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Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces

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Abstract

The femtosecond transient reflecting grating (TRG) method was developed and applied to monitor the ultrafast dynamics of photo-excited carriers on Si(111) surfaces. TRG responses were measured as a function of the pump beam intensity and fringe spacing, and two relaxation components were observed. An analysis of the results has suggested that the slow component corresponds to carrier diffusion and that the fast component corresponds to a combined process between ballistic transport and carrier-carrier scattering of non-equilibrium carriers.

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Authors and Affiliations

  1. Department of Applied Chemistry, School of Engineering, The University of Tokyo, Hongo, Bunkyo, Tokyo, 113-8656, Japan

    Tomohiro Morishita, Akihide Hibara & Tsuguo Sawada

  2. Department of Environmental Systems Engineering, Kanazawa Institute of Technology, Ohgigaoka, Nonoichi, Ishikawa, 921-8501, Japan

    Isao Tsuyumoto

  3. Department of Molecular Science and Technology, Graduate School of Engineering Science, Kyushu University, Kasugakoen, Kasuga, Fukuoka, 816-8580, Japan

    Akira Harata

Authors
  1. Tomohiro Morishita
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  2. Akihide Hibara
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  3. Tsuguo Sawada
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  4. Isao Tsuyumoto
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  5. Akira Harata
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Morishita, T., Hibara, A., Sawada, T. et al. Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces. ANAL. SCI. 16, 403–406 (2000). https://doi.org/10.2116/analsci.16.403

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  • DOI: https://doi.org/10.2116/analsci.16.403

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