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Novel quantitative trait loci for broad-based resistance to soybean cyst nematode (Heterodera glycines Ichinohe) in soybean PI 567516C

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Abstract

Soybean cyst nematode (SCN, Heterodera glycines Ichinohe) is the most destructive pest of soybean worldwide. Host plant resistance is an effective approach to control this pest. Plant introduction PI 567516C has been reported to be highly resistant to multiple-HG types of SCN. The objectives of this study were to identify and map novel quantitative trait loci (QTL) for SCN resistance to six HG types (also known as races 1, 2, 3, 5, 14, and LY1). Mapping was conducted using 250 F2:3 progeny derived from a Magellan (susceptible) × PI 567516C (resistant) cross. F6:7 recombinant inbred lines (RILs) developed from the F2:3 progeny were employed to confirm the putative QTL identified. A total of 927 polymorphic simple sequence repeats (SSR) and single nucleotide polymorphism (SNP) markers were genotyped. Following the genetic linkage analysis, permutation tests and composite interval mapping were performed to identify and map QTL. Four QTL were associated with resistance to either multiple- or single-SCN HG types. Two QTL for resistance to multiple-SCN HG types were mapped to Chromosomes 10 and 18 and have not been reported in other SCN resistance sources. New QTL were confirmed by analysis of 250 F6:7 RILs from the same population. SSR and SNP markers closely associated with these QTL can be useful for the development of near-isogenic lines for fine-mapping and positional cloning of candidate genes for SCN resistance.

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Acknowledgments

This research was supported by the United Soybean Board, Missouri Soybean Merchandizing Council, and National Center for Soybean Biotechnology (USDA-CSREES Award No. 2008-34555-19305). The authors acknowledge Dr. Md Pathan, John Wilcox, Md. Sariful Islam, Sabrina Brown, Kerry Clark, and Cuilan Liu, Division of Plant Sciences, University of Missouri, for their technical assistance. The authors would like to thank Drs. Perry Cregan and David Hyten, Soybean Genomics and Improvement Lab, USDA-ARS, Beltsville, MD 20705, for the development and early accessibility of a universal soybean single nucleotide polymorphism panel (USLP 1.0) used in this study. The authors also would like to thank Dr. David R. Walker, USDA-ARS, University of Illinois-Urbana Champaign, for constructive comments and suggestions on manuscript.

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Authors and Affiliations

  1. Division of Plant Sciences, National Center for Soybean Biotechnology (NCSB), University of Missouri-Columbia, Columbia, MO, 65211, USA

    Tri D. Vuong, David A. Sleper & Henry T. Nguyen

  2. Division of Plant Sciences, NCSB, Delta Center, University of Missouri-Columbia, P.O. Box 160, Portageville, MO, 63873, USA

    James G. Shannon

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  1. Tri D. Vuong
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  2. David A. Sleper
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  4. Henry T. Nguyen
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Correspondence to Tri D. Vuong or Henry T. Nguyen.

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Communicated by D. Lightfoot.

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Vuong, T.D., Sleper, D.A., Shannon, J.G. et al. Novel quantitative trait loci for broad-based resistance to soybean cyst nematode (Heterodera glycines Ichinohe) in soybean PI 567516C. Theor Appl Genet 121, 1253–1266 (2010). https://doi.org/10.1007/s00122-010-1385-7

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