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Stay green trait: variation, inheritance and its association with spot blotch resistance in spring wheat (Triticum aestivum L.)

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Abstract

One thousand four hundred and seven spring wheat germplasm lines belonging to Indian and CIMMYT wheat programs were evaluated for stay green (SG) trait and resistance to spot blotch caused by Bipolaris sorokiniana during three consecutive crop seasons, 1999–2000, 2000–2001 and 2001–2002. Disease severity was recorded at six different growth stages beginning from tillering to late milk stage. SG trait was measured by following two approaches: difference for 0–9 scoring of green coloration (chlorophyll) of flag leaf and spike at the late dough stage (GS 87) and a new approach of leaf area under greenness (LAUG). Germplasm lines showed a wide range (7–89) for LAUG and were grouped into four viz., SG, moderately stay green, moderately non-stay green and non-stay green (NSG). However, very few (2.2%) lines showed high expression of SG trait, i.e., LAUG >60. LAUG appeared to be a better measure of SG trait than a 0–9 scale. Mean spot blotch ratings of SG genotypes were significantly lower than those of NSG genotypes at all growth stages. Two spot blotch resistant genotypes (Chirya 3 and Chirya 7) having strong expressions of SG trait were crossed with NSG, spot blotch susceptible cv. Sonalika. Individually threshed F2 plants were used to advance the generations. SG trait and spot blotch severity were recorded in the parents and F1, F3, F4, F5, F6 and F6–7 generations under disease-protected and inoculated conditions. SG trait in the F1 generation was intermediate and showed absence of dominance. Evaluation of progenies (202–207) in the segregating generations revealed that SG trait was under the control of around four additive genes. Lines homozygous for SG trait in F4, F5, F6 and F6–7 generations showed significantly lower mean area under disease progress curve (AUDPC) for spot blotch than those with NSG expression. A positive correlation (0.73) between SG trait and AUDPC further indicated a positive influence of SG on severity of spot blotch. The study established that variation for SG trait exists in spring wheat; around four additive genes control its inheritance in the crosses studied and there is positive association between SG trait and resistance to spot blotch.

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Abbreviations

SG:

Stay green

MSG:

Moderately stay green

MNSG:

Moderately non-stay green

NSG:

Non-stay green

LAUG:

Leaf area under greenness

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Acknowledgments

The authors thank the Indian Council of Agricultural Research for financial support to a part of this study. The help rendered by Dr J. Crossa, Head, Biometrics and Statistics Unit, International Maize and Wheat Improvement Center (CIMMYT) Mexico in the analysis of data is gratefully acknowledged.

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Author notes

  1. S. Kumar

    Present address: Department of Biotechnology, Sardar Vallabh Bhai Patel University of Agriculture and Technology, Meerut, 250110, U.P., India

Authors and Affiliations

  1. Department of Genetics and Plant Breeding, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi, 221005, India

    A. K. Joshi, M. Kumari, V. P. Singh, C. M. Reddy & S. Kumar

  2. Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi, 221005, India

    R. Chand

  3. Directorate of Wheat Research, Indian Council of Agricultural Research, Karnal , 132001, India

    J. Rane

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  1. A. K. Joshi
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Correspondence to A. K. Joshi.

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Joshi, A.K., Kumari, M., Singh, V.P. et al. Stay green trait: variation, inheritance and its association with spot blotch resistance in spring wheat (Triticum aestivum L.). Euphytica 153, 59–71 (2007). https://doi.org/10.1007/s10681-006-9235-z

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  • DOI: https://doi.org/10.1007/s10681-006-9235-z

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