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A unified approach for fault simulation of linear mixed-signal circuits

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Abstract

The rapidly evolving role of analog signal processing has spawned off a variety of mixed-signal circuit applications. The integration of the analog and digital circuits has created a lot of concerns in testing these devices. This paper presents an efficient unified fault simulation platform for mixed-signal circuits while accounting for the imprecision in analog signals. While the classical stuck-at fault model is used for the digital part, faults in the analog circuit cover catastrophic as well as parametric defects in the passive and active components. A unified framework is achieved by combining a discretized representation of the analog circuit with the Z-domain representation of the digital part. Due to the imprecise nature of analog signals, an arithmetic distance based fault detection criterion and a statistical measure of digital fault coverage are proposed.

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Authors and Affiliations

  1. Computer Engineering Research Center, ENS 424, The University of Texas at Austin, 78712-1084, Austin, TX, USA

    Ashok Balivada & Hong Zheng

  2. LogicVision, 101 Metro Drive, Third Floor, 95110, San Jose, CA, USA

    Naveena Nagi

  3. School of Electrical Engineering, Georgia Institute of Technology, 30332-0250, Atlanta, GA, USA

    Abhijit Chatterjee

  4. Computer Engineering Research Center, ENS 424, The University of Texas at Austin, 78712-1084, Austin, TX, USA

    Jacob A. Abraham

Authors
  1. Ashok Balivada
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  2. Hong Zheng
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  3. Naveena Nagi
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  4. Abhijit Chatterjee
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  5. Jacob A. Abraham
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Additional information

This research was supported by the National Science Foundation under grant MIP-9222481.

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Balivada, A., Zheng, H., Nagi, N. et al. A unified approach for fault simulation of linear mixed-signal circuits. J Electron Test 9, 29–41 (1996). https://doi.org/10.1007/BF00137563

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  • DOI: https://doi.org/10.1007/BF00137563

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