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Received: 1 July 1997/Accepted: 6 August 1997
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Rusu, M. On thickness dependence of electrical and optical properties of Te thin films . Appl Phys A 66, 357–361 (1998). https://doi.org/10.1007/s003390050678
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DOI: https://doi.org/10.1007/s003390050678