Abstract
Gallium-doped zinc oxide films with an average thickness of 300 nm were grown on corning glass 1737 substrate by radio frequency (RF) magnetron sputtering using powder compacted target with Ga concentrations of 0 wt.%, 2 wt.%, and 4 wt.%. The structural, optical and electrical properties of the films were investigated. During sputtering, deposition temperature was varied from room temperature to 200°C in 50°C intervals. All films were polycrystalline, having a preferred growth orientation with thec-axis perpendicular to the substrate. By increasing Ga concentration and substrate temperature, the peak height corresponding to the (002) plane was significantly increased. Columnar structure was clearly observed in the film deposited with a Ga concentration of 4 wt.% regardless of deposition temperature. The lowest resistivity achieved was 4×10−3 Ωcm at a Ga concentration of 4 wt.% grown at 200°C. All doped films showed an overall transmittance in the visible spectra of above 90%.
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E. Fortunato, V. Assunção, A. Gonçalves, A. Marques, H. Águas, L. Pereira, I. Ferreira, P. Vilarinho, and R. Martins,Thin Solid Films 451–452, 443 (2004).
X. Yu, J. Ma, F. Ji, Y. H. Wang, X. J. Zhang, and H. L. Ma,Thin Solid Films 483, 296 (2005).
T. Minami, H. Nanto, and S. Takata,Japan. J. Appl. Phys. II 3, L280 (1984).
B. H. Choi, H. B. Im, J. S. Song, and K. H. Yoon,Thin Solid Films 193, 712 (1990).
P. S. Vijayakumar, K. A. Blaker, R. D. Weiting, B. Wong, A. T. Halani, C. Park,U.S. Patent No. 4751149 (1988).
T. Minami, H. Sato, H. Nanto, and S. Takata,Japan. J. Appl. Phys. II 25, L776 (1986).
J. Hu and R. G. Gordon,Sol. Cells 30, 437 (1991).
V. Khranovskyy, U. Grossner, V. Lazorenko, G. Lashkarev, B. G. Svensson, and R. Yakimova,Superlattice. Microst. 39, 276 (2006).
V. Assunção, E. Fortunato, A. Marques, H. Águas, I. Ferreira, M. E. V. Costa, and R. Martins,Thin Solid Films 427, 401 (2003).
K. S. Kim, J. H. Lee, and H. W. Kim,Met. Mater.-Int. 8, 601 (2002).
Y. A. Jeon, K. S. No, J. S. Kim, and Y. S. Yoon,Met. Mater.-Int. 9, 383 (2003).
K. T. Ramakrishna Reddy, H. Gopalaswamy, P. J. Reddy, and R. W. Miles,J. Cryst. Growth 210, 516 (2000).
Sang-Moo Park, Tomoaki Ikegami, and Kenji Ebihara,Thin Solid Films 513, 90 (2006).
H. Kato, M. Sano, K. Miyamoto, and T. Yao,J. Cryst. Growth 237–239, 538 (2002).
Kyoo Ho Kim, R. A. Wibowo, and B. Munir,Mater. Lett. 60, 1931 (2006).
H. Gomez, A. Maldonado, M. de la L. Olvera, and D. R. Acosta,Solar Energy Materials & Solar Cells 87, 110 (2005).
H. Kim, C. M. Gilmore, A. Pique, J. S. Horwitz, H. Mattoussi, H. Murata, Z. H. Kafai, and D. B. Chrisey,J. Appl. Phys. 86, 6452 (1999).
K. C. Park, D. Y. Ma, and K. H. Kim,Thin Solid Films 305, 208 (1997).
V. Gupta and A. Mansingh,J. Appl. Phys. 80, 1063 (1996).
J. Hu and R. G. Gordon,J. Appl. Phys. 72, 5381 (1992).
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Kim, K.H., Arifin, E. The effect of gallium concentration and substrate temperature on the properties of Ga-Doped ZnO thin films sputtered from powder compacted target. Met. Mater. Int. 13, 489–494 (2007). https://doi.org/10.1007/BF03027908
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DOI: https://doi.org/10.1007/BF03027908