Sample Preparation Handbook for Transmission Electron Microscopy

Techniques

  • Jeanne Ayache
  • Luc Beaunier
  • Jacqueline Boumendil
  • Gabrielle Ehret
  • Danièle Laub

Table of contents

  1. Front Matter
    Pages i-xxv
  2. Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 1-4
  3. Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 5-106
  4. Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 107-152
  5. Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 153-228
  6. Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 229-256
  7. Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 257-275
  8. Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub
    Pages 277-316
  9. Back Matter
    Pages 317-338

About this book

Introduction

This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. Sample Preparation Handbook for Transmission Electron Microscopy: Techniques describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab.

Key Features of the Handbook:

  • Combines all of the latest techniques for the preparation of mineral to biological samples
  • Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)
  • Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis
  • Links to a complementary interactive database website which is available to scientists worldwide*
  • Written by authors with 100 years of combined experience in electron microscopy

*http://temsamprep.in2p3.fr/

Keywords

Sample preparation technique for TEM Structure analysis chemical analysis electron microscope electron microscopy microscopy sample preparation physics spectroscopic analysis thin slices protocols transmission electron microscopy

Authors and affiliations

  • Jeanne Ayache
    • 1
  • Luc Beaunier
    • 2
  • Jacqueline Boumendil
    • 3
  • Gabrielle Ehret
    • 4
  • Danièle Laub
    • 5
  1. 1.Unité mixte CNRS-UMR8126-IGR, Laboratoire de Microscopie Moléculaire eInstitut Gustave RoussyVillejuif CXFrance
  2. 2.CNRS UPR15, Boîte courrier 133Université Paris VIParis CX 05France
  3. 3.Centre de Microscopie Electronique, Appliquée à la Biologie et à la GéologieUniversité Lyon IVilleurbanne CXFrance
  4. 4.CNRS-UMR 7504, Inst. Physique et Chimie desUniversité StrasbourgStrasbourg CX 2France
  5. 5.Faculté des Sciences de Base, Centre Interdisciplinaire de MicroscopieEcole Polytechnique Fédérale de LausanneLausanneSwitzerland

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4419-5975-1
  • Copyright Information Springer Science+Business Media, LLC 2010
  • Publisher Name Springer, New York, NY
  • eBook Packages Chemistry and Materials Science
  • Print ISBN 978-1-4419-5974-4
  • Online ISBN 978-1-4419-5975-1
  • About this book