Abstract
The direct replica technique is used to make an impression of the surface topography of a sample that cannot be observed directly in the microscope because it is too large or too thick. The resulting replica gives an inverted topography image.
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Ayache, J., Beaunier, L., Boumendil, J., Ehret, G., Laub, D. (2010). Replica Techniques. In: Sample Preparation Handbook for Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-5975-1_5
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DOI: https://doi.org/10.1007/978-1-4419-5975-1_5
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Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4419-5974-4
Online ISBN: 978-1-4419-5975-1
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