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Effect of Film Thickness on Electrical and Magnetic Properties of Nd 0 . 8 Na 0 . 2 MnO 3 Thin Films

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Abstract

Nd0.8Na0.2MnO3 thin films were grown on (001)-oriented LaAlO3 substrate for thickness in the range of 30 to 100 nm by using radio-frequency (RF) magnetron sputtering. All films are found to grow epitaxially along the (001) orientation of the substrate. The out-of-plane lattice constant is found to decrease from 3.862 Å for 30 nm thick film to 3.853 Å for 100 nm film. These films exhibit out-of-plane tensile strain and their magnitude is found to decrease with an increase in film thickness. The Raman spectra show the signature of the presence of a charge ordered phase. The temperature variation of magnetization measurement shows the signature of charge ordering transition around 190 K followed by low temperature (T < 100 K) ferromagnetic transition. The M-H loops recorded at 30 K show typical ferromagnetic behaviour with a maximum saturation magnetization of 2.47 μ B/f.u. The electrical resistivity data are found to follow the variable range hopping model.

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Acknowledgements

The authors are thankful to Dr. D. Pamu for useful discussion in thin film deposition. Financial support from CSIR, New Delhi [03(1253)/12/EMR-II], and UGC-DAE-CSR, Mumbai [UDCSR/MUM/CRSM-192], are gratefully acknowledged. CIF, IIT Guwahati is acknowledged for Raman spectrometer and atomic force microscope (AFM) facilities.

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  1. Department of Physics, Indian Institute of Technology Guwahati, Guwahati, Assam, 781039, India

    T. R. Gopalarao & S. Ravi

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  1. T. R. Gopalarao
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  2. S. Ravi
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Correspondence to S. Ravi.

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Gopalarao, T.R., Ravi, S. Effect of Film Thickness on Electrical and Magnetic Properties of Nd 0 . 8 Na 0 . 2 MnO 3 Thin Films. J Supercond Nov Magn 30, 2465–2470 (2017). https://doi.org/10.1007/s10948-017-4030-8

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  • DOI: https://doi.org/10.1007/s10948-017-4030-8

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