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Low refractive index contrast porous silicon omnidirectional reflectors

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Abstract

We report on the fabrication and characterization of a porous silicon omnidirectional reflector formed by periodic substructures stacked together. For these substructures, a low refractive index contrast has been used, resulting in substructures without omnidirectional reflectivity band. The use of a low refractive index contrast involves the reduction of the requirements to obtain omnidirectional reflectors. We demonstrate the existence of an omnidirectional reflectivity range with a high gap-to-midgap ratio by means of reflectivity spectra measurements for a range of incidence angles. The results are in good agreement with a theoretical model of the reflector. The fabricated structure is the first reported porous silicon reflector suitable for 1.55 μm applications.

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Authors and Affiliations

  1. Departament d’Enginyeria Electrònica, Elèctrica i Automàtica, ETSE, Campus Sescelades, Universitat Rovira i Virgili, Avda. Països Catalans 26, 43007, Tarragona, Spain

    E. Xifré-Pérez, L. F. Marsal, J. Ferré-Borrull & J. Pallarès

  2. Centro de Tecnologías Físicas, Unidad Asociada ICMM-CSIC/UPV, Universidad Politécnica de Valencia, Avda. de los Naranjos s/n, 46022, Valencia, Spain

    E. Xifré-Pérez

  3. Instituto de Ciencia de Materiales de Madrid (CSIC), C. Sor Juana Inés de la Cruz 3, 28049, Madrid, Spain

    E. Xifré-Pérez

Authors
  1. E. Xifré-Pérez
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  2. L. F. Marsal
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  3. J. Ferré-Borrull
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  4. J. Pallarès
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Correspondence to L. F. Marsal.

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Xifré-Pérez, E., Marsal, L.F., Ferré-Borrull, J. et al. Low refractive index contrast porous silicon omnidirectional reflectors. Appl. Phys. B 95, 169–172 (2009). https://doi.org/10.1007/s00340-009-3416-0

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  • DOI: https://doi.org/10.1007/s00340-009-3416-0

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