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Traceability system for elemental analysis

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Abstract

A complete metrological traceability system for measurement results of chemical analysis was set up. Core components are pure substances (national standards) characterised at the highest metrological level, primary solutions prepared from these pure substances and secondary solutions deduced from the primary solutions and intended for sale. The relative uncertainty of the element mass fraction of the primary substances and solutions is < 0.01 and < 0.05%, respectively. For the certification of transfer solutions and for stability testing, a precision measurement method for element contents has been developed by means of optical emission spectrometry (ICP OES) by which uncertainties between 0.1 and 0.05% can be achieved. The dissemination to field laboratories is effected with the aid of a calibration laboratory of the German Calibration Service (DKD) which certifies the element content of the secondary solutions with an uncertainty ≤ 0.3%. Calibration with these solutions enables the user to establish traceability of his measurement results to the International System of Units (SI). Currently, the system comprises Cu, Fe, Bi, Ga, Si, Na, K, Sn, W, and Pb.

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Acknowledgements

The authors thank the Federal Ministry of Economics and Labour (BMWA) for granting financial support to this project. Furthermore, the scientific discussion with colleagues from the JEPPIM (Joint European Programme for Primary Isotopic Measurements, a programme co-ordinated by the Institute for Reference Materials and Measurements) is gratefully acknowledged.

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Authors and Affiliations

  1. Bundesanstalt für Materialforschung und -prüfung (BAM), Richard-Willstätter-Straße 11, 12489, Berlin, Germany

    Heinrich Kipphardt & Ralf Matschat

  2. Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116, Braunschweig, Germany

    Olaf Rienitz & Detlef Schiel

  3. Merck KGaA, Frankfurter Straße 250, 64293, Darmstadt, Germany

    Wolfgang Gernand & Dietmar Oeter

Authors
  1. Heinrich Kipphardt
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  2. Ralf Matschat
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  3. Olaf Rienitz
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  4. Detlef Schiel
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  5. Wolfgang Gernand
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  6. Dietmar Oeter
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Corresponding author

Correspondence to Detlef Schiel.

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Kipphardt, H., Matschat, R., Rienitz, O. et al. Traceability system for elemental analysis. Accred Qual Assur 10, 633–639 (2006). https://doi.org/10.1007/s00769-005-0084-6

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  • DOI: https://doi.org/10.1007/s00769-005-0084-6

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