Summary
Foliar symptom severity of seedlings artificially inoculated with S. nodorum were used to idenify the type of gne action controlling resistance to this pathogen in the early generations of two wheat crosses. In both crosses a resistant spring wheat cultivar was crossed to a susceptible cultivar. Reciprocal crosses were included in the analysis to determine if the cytoplasm contributed in any significant degree to the level of resistance present.
Results indicated that resistance was polygenic and that it could be explaned prinerpally by additive gene effects. Some differences in reciprocal crosses were evident, but a significant role for the eytoplasm in resistance is not indicated.
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Cooperative investigations of the Agricultural Research Service of the U. S. Department of Agriculture and the Montana Agricultural Experiment Station. Journal Paper No. 1210.
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Mullaney, E.J., Martin, J.M. & Scharen, A.L. Generation mean analysis to identify and partition the components of genetic resistance to Septoria nodorum in wheat. Euphytica 31, 539–545 (1982). https://doi.org/10.1007/BF00021674
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DOI: https://doi.org/10.1007/BF00021674