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Contribution of the contamination of deionized water by bacteria to the adsorption of carbon on Si and GaSb

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Abstract

Auger electron spectroscopy analysis was performed on GaSb and Si semiconductor surfaces rinsed by deionized water or by tap water. The surface contaminations deduced from these analyses were correlated to the results of chemical and bacteriological tests of deionized tap water and it was found that the development of micro-organisms in the water-line was responsible for a carbon contamination of the samples rinsed by deionized water.

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Authors and Affiliations

  1. Laboratoire d'Etude des Surfaces, Interfaces et Composants, Université de Montpellier II, Sciences et Techniques du Languedoc, Eugène Bataillon, Case Postale 088-Pl, 34095, Montpellier Cedex 5, France

    E. T. De Paiva, F. W. O. Da Silva, C. Raisin & L. Lassabatere

Authors
  1. E. T. De Paiva
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  2. F. W. O. Da Silva
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  3. C. Raisin
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  4. L. Lassabatere
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De Paiva, E.T., Da Silva, F.W.O., Raisin, C. et al. Contribution of the contamination of deionized water by bacteria to the adsorption of carbon on Si and GaSb. J Mater Sci 27, 1585–1588 (1992). https://doi.org/10.1007/BF00542921

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  • DOI: https://doi.org/10.1007/BF00542921

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