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Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead

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Abstract

A compression-decompression scheme, Modified Selective Huffman (MS-Huffman) scheme based on Huffman code is proposed in this paper. This scheme aims at optimization of the parameters that influence the test cost reduction: the compression ratio, on-chip decoder area overhead and overall test application time. Theoretically, it is proved that the proposed scheme gives the better test data compression compared to very recently proposed encoding schemes for any test set. It is clearly demonstrated with a large number of experimental results that the proposed scheme improves the test data compression, reduces overall test application time and on-chip area overhead compared to other Huffman code based schemes.

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Acknowledgment

The authors are thankful to Prof. Nur A. Tauba for providing MINTEST test sets for ISCAS89 benchmark circuits.

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Authors and Affiliations

  1. Nirma University, Ahmedabad, India

    Usha Sandeep Mehta & Nirnjan M. Devashrayee

  2. Space Application Center, ISRO, Ahmedabad, India

    Kankar S. Dasgupta

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  1. Usha Sandeep Mehta
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  2. Kankar S. Dasgupta
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  3. Nirnjan M. Devashrayee
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Correspondence to Usha Sandeep Mehta.

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Responsible Editor: N. A. Touba

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Mehta, U.S., Dasgupta, K.S. & Devashrayee, N.M. Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead. J Electron Test 26, 679–688 (2010). https://doi.org/10.1007/s10836-010-5183-6

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  • DOI: https://doi.org/10.1007/s10836-010-5183-6

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