Characteristics of the atomic structure of lead-silicate glasses, among them the concentration of lead structural forms, the statistics of both silicon-oxygen and lead-oxygen structures of medium-range ordering, and the bonding degrees of silicon-oxygen and lead-oxygen structures, have been found using x-ray photoelectron spectroscopy and thermodynamic simulation.
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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 76, No. 2, pp. 209–217, March–April, 2009.
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Kanunnikova, O.M., Goncharov, O.Y. X-ray photoelectron analysis of lead-silicate glass structure. J Appl Spectrosc 76, 194–202 (2009). https://doi.org/10.1007/s10812-009-9164-4
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DOI: https://doi.org/10.1007/s10812-009-9164-4