Elektroneninterferometrische Bestimmung der mittleren inneren Potentiale von Al, Cu und Ge unter Verwendung eines neuen Präparationsverfahrens

Abstract

Electron-interferometric measurements of the mean inner potentials are repeated with Al and Cu and for the first time performed with Ge. A new wet preparation method is used to prepare the step shaped specimens for the electron interferometer. This allows a more precise determination of the step height since the conditions under which the vacuum evaporated layers condensate are equal on the glass slide for the optical height measurement and on the specimen carrier. In the new preparation method, a glass slide is, by evaporation under vacuum, first covered with a B₂O₃ layer, then with a continuous base and finally with steps of the substance to be measured through a grid stencil. After dissolving the B₂O₃ in water, the compound foil is spread over an electron microscopic specimen carrier.

The experimentally determined mean inner potential values for Ge and Cu agree well with those computed bySiota. On the other hand, the value for Al is by 2 volts higher than the computed one.