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Free-surface profile of evaporative liquids at the vicinity of the contact line

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Abstract

Interfacial phenomenon, specifically those associated with evaporation from thin liquid films near the contact line of a liquid drop, plays a major role in many current engineering applications which require high local heat fluxes, as evident in heat pipes, grooved evaporators, fuel cells, and suction nucleate boiling devices (Potash and Wayner in Int J Heat Mass Transf 15:1851–1863, 1971; Hanchak et al. in Int J Heat Mass Transf 75:196–206, 2014). This study will prove useful in the improvement of such applications. Fluorescence microscopy was used as our main technique for investigating the free-surface profiles of evaporative liquids at the vicinity of the contact line, as it delivers sufficient range and resolution to address the challenge of capturing the microscopic and macroscopic aspects of this phenomenon. The free-surface profiles of relatively low evaporative liquids were compared with those of nonevaporative liquids, specifically one centistoke silicon oil was compared with one hundred centistokes silicon oil and qualitatively no difference has been observed between both profiles near the contact line.

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References

  1. Potash, M, Wayner, PC, “Evaporation from a Two Dimensional Extended Meniscus.” Int. J. Heat Mass Transf., 15 1851–1863 (1971)

    Article  Google Scholar 

  2. Hanchak, M, Vangsness, M, Byrd, L, Ervin, J, “Thin Film Evaporation of n-Octane on Silicon: Experiments and Theory.” Int. J. Heat Mass Transf., 75 196–206 (2014)

    Article  Google Scholar 

  3. Hoang, A, Kavehpour, P, “Dynamic Measurement of Microfilms and Nanofilms of Fluids Using Fluorescence Microscopy.” Exp. Fluids, 52 1657–1662 (2012)

    Article  Google Scholar 

  4. Hoang, A, Kavehpour, HP, “Dynamics of Nanoscale Precursor Film near a Moving Contact Line of Spreading Drops.” Phys. Rev. Lett., 106 254501 (2011)

    Article  Google Scholar 

  5. Pham, CT, Limat, L, “Dynamics of Complete Wetting Liquid Under Evaporation.” Europhys. Lett., 92 54005 (2010)

    Article  Google Scholar 

  6. Doumenc, F, Guerrier, B, “A Model Coupling the Liquid and Gas Phases for a Totally Wetting Evaporative Meniscus.” Eur. Phys. J. Special Topics, 197 281–293 (2011)

    Article  Google Scholar 

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Authors and Affiliations

  1. Department of Mechanical and Aerospace Engineering, University of California, Los Angeles, Los Angeles, CA, USA

    S. Houssainy & H. P. Kavehpour

Authors
  1. S. Houssainy
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  2. H. P. Kavehpour
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Correspondence to S. Houssainy.

Additional information

This paper was presented at the 17th International Coating Science and Technology Symposium, September 7–10, 2014, in San Diego, CA, USA.

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Houssainy, S., Kavehpour, H.P. Free-surface profile of evaporative liquids at the vicinity of the contact line. J Coat Technol Res 12, 863–867 (2015). https://doi.org/10.1007/s11998-015-9716-x

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  • DOI: https://doi.org/10.1007/s11998-015-9716-x

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