Abstract
The thermal and operational degradation in optical property of a europium-doped barium magnesium aluminate (BaMgAl10O17:Eu2+, BAM) phosphor was studied. BAM was heat-treated at 500°C under various conditions to determine the mechanism of thermal degradation. Operational degradation tests were then performed under a discharging Xe/Ne mixed gas to study the influence of thermal history on operational degradation. It was found that the atmosphere during thermal processing was the major factor affecting not only the thermal degradation, but also the operational degradation. The sample heat-treated under a reducing atmosphere showed enhanced stability during operation.
Similar content being viewed by others
References
C.R. Ronda, J. Lumin. 72, 49 (1997)
A.W. De Jager-Veenis, A. Bril, J. Electrochem. Soc. 123, 1253 (1976)
T. Justel, J.C. Krupa, D.U. Wiechert, J. Lumin. 93, 179 (2001)
S. Zhang, T. Kono, A. Ito, T. Yasaka, H. Uchiike, J. Lumin. 106, 39 (2004)
B. Howe, A.L. Diaz, J. Lumin. 109, 51 (2004)
B. Moine, G. Bizarri, Mater. Sci. Eng. B 105, 2 (2003)
S. Zhang, IEEE Trans. Plasma Sci. 34, 294 (2006)
N. Iyi, Z. Inoue, S. Kimura, J. Solid State Chem. 61, 236 (1986)
T. Onimaru, S. Fukuta, T. Misawa, K. Sakita, K. Betsui, J. Soc. Inf. Disp. 13, 45 (2005)
Z. Wu, A.N. Cormack, J. Electroceram. 10, 179 (2003)
K.B. Kim, Y.I. Kim, H.G. Chun, T.Y. Cho, J.S. Jung, J.G. Kang, Chem. Mater. 14, 5045 (2002)
S. Oshio, S. Matsuoka, S. Tanaka, H. Kobayashi, J. Electrochem. Soc. 145, 3903 (1998)
K.S. Sohn, S.S. Kim, H.D. Park, Appl. Phys. Lett. 81, 1759 (2002)
H. Yamada, W.S. Shi, C.N. Xu, J. Electrochem. Soc. 151, E349 (2004)
G. Bizarri, B. Moine, J. Lumin. 113, 199 (2005)
K.C. Mishra, K.H. Johnson, P.C. Schmidit, J. Electrochem. Soc. 153, H202 (2006)
I. Hirosawa, T. Honma, K. Kato, N. Kijima, Y. Shimomura, J. Soc. Inf. Disp. 13, 673 (2005)
K.B. Kim, K.W. Koo, T.Y. Cho, H.G. Chun, Mater. Chem. Phys. 80, 682 (2003)
B. Dawson, M. Ferguson, G. Marking, A.L. Diaz, Chem. Mater. 16, 5311 (2004)
B. Moine, G. Biazarri, Opt. Mater. 28, 587 (2006)
T. Jüstel, H. Bechter, W. Mayr, D.U. Wiechert, J. Lumin. 104, 137 (2003)
B. Howe, A.L. Diaz, J. Lumin. 109, 51 (2004)
H. Adachi, M. Tsukada, C.J. Satoko, Phys. Soc. Jpn. 45, 875 (1978)
A. Ellens, F. Zwaschka, F. Kummer, A. Meijerink, M. Raukas, K. Mixhra, J. Lumin. 93, 147 (2001)
V. Pike, S. Patraw, A.L. Diaz, B.G. DeBoer, J. Solid State Chem. 173, 359 (2003)
D.R. Gaskell, Introduction to the Thermodynamics of Materials (Taylor & Francis, New York, 2003)
B.D. Evans, J. Nucl. Mater. 219, 202 (1995)
K.H. Lee, J.H. Crawford Jr., Appl. Phys. Lett. 33, 274 (1978)
R. Ramírez, M. Tardío, R. Gonzàlez, J.E. Muñoz Santiuste, J. Appl. Phys. 101, 123520 (2007)
J. Solé, L. Bausa, D. Jaque, An Introduction to the Optical Spectroscopy of Inorganic Solids (Wiley, New York, 2005)
R.S. Mulliken, J. Chem. Phys. 23, 1833 (1955)
R.S. Mulliken, J. Chem. Phys. 23, 1841 (1955)
R.S. Mulliken, J. Chem. Phys. 23, 2338 (1955)
N.C. Mohanty, S.V. Mishra, S.V. Bhat, P.K. Basu, D. Kanjilal, J. Phys. D 36, 3151 (2003)
S. Nagata, S. Yamamoto, K. Toh, B. Tsuchiya, N. Ohtsu, T. Shikama, H. Naramoto, J. Nucl. Mater. 329, 1507 (2004)
J. Wong, J.L. Ferriera, E.F. Lindsey, D.L. Haupt, I.D. Hutcheon, J.H. Kinney, J. Non-Cryst. Solids 352, 255 (2006)
K. Awazu, J. Non-Cryst. Solids 337, 241 (2004)
S. Xu, X. Yuan, X. Zu, H. Lv, X. Jiang, L. Zhang, W. Zheng, J. Non-Cryst. Solids 353, 4212 (2007)
B.P. Uberuaga, D. Bacorisen, R. Smith, J.A. Ball, R.W. Grimes, A.F. Voter, K.E. Sickafus, Phys. Rev. B 75, 104116 (2007)
K. Ando, Y. Oishi, J. Chem. Phys. 61, 625 (1974)
R. Lindner, A. Akerstrom, Z. Phys. Chem. 18, 303 (1958)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Kim, Y., Kang, S. Investigation of the degradation mechanisms in BaMgAl10O17:Eu2+ phosphor: on the influence of thermal process on operational durability. Appl. Phys. B 98, 429–434 (2010). https://doi.org/10.1007/s00340-009-3779-2
Received:
Revised:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00340-009-3779-2