Abstract
A new method for the etching of In, Sn, Pb, Sb, Bi, and Zn films in methane and acetone discharges was examined with respect to various parameters such as electrode temperature, power density, bias, and reaction period. The etching species are assumed to be CH3 radicals forming a volatile metallorganic compound, since etch rates in hydrogen plasmas or argon sputter rates are orders of magnitude lower. Etch rates up to 1600 Å/min could be obtained.
Similar content being viewed by others
References
H. Yasuda, inThin Film Processes (J. L. Vossen and W. Kern eds.), Academic Press, New York (1978).
F. Paneth and W. Hofeditz,Chem. Ber. 62, 1335 (1929).
F. A. Paneth and H. Loleit,J. Chem. Soc. 366 (1935).
Th. G. Pearson,J. Chem. Soc., 1718 (1934); Th. G. Pearson and R. H. Purcell,J. Chem. Soc., 1151 (1935).
R. J. Lagow, L. L. Gerchman, R. A. Jacob and J. A. Morrison,J. Am. Chem. Soc. 97, 518 (1975).
R. J. Lagow and J. A. Morrison,Adv. Inorg. Chem. Radiochem. 23, 177 (1980).
T. N. Bell, B. J. Pullman and B. O. West,Aust. J. Chem. 16, 722 (1963).
F. O. Rice and A. L. Glasebrook,J. Am. Chem. Soc. 56, 2472 (1934).
P. B. Ayscough and E. W. R. Steacie,Proc. R. Soc. London A 234, 476 (1956).
P. Ausloos,Mol. Photochem. 4, 39 (1972).
R. D'Agostino, P. Capezzuto, G. Bruno, and F. Cramarossa,Pure Appl. Chem. 57, 1287 (1985).
S. W. Lin and J. P. Wightman,J. Appl. Chem. Biotechnol. 21, 168 (1971).
A. P. Davis,J. Chem. Phys. 35, 3330 (1931).
P. Canepa, G. Castello, and M. Nicchia,Ann. Chim. 68, 543 (1978).
A. Szymanski and J. Sowadski,Z. phys. Chemie. Leipzig 256, 299 (1975).
A. Szymanski and A. Podgorski,Z. phys. Chem. Leipzig 254, 305 (1973).
W. Braun, K. H. Welge and J. R. McNesby,J. Chem Phys. 45 2650 (1966); W. Braun, J. R. McNesby and A. M. Bass,J. Chem. Phys. 46, 2071 (1967).
JANAF Thermochemical Tables, 2nd edn., Washington (1971).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Haag, C., Suhr, H. Etching of metals by means of organic radicals. Plasma Chem Plasma Process 6, 197–203 (1986). https://doi.org/10.1007/BF00575128
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF00575128