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Specific conductivity measurements on non-homogeneous semiconductor samples

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Abstract

A perturbation method for the potential calculation in a non-homogeneous semiconductor sample is given. The non-homogeneous behaviour of the specific conductivity is described in a probabilistic way. Two techniques, the eigenfuction expansion and the use of Green's function, are outlined. These techniques unable us to calculate statistical parameters, such as the expectation value and the mean-square deviation, of electrical quantities which can be measured on the semiconductor sample.

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Authors and Affiliations

  1. Laboratory of Electronics, Ghen State University, B-9000, Ghent, Belgium

    G. De Mey

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  1. G. De Mey
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De Mey, G. Specific conductivity measurements on non-homogeneous semiconductor samples. Appl. Phys. 6, 189–197 (1975). https://doi.org/10.1007/BF00883751

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  • DOI: https://doi.org/10.1007/BF00883751

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