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Suppression of twin formation in CdTe(111)B epilayers grown by molecular beam epitaxy on misoriented Si(001)

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Abstract

CdTe(lll)B layers have been grown on misoriented Si(001). Twin formation inside CdTe(lll)B layer is very sensitive to the substrate tilt direction. When Si(001) is tilted toward [110] or [100], a fully twinned layer is obtained. When Si(001) is tilted toward a direction significantly away from [110], a twin-free layer is obtained. Microtwins inside the CdTe(111)B layers are overwhelmingly dominated by the lamellar twins. CdTe(111)B layers always start with heavily lamellar twinning. For twin-free layers, the lamellar twins are gradually suppressed and give way to twin-free CdTe(111)B layer. The major driving forces for suppressing the lamellar twinning are the preferential orientation of CdTe[11-2] along Si[1-10] and lattice relaxation. Such preferential orientation is found to exist for the CdTe(111)B layers grown on Si(001) tilted toward a direction between [110] and [100].

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Authors and Affiliations

  1. Physics Department (M/C 273), University of Illinois at Chicago, Microphysics Laboratory, 845 W. Taylor St. Room # 2236, 60607-7059, Chicago, IL

    Y. P. Chen, J. P. Faurie & S. Sivananthan

  2. School of Materials Engineering, Purdue University, 47907, West Lafayette, IN

    G. C. Hua & N. Otsuka

Authors
  1. Y. P. Chen
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  2. J. P. Faurie
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  3. S. Sivananthan
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  4. G. C. Hua
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  5. N. Otsuka
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Chen, Y.P., Faurie, J.P., Sivananthan, S. et al. Suppression of twin formation in CdTe(111)B epilayers grown by molecular beam epitaxy on misoriented Si(001). J. Electron. Mater. 24, 475–481 (1995). https://doi.org/10.1007/BF02657950

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  • DOI: https://doi.org/10.1007/BF02657950

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