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Fine mapping of the Asian soybean rust resistance gene Rpp2 from soybean PI 230970

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Abstract

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Asian soybean rust (ASR) resistance gene Rpp2 has been fine mapped into a 188.1 kb interval on Glyma.Wm82.a2, which contains a series of plant resistance ( R ) genes.

Abstract

Asian soybean rust (ASR), caused by the fungus Phakopsora pachyrihizi Syd. & P. Syd., is a serious disease in major soybean [Glycine max (L.) Merr.] production countries worldwide and causes yield losses up to 75 %. Defining the exact chromosomal position of ASR resistance genes is critical for improving the effectiveness of marker-assisted selection (MAS) for resistance and for cloning these genes. The objective of this study was to fine map the ASR resistance gene Rpp2 from the plant introduction (PI) 230970. Rpp2 was previously mapped within a 12.9-cM interval on soybean chromosome 16. The fine mapping was initiated by identifying recombination events in F2 and F3 plants using simple sequence repeat (SSR) and single nucleotide polymorphism (SNP) markers that flank the gene. Seventeen recombinant plants were identified and then tested with additional genetic markers saturating the gene region to localize the positions of each recombination. The progeny of these selected plants were tested for resistance to ASR and with SSR markers resulting in the mapping of Rpp2 to a 188.1 kb interval on the Williams 82 reference genome (Glyma.Wm82.a2). Twelve genes including ten toll/interleukin-1 receptor (TIR)-nucleotide-binding site (NBS)-leucine-rich repeat (LRR) genes were predicted to exist in this interval on the Glyma.Wm82.a2.v1 gene model map. Eight of these ten genes were homologous to the Arabidopsis TIR-NBS-LRR gene AT5G17680.1. The identified SSR and SNP markers close to Rpp2 and the candidate gene information presented in this study will be significant resources for MAS and gene cloning research.

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Acknowledgments

This research was supported by funding from the United Soybean Board.

Conflict of interest

The authors declared that they have no competing interests.

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Authors and Affiliations

  1. Department of Crop Sciences, University of Illinois, 1101 W. Peabody Drive, Urbana, IL, 61801, USA

    Neil Yu & Brian W. Diers

  2. Department of Functional Crop, National Institute of Crop Science, Rural Development Administration of Korea, 20th, Jeompiljaero, Miryang, Gyeongsangnam-do, 627-803, Korea

    Myungsik Kim

  3. Institute of Plant Breeding, Genetics and Genomics & Department of Crop and Soil Sciences, University of Georgia, 111 Riverbend Road, Athens, GA, 30602, USA

    Zachary R. King, Donna K. Harris & Zenglu Li

  4. Department of Plant Pathology, University of Georgia, 1109 Experiment Street, Griffin, GA, 30223, USA

    James W. Buck

Authors
  1. Neil Yu
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  2. Myungsik Kim
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  4. Donna K. Harris
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  6. Zenglu Li
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  7. Brian W. Diers
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Corresponding author

Correspondence to Brian W. Diers.

Additional information

Communicated by Volker Hahn.

N. Yu and M. Kim have contributed equally to this work.

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Yu, N., Kim, M., King, Z.R. et al. Fine mapping of the Asian soybean rust resistance gene Rpp2 from soybean PI 230970. Theor Appl Genet 128, 387–396 (2015). https://doi.org/10.1007/s00122-014-2438-0

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  • DOI: https://doi.org/10.1007/s00122-014-2438-0

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