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Examination of oxide scales in the SEM using backscattered electron images

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Abstract

The complementary use of the scanning electron microscope in the backscattered electron mode with the more usual secondary electron mode results in a significant increase in the versatility of the instrument, since regions of different chemical composition (at. no.) can be readily detected, and their morphology examined. The use of this technique to examine complex oxide scales formed on heat-resistant alloys is described, and in particular the location of thoria particles in the scale formed on a Ni-20 wt pct Cr-2.3 wt pct ThO2 alloy, and the examination of the behavior of yttrium during the high-temperature oxidation of a Co-Cr-Al-Y alloy are discussed.

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Authors and Affiliations

  1. Metal Science Group, Battelle—Columbus Laboratories, 43201, Columbus, Ohio

    C. W. Price (Senior Metallurgist in the Deformation and Fracture Section) & I. G. Wright (Senior Scientist High-Temperature Materials and Processes Section)

  2. School of Metallurgy, The University of New South Wales, P. O. Box 1, Kensington, Australia

    G. R. Wallwork (Professor in Metallurgy)

Authors
  1. C. W. Price
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  2. I. G. Wright
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  3. G. R. Wallwork
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Price, C.W., Wright, I.G. & Wallwork, G.R. Examination of oxide scales in the SEM using backscattered electron images. Metall Trans 4, 2423–2427 (1973). https://doi.org/10.1007/BF02669385

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  • DOI: https://doi.org/10.1007/BF02669385

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