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A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy

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Abstract

An apparatus has been designed and implemented to measure the elastic tensile properties (Young's modulus and tensile strength) of surface micromachined polysilicon specimens. The tensile specimens are “dog-bone” shaped ending in a large “paddle” for convenient electrostatic or, in the improved apparatus, ultraviolet (UV) light curable adhesive gripping deposited with electrostatically controlled manipulation. The typical test section of the specimens is 400 μm long with 2 μm×50 μm cross section. The new device supports a nanomechanics method developed in our laboratory to acquire surface topologies of deforming specimens by means of Atomic Force Microscopy (AFM) to determine (fields of) strains via Digital Image Correlation (DIC). With this tool, high strength or non-linearly behaving materials can be tested under different environmental conditions by measuring the strains directly on the surface of the film with nanometer resolution.

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References

  1. Sharpe, W.N., Brown, Jr. S., Johnson, G.C., andKnauss, W.G., “Round Robin Tests of Modulus and Strength of Polysilicon,”Proc. MRS,518,57–65 (1998).

    Google Scholar 

  2. Chasiotis, I. andKnauss, W.G., “Mechanical Evaluation of Polysilicon Properties by Means of Probe Microscopy,”Proc. SPIE,3512,66–75 (1998).

    Google Scholar 

  3. Sharpe, W.N., Turner, K.T., andEdwards, R.L., “Tensile Testing of Polysilicon,”J. Exp. Mech.,39, (3),162–170 (1999).

    Google Scholar 

  4. Greek, S., Ericson, F., Johansson, S., andSchweitz, J., “In Situ Tensile Strength Measurement and Weibull Analysis of Thick Film and Thin Film Micromachined Polysilicon Structures,”Thin Solid Films,292,247–254 (1997).

    Article  Google Scholar 

  5. Koskinen, J., Steinwall, J.E., Soave, R., andJohnson, H.H., “Microtensile Testing of Free-Standing Polysilicon Fibers of Various Grain Sizes,”J. Micromech. Microeng.,3,13–17 (1993).

    Article  Google Scholar 

  6. Tsuchiya, T., Tabata, O., Sakata, J., andTaga, Y., “Tensile Testing of Polycrystalline Silicon Thin Films Using Electrostatic Force Grip,”T. IEE Japan,116-E, (10),441–446 (1996).

    Google Scholar 

  7. Maier-Schneider, D., Malbach, J., andObermeier, E., “Variations in Young's Modulus and Intrinsic Stress of LPCVD Polysilicon due to High-Temperature Annealing,”J. Micromech. Microeng.,5,121–124 (1995).

    Article  Google Scholar 

  8. Breton, F.A. andKnauss, W.G., “Error Limitations in the Determination of Mechanical Properties of Thin Films,”J. Reinforced Plastic and Composites,16 (1),17–32 (1997).

    Google Scholar 

  9. Vendroux, G. andKnauss, W.G., “Submicron Deformation Field Measurements II: Improved Digital Image Correlation,” EXPERIMENTAL MECHANICS,38, (2),86–92 (1998).

    Article  Google Scholar 

  10. Sutton, M.A., Wolters, W.J., Peters, W.H., Ranson, W.F., andMcNeil, S.R., “Determination of Displacements Using an Improved Digital Image Correlation Method,”Image Vision Computing,1, (3),133–139 (1983).

    Google Scholar 

  11. Hill, R., “The Elastic Behavior of a Crystalline Aggregate,”Proc. Phys. Soc. London, Sect. A,65,349–354 (1952).

    Article  Google Scholar 

  12. Voigt, W., “Lehrbuch der Kristallphysik,”2nd Edition, 962, Teubner, Leipzig (1928).

    Google Scholar 

  13. Reuss, A., “Berechnung der Fliessgrenze von Mischkristallen auf Grund der Plastizitaettsbediengung fuer EinKristalle,”Z. Angew. Math. Mech.,9, (1),49–58 (1929).

    MATH  Google Scholar 

  14. Brantley, W.A., “Calculated Elastic Constants for Stress Problems Associated with Semiconductor Devices,”J. Appl. Phys.,44, (1),534–535 (1973).

    Article  Google Scholar 

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Chasiotis, I., Knauss, W.G. A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy. Experimental Mechanics 42, 51–57 (2002). https://doi.org/10.1007/BF02411051

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  • DOI: https://doi.org/10.1007/BF02411051

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