Skip to main content

Abstract

We wish to extend a warm welcome to all of you for attending and supporting this meeting. Without your interest and urging, this conference would not have taken place. In particular, we would like to thank John Cleland and Dick Wood of Oak Ridge National Laboratory for hosting the first NTD Conference and for suggesting that a second conference be held at the University of Missouri. Our sincere appreciation extends also to the Monsanto Corporation, the conference catalyst in the early planning stages, both financially and otherwise We also thank the Air Force Office of Scientific Research and the Office of Naval Research for their encouragement and support and Rockwell International who supported the publishing of the abstracts.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

eBook
USD 16.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Similar content being viewed by others

References

  1. D. E. Cullen and P. J. Hlavac, ENDF/B Cross Sections, Brookhaven National Laboratory, Upton, N. Y.,(1972).

    Google Scholar 

  2. M. Tanenbaum and A. D. Mills, J. Electrochem. Soc. 108, 171 (1961).

    Article  Google Scholar 

  3. D. S. Billington and J. H. Crawford, Jr., Radiation Damage in Solids, Princeton University Press, Princeton, N. J., (1961), Chapter 2.

    Google Scholar 

  4. M. V. Chukichev and V. S. Vavilov, Sov. Phys. Solid State 3, 1103 (1961).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1979 Plenum Press, New York

About this chapter

Cite this chapter

Meese, J.M. (1979). The NTD Process—A New Reactor Technology. In: Meese, J.M. (eds) Neutron Transmutation Doping in Semiconductors. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-8249-2_1

Download citation

  • DOI: https://doi.org/10.1007/978-1-4684-8249-2_1

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-8251-5

  • Online ISBN: 978-1-4684-8249-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics