Abstract
Wetting is a fundamental and important phenomenon that is encountered in various engineering processes, and particularly, the understanding of mesoscopic dynamic wetting of not only pure liquids but also suspensions with nanoparticles is required with the recent miniaturization of devices. Therefore, it is important to establish a technique to precisely measure the dynamic behavior of liquid thin films near the three-phase contact line. In the present study, the mesoscopic wetting behavior of nonvolatile polydimethylsiloxane (PDMS, 20 cSt) and a PDMS suspension containing PDMS-modified SiO2 nanoparticles at a concentration of 1 wt% is measured using a phase-shifting imaging ellipsometer (PSIE) developed in our previous study, although the aggregates of nanoparticles are formed in the suspension. The PSIE can measure the two-dimensional thickness profile of liquid thin films from nanometer to micrometer scales. From the measured thickness profiles, we investigate the effect of the suspended nanoparticles on the apparent contact angle θa and precursor film length Lp. The dependence of θa and Lp on the velocity of contact line U ranging from 10–8 to 10–6 m/s is characterized. The contact angles of both fluids reflect the Cox–Voinov law, i.e., the θa is proportional to U1/3. At the same U, the θa of the suspension is higher than that of pure PDMS. The Lp of both fluids is proportional to U−1 and is the same at the same U. Furthermore, the Lp and thickness profiles at the nanometer scale are consistent with adiabatic precursor film theory.
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Acknowledgements
This study was supported by JSPS Grant-in-Aid for Scientific Research (B) 20H02498 and 16H04548; Young Scientists (B) 17K14848; Materials Processing Science Project (“Materealize”) of MEXT JPMXP0219192801. Part of the work was supported by Sumitomo Electric Industries Group Corporate Social Responsibility Foundation; Nippon Sheet Glass Foundation for Materials Science and Engineering; Murata Science Foundation; CASIO Science Promotion Foundation. Part of the work was carried out under the Collaborative Research Project of the Institute of Fluid Science, Tohoku University, J20I084 and J19I059.
Funding
This study was supported by JSPS Grant-in-Aid for Scientific Research (B) 20H02498 and 16H04548; Young Scientists (B) 17K14848; Materials Processing Science Project (“Materealize”) of MEXT JPMXP0219192801. Partial financial support was received from Sumitomo Electric Industries Group Corporate Social Responsibility Foundation; Nippon Sheet Glass Foundation for Materials Science and Engineering; Murata Science Foundation; CASIO Science Promotion Foundation.
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ES was involved in conceptualization, methodology, software, formal analysis, investigation, visualization, writing—original draft, project administration, and funding acquisition. TK was involved in formal analysis, investigation, and validation. TY was involved in formal analysis and investigation. MK was involved in methodology and writing—review and editing. TT was involved in conceptualization, writing—review and editing, supervision, and funding acquisition. AK was involved in methodology and writing—review and editing.
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Shoji, E., Kaneko, T., Yonemura, T. et al. Measurement of dynamic wetting using phase-shifting imaging ellipsometer: comparison of pure solvent and nanoparticle suspension on film thickness profile, apparent contact angle, and precursor film length. Exp Fluids 62, 206 (2021). https://doi.org/10.1007/s00348-021-03296-3
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DOI: https://doi.org/10.1007/s00348-021-03296-3