Abstract
Complementing an earlier report (Vernaleken et al. in Opt Exp 20:18387, 2012), we investigate the residual phase jitter of a carrier-envelope frequency stabilized Ti:sapphire oscillator when pumped by additional commercially available pump lasers that were not part of the first study. We find that all tested pump lasers allow stabilization of the oscillator with a residual rms phase noise (integrated between 2 Hz and 5 MHz) of less than 150 mrad despite their different design and properties. Possible sources of technical noise and their elimination for specific models are discussed.
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Neither of the authors nor their respective institution hold any privileged relations to any of the companies mentioned in this article. In particular, Menlo Systems GmbH is not exclusively engaged with any of the forecited companies.
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Vernaleken, A., Schmidt, B., Hänsch, T.W. et al. Carrier-envelope frequency stabilization of a Ti:sapphire oscillator using different pump lasers: part II. Appl. Phys. B 117, 33–39 (2014). https://doi.org/10.1007/s00340-014-5795-0
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DOI: https://doi.org/10.1007/s00340-014-5795-0