Appl Opt 23:3612

    Article  CAS  Google Scholar 

  28. Marple DTF (1964) J Appl Phys 35:539

    Article  CAS  Google Scholar 

  29. Czyzak SJ, Baker WM, Crane RC, Howe JB (1957) J Opt Soc Am 47:240

    Article  CAS  Google Scholar 

  30. Hale GM, Querry MR (1973) Appl Opt 12:555

    Article  CAS  Google Scholar 

  31. Frank SN, Bard AJ (1975) J Am Chem Soc 97:472

    Article  Google Scholar 

  32. Killedkar VV, Lokhande CD, Bhosale CH (1998) Indian J Pure Appl Phys 36:643

    Google Scholar 

  33. Moon H, Kathalingam A, Mahalingam T, Chu JP, Kim YD (2007) J Mater Sci Mater Electron 18:1013

    Article  CAS  Google Scholar 

Download references

Acknowledgement

One of the authors (S. Thanikaikarasan) highly thankful to Council of Scientific and Industrial Research (CSIR), New Delhi, India for the award of Senior Research Fellowship(File No. 9/688 (0010) 2008, EMR-I) to carry out this research work. The authors also thanks to DST-FIST for providing X-ray diffraction facilities in Department of Physics, Alagappa University, Karaikudi-630 003, India.

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Authors and Affiliations

  1. School of Basic Engineering and Sciences, PSN College of Engineering and Technology, Tirunelveli, 627 152, India

    S. Thanikaikarasan & X. Sahaya Shajan

  2. Department of Physics, Alagappa University, Karaikudi, 630 003, India

    V. Dhanasekaran & T. Mahalingam

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  1. S. Thanikaikarasan
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  2. X. Sahaya Shajan
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  3. V. Dhanasekaran
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  4. T. Mahalingam
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Correspondence to S. Thanikaikarasan or T. Mahalingam.

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Thanikaikarasan, S., Shajan, X.S., Dhanasekaran, V. et al. X-ray line broadening and photoelectrochemical studies on CdSe thin films. J Mater Sci 46, 4034–4045 (2011). https://doi.org/10.1007/s10853-011-5332-z

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  • DOI: https://doi.org/10.1007/s10853-011-5332-z

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