Abstract
We have developed a real-time photoluminescence imaging system. In contrast to scanning systems, in our set-up the photoluminescence is excited over theentire area of a sample at once. The intensity of the spectrally resolved emission from the whole sample is monitored and displayed in real-time, in a color-coded format. This system can be used for the quick inspection of optical and electro-optical materials, and is promising for in-situ characterization. As an example for the performance of the system we show data obtained on a GaAs/AlGaAs p-i-n quantum well modulator, and on an InP substrate.
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Livescu, G., Angell, M., Filipe, J. et al. A real-time photoluminescence imaging system. J. Electron. Mater. 19, 937–942 (1990). https://doi.org/10.1007/BF02652919
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DOI: https://doi.org/10.1007/BF02652919