Skip to main content
SpringerLink
Log in

The weak-beam technique applied to the analysis of materials properties

  • Published:
Journal of Materials Science Aims and scope Submit manuscript

The so-called weak-beam (WB) technique has been widely employed to elucidate dislocation near-core properties. To a very large extent WB images reflect the intimate structure of lattice defects through signals that may, however, be significantly convoluted. This contribution reviews selected situations where various factors affecting images must be taken into account. A less-common method to investigate crystal order under WB is also reported.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. H. Saka, Philosoph. Mag. 49 (1984) 327.

    CAS  Google Scholar 

  2. C. J. Humphreys and R. A. Drummond, “The High Resolution Imaging of Defects, in Electron Microscopy and Analysis” (Institute of Physics, London, 1977) p. 241.

    Google Scholar 

  3. C. J. Humphreys and R. A. Drummond, “The Column Approximation and High Resolution Imaging of Defects, in Proceedings of the Sixth European Regional Conference on Electron Microscopy” (TAL International Publishing Company, Jerusalem, 1976) p. 142.

    Google Scholar 

  4. D. J. H. Cockayne, Zeitschrift für Naturforschung a 27A (1972) 452.

    Google Scholar 

  5. D. B. Williams and C. B. Carter, in Transmission Electron Microscopy (Plenum Press, New York and London, 1996).

    Google Scholar 

  6. P. Veyssière and G. Hug, “The Use of Weak-Beam Dark-Field TEM in the Analysis of Defects in Intermetallics, in XIIth International Congress for Electron Microscopy”, edited by E. Bailey (San Francisco Press: San Francisco, 1990) p. 450.

  7. D. J. H. Cockayne, I. L. F. Ray and M. J. Whelan, Philosoph. Mag. 20 (1969) 1265.

    CAS  Google Scholar 

  8. A. Howie, W. M. Stobbs and P. L. Gai, Bulletin de la Société Française de Minéralogie et Cristallographie 95 (1972) 690.

    CAS  Google Scholar 

  9. R. Sandström, Physica status Solidi (a) 18 (1973) 639.

    Google Scholar 

  10. C. J. Humphreys and R. A. Drummond, in Proceedings of the Sixth European Regional Conference on Electron Microscopy (TAL International Publishing Company, Jerusalem, 1976) p. 142.

    Google Scholar 

  11. P. B. Hirsch et al., “Electron Microscopy of Thin Crystals” (Butterworth, London, 1965).

    Google Scholar 

  12. K. J. Hemker and M. J. Mills, Philosoph. Mag. A 68(2) (1993) 305.

    CAS  Google Scholar 

  13. K. J. Hemker, ibid. 76(1) (1997) 241.

    CAS  Google Scholar 

  14. C. J. Humphreys et al., ibid. 35(6) (1977) 1543.

    CAS  Google Scholar 

  15. Y. Ishida et al., ibid. 42 (1980) 453.

    CAS  Google Scholar 

  16. H. Heinrich and G. Kostroz, J. Micros. 49(1) (2000) 61.

    CAS  Google Scholar 

  17. J. M. Wiezorek, A. R. Preston and C. J. Humphreys, Column Approximation Effects on Partial Dislocation Weak Beam Images, in Institute of Physics Conference Series (IOP Publishing Ltd., 1995) p. 455.

  18. P. Veyssière and D. G. Morris, Philosoph. Mag. Lett. 66 (1992) 491.

    Google Scholar 

  19. F. Grégori and P. Veyssière, Philosoph. Mag. A 80(12) (2000) 2913.

    Google Scholar 

  20. idem., ibid. 80(12) (2000) 2933.

    Article  Google Scholar 

  21. Y.-L. Chiu, et al., Philosoph. Mag. Lett. 83 (2003) 485.

  22. B. Viguier and K. J. Hemker, Philosoph. Mag. A 73(3) (1996) 575.

    CAS  Google Scholar 

  23. W. J. Tunstall and P. J. Goodhew, Philosoph. Mag. 13 (1966) 1259.

    CAS  Google Scholar 

  24. A. Korner and H. P. Karnthaler, Philosoph. Mag. A 44(2) (1981) 275.

    CAS  Google Scholar 

  25. J. Douin, P. Veyssière and G. Saada, ibid. 77(5) (1998) 1323.

    Article  CAS  Google Scholar 

  26. R. Schäublin and P. Stadelmann, Mater. Sci. Engng. A 164 (199) 373.

    Google Scholar 

  27. C. Bontemps-Neveu (University of Paris-Sud, 1991).

  28. J. Oliver (University of Paris-Sud., 1991).

  29. P. VEYSSIÈRE and R. D. Noebe, Philosoph. Mag. A 65 (1992) 1.

    Google Scholar 

  30. J. G. Antonopoulos and A. T. Winter, Philosoph. Mag. 33(1) (1976) 87.

    CAS  Google Scholar 

  31. J. G. Antonopoulos, L. M. Brown and A. T. Winter, ibid. 34(4) (1976) 549.

    CAS  Google Scholar 

  32. B. Tippelt, J. Bretschneider and C. Holste, Physica Status Solidi (a) 163 (1997) 11.

    Article  CAS  Google Scholar 

  33. S. Catalao et al., Mater. Sci. Engng. A400–401 (2005) 349.

  34. M. J. Mills and P. Stadelmann, Philos. Mag. A 60 (1989) 355.

    CAS  Google Scholar 

  35. C. B. Carter and S. M. Holmes, Philosoph. Mag. 32 (1975) 599.

    CAS  Google Scholar 

  36. idem, ibid. 35(5) (1977) 1161.

    CAS  Google Scholar 

  37. N. Doukhan, R. Duclos and B. Escaig, Journal de Physique 40 (1979) 381.

    CAS  Google Scholar 

  38. P. Veyssière, J. Douin and P. Beauchamp, Philosoph. Mag. A 51 (1985) 469.

    Google Scholar 

  39. P. Veyssière, ibid. 50 (1984) 189.

    Google Scholar 

  40. N. Baluc, H. P. Karnthaler and M. J. Mills, Philosoph. Mag. A 64(1) (1991) 137.

    CAS  Google Scholar 

  41. N. Baluc, R. Schaüblin and K. J. Hemker, Philosoph. Mag. Lett. 64(5) (1991) 327.

    CAS  Google Scholar 

  42. N. Baluc and R. Schäublin, Philosoph. Mag. A 74(1) (1996) 113.

    CAS  Google Scholar 

  43. C. Bontemps and P. Veyssière, Philosoph. Mag. Lett. 61 (1990) 259.

    CAS  Google Scholar 

  44. A. Couret, J. Crestou, S. Farenc, G. Molenat, N. Clement, A. Coujou and D. Caillard, Microsc. Microanal. Microstr. 4 (1993) 153.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. LEM, CNRS-ONERA, BP 72, 92322, Chatillon, France

    P. Veyssière

Authors
  1. P. Veyssière
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Veyssière, P. The weak-beam technique applied to the analysis of materials properties. J Mater Sci 41, 2691–2702 (2006). https://doi.org/10.1007/s10853-006-7872-1

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s10853-006-7872-1

Keywords

Search

Navigation