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A study of defects in epitaxial films of ZnTe by transmission electron microscopy

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Abstract

The electron diffraction patterns of sphalerite structure ZnTe films evaporated in vacuum onto NaCl, BaF2 and CaF2 substrates contained numerous satellite spots. The diffraction patterns from (100) ZnTe films grown on cleavage faces of NaCl always contained satellite spots that arose from grains of wurtzite structure material with the (0001) plane parallel to the plane of the film and doubly positioned by a 30‡ rotation about the normal to the film. Other satellite spots occurred due to the presence of cubic microtwins and other types of included grains of wurtzite. Films grown under cleaner conditions had simpler structures.

The most prominent satellite spots in diffraction patterns from (111) films of ZnTe grown on NaCl, BaF2 and CaF2 were due to twinned sphalerite double positioning. Additional spots arose from microtwins.

Evidence of double diffraction was found in both the (100) and (111) diffraction patterns.

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Author notes

  1. D. B. Holt

    Present address: School of Physics, University of New South Wales, PO Box 1, Kensington, New South Wales, Australia

Authors and Affiliations

  1. Department of Metallurgy, Imperial College, London, SW7, UK

    D. B. Holt

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  1. D. B. Holt
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Holt, D.B. A study of defects in epitaxial films of ZnTe by transmission electron microscopy. J Mater Sci 4, 935–943 (1969). https://doi.org/10.1007/BF00555307

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  • DOI: https://doi.org/10.1007/BF00555307

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