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Mapping quantitative resistance to septoria tritici blotch in spelt wheat

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Abstract

The foliar wheat disease septoria tritici blotch can cause significant yield losses. A source of resistance has been mapped on chromosome 7D of spelt wheat, Triticum aestivum L. subsp. spelta (L.) Thell. The microsatellite-based genetic map was constructed from a set of 87 single-chromosome recombinant doubled-haploid lines bred from the cross between the landrace ‘Chinese Spring’ and a ‘Chinese Spring’-based line carrying chromosome 7D from spelt wheat. Two regions of the chromosome were associated with isolate-specific QTL expressed one at the seedling and another at the adult plant stage. The seedling resistance locus QStb.ipk-7D1 was found in the centromeric region of chromosome 7D, which corresponds to the location of the major resistance genes Stb4 originating from bread wheat cultivar ‘Tadinia’ and Stb5 originating from Triticum tauschii. The adult resistance locus QStb.ipk-7D2 was found on the short arm of chromosome 7D in a similar position to the locus Lr34/Yr18 known to be effective against multiple pathogens. Composite interval mapping confirmed QStb.ipk-7D1 and QStb.ipk-7D2 to be two distinct loci.

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Authors and Affiliations

  1. Facultad de Ciencias Agrarias y Forestales, Universidad Nacional de La Plata, 60 y 119. CC 31, 1900, La Plata, Argentina

    Maria Rosa Simon & Nadia S. Castillo

  2. Institute of Cytology and Genetics, SB RAS, Novosibirsk, 630090, Russia

    Elena K. Khlestkina

  3. CONICET, Consejo Nacional de Investigaciones Científicas, Buenos Aires, Argentina

    Nadia S. Castillo

  4. Leibniz Institute of Plant Genetics and Crop Plant Research (IPK), Corrensstr. 3, 06466, Gatersleben, Germany

    Andreas Börner

Authors
  1. Maria Rosa Simon
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  2. Elena K. Khlestkina
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  3. Nadia S. Castillo
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  4. Andreas Börner
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Corresponding author

Correspondence to Maria Rosa Simon.

Additional information

Maria Rosa Simon, Elena K. Khlestkina and Nadia S. Castillo contributed equally.

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Supplementary Fig.1

Composite interval mapping of the seedling (A) and adult plant stage (B) resistances, performed using adult-plant and seedling resistance for trait variances, respectively. LRS: likelihood ratio statistic; AE:additive effect. ¨Significant¨and ¨highly significant¨ LRS threshold lines. Histograms show confidence intervals for the QTL. (DOC 75 kb)

Supplementary Fig.2

Composite interval mapping of the seedling (A) and adult plant stages (B) resistances, performed using flowering time for trait variances. LRS: likelihood ratio statistic; AE: additive effect. ¨Significant¨ and ¨highly significant¨ LRS threshold lines. Histograms show confidence intervals for the QTL. (DOC 74 kb)

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Simon, M.R., Khlestkina, E.K., Castillo, N.S. et al. Mapping quantitative resistance to septoria tritici blotch in spelt wheat. Eur J Plant Pathol 128, 317–324 (2010). https://doi.org/10.1007/s10658-010-9640-y

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  • DOI: https://doi.org/10.1007/s10658-010-9640-y

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