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High resolution photoelectron spectrometry of negative ions: Fine-structure transitions in O− and S− photodetachment

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Zeitschrift für Physik A Atoms and Nuclei

Abstract

The energy spectra of electrons detached from O− and S− ions by 488.0 nm and 514.5 nm photons have been measured with high electron energy resolution (5 meV) in order to determine the branching ratios for the various2 P 3/2, 1/2 →3P2, 1, 0 fine-structure transitions together with their respective angular distributions. Detailed information on the relative importance of thes- andd-wave continuum is obtained.

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Authors and Affiliations

  1. Fakultät für Physik der Universität, Freiburg/Br., Germany

    F. Breyer, P. Frey & H. Hotop

Authors
  1. F. Breyer
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  2. P. Frey
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  3. H. Hotop
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Additional information

We acknowledge financial support by the Deutsche Forschungsgemeinschaft and by the Fakultät für Physik der Universität Freiburg. We especially thank O. Osberghaus for his continued interest and encouragement. We gratefully acknowledge the support from many colleagues at various stages of this work. In particular, we thank A.R.P. Rau for useful discussions and the communication of his geometrical factors for thed-wave and S. Geltman for sending thee −+O(3 P) phase shifts. We thank both the electronics and mechanical workshop for their great effort in the building of major parts of the new apparatus. One of us (H.H.) would like to acknowledge W.C. Lineberger for sharing and transferring enthusiasm about laser photodetachment studies of negative ions.

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Breyer, F., Frey, P. & Hotop, H. High resolution photoelectron spectrometry of negative ions: Fine-structure transitions in O− and S− photodetachment. Z Physik A 286, 133–138 (1978). https://doi.org/10.1007/BF01408966

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  • DOI: https://doi.org/10.1007/BF01408966

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