Abstract
Thickness-dependent structural, magnetic and transport properties of La0.5Sr0.5MnO3 (LSMO) thin films have been studied. A series of the LSMO films with thickness 30, 60, 125 and 300 nm have been deposited on the LaAlO3 substrate using DC magnetron sputtering. The paramagnetic to ferromagnetic transition at T C is followed by antiferromagnetic ordering at T N in all films. It is also found that all LSMO films have T C lower than that of bulk LSMO. A small variation of T C is observed on increasing the film thickness. However, T N is found to rise with increase in the film thickness. The 60 nm-thick film shows a wide insulator to metal transition. The resistivity above 240 K of the films with various thicknesses is consistent with a small polaronic hopping conductivity. The polaronic formation energy E A rises with the increase of the film thickness except for 60 nm thin film, where a small decline in E A is observed. The correlation between observed structural, magnetic and electrical properties with the thickness of the films has been discussed in this paper.
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Kamlesh Yadav is grateful to the Ministry of Human Resources and Development (MHRD), New Delhi, for the award of a fellowship during the doctoral program.
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Yadav, K., Singh, H.K., Maurya, K.K. et al. Thickness-dependent magnetic and transport properties of La0.5Sr0.5MnO3 thin films deposited by DC magnetron sputtering on the LaAlO3 substrate. Appl. Phys. A 124, 66 (2018). https://doi.org/10.1007/s00339-017-1494-0
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DOI: https://doi.org/10.1007/s00339-017-1494-0