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Thermal stability of polyfuran/pechlorate doped films

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Abstract

Thermogravimetry, Fourier transform infrarred spectroscopy and scanning electron microscopy were performed on polyfuran films to assess thermal stability. The influence of temperature on the structure and morphology of doped polyfuran conducting films was discussed. Thermal degradation began around 95°C, although aromaticity, structure and ordered nodular morphology in the growth face and the honeycomb appearance in the cross-section were partially conserved until about 210°C.

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Authors and Affiliations

  1. Dpto. Química, Facultad de Ciencias, Universidad Europea de Madrid, Villaviciosa de Odón, E-28670 Madrid, Spain, , , , , , ES

    I. Carrillo

  2. Instituto del Frio (CSIC), Ciudad Universitaria, E-28040 Madrid, Spain, , , , , , ES

    F. Fernández-Martín

  3. Centro de Microscopía Electrónica, Universidad Complutense, E-28040 Madrid, Spain, , , , , , ES

    C. Barba

  4. Dpto. Química Física I, Facultad de Ciencias Químicas, Universidad Complutense, E-28040 Madrid, Spain, , , , , , ES

    E. Sánchez de la Blanca, M. J. González-Tejera & I. Hernández-Fuentes

Authors
  1. I. Carrillo
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  2. F. Fernández-Martín
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  3. C. Barba
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  4. E. Sánchez de la Blanca
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  5. M. J. González-Tejera
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  6. I. Hernández-Fuentes
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Received: 9 June 1999/Accepted: 26 July 1999

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Carrillo, I., Fernández-Martín, F., Barba, C. et al. Thermal stability of polyfuran/pechlorate doped films. Polymer Bulletin 43, 269–276 (1999). https://doi.org/10.1007/s002890050562

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  • DOI: https://doi.org/10.1007/s002890050562

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