Abstract
Ultrafast measurement technology provides essential contributions to our understanding of the properties and functions of solids and nanostructures. Atomic-scale vistas with ever-growing spatial and temporal resolution are offered by methods based on short pulses of x-rays and electrons. Time-resolved electron diffraction and microscopy are among the most powerful approaches to investigate nonequilibrium structural dynamics. In this article, we discuss recent advances in ultrafast electron imaging enabled by significant improvements in the coherence of pulsed electron beams. Specifically, we review the development and first application of ultrafast low-energy electron diffraction for the study of structural dynamics at surfaces, and discuss novel opportunities for ultrafast transmission electron microscopy facilitated by laser-triggered field-emission sources. These and further developments will render coherent electron beams an essential component in future ultrafast nanoscale imaging.
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References
U. Bovensiepen, H. Petek, M. Wolf, Eds., Dynamics at Solid State Surfaces and Interfaces (Wiley-VCH, Weinheim, Germany, 2010), vol. 1.
R.J.D. Miller, Annu. Rev. Phys. Chem. 65, 583 (2014).
A.H. Zewail, Annu. Rev. Phys. Chem. 57, 65 (2006).
A.M. Lindenberg, J. Larsson, K. Sokolowski-Tinten, K.J. Gaffney, C. Blome, O. Synnergren, J. Sheppard, C. Caleman, A.G. MacPhee, D. Weinstein, D.P. Lowney, T.K. Allison, T. Matthews, R.W. Falcone, A.L. Cavalieri, D.M. Fritz, S.H. Lee, P.H. Bucksbaum, D.A. Reis, J. Rudati, P.H. Fuoss, C.C. Kao, D.P. Siddons, R. Pahl, J. Als-Nielsen, S. Duesterer, R. Ischebeck, H. Schlarb, H. Schulte-Schrepping, Th. Tschentscher, J. Schneider, D. von der Linde, O. Hignette, F. Sette, H.N. Chapman, R.W. Lee, T.N. Hansen, S. Techert, J.S. Wark, M. Bergh, G. Huldt, D. van der Spoel, N. Timneanu, J. Hajdu, R.A. Akre, E. Bong, P. Krejcik, J. Arthur, S. Brennan, K. Luening, J.B. Hastings, Science 308, 392 (2005).
M.A. Huber, M. Plankl, M. Eisele, R.E. Marvel, F. Sandner, T. Korn, C. Schüller, R.F. Haglund, R. Huber, T.L. Cocker, Nano Lett. 16, 1421 (2016).
V. Kravtsov, R. Ulbricht, J.M. Atkin, M.B. Raschke, Nat. Nanotechnol. 11, 459 (2016).
M. Wagner, Z. Fei, A.S. McLeod, A.S. Rodin, W. Bao, E.G. Iwinski, Z. Zhao, M. Goldflam, M. Liu, G. Dominguez, M. Thiemens, M.M. Fogler, A.H. Castro Neto, C.N. Lau, S. Amarie, F. Keilmann, D.N. Basov, Nano Lett. 14, 894 (2014).
Y. Terada, S. Yoshida, O. Takeuchi, H. Shigekawa, Nat. Photonics 4, 869 (2010).
T.L. Cocker, V. Jelic, M. Gupta, S.J. Molesky, J.A.J. Burgess, G.D.L. Reyes, L.V. Titova, Y.Y. Tsui, M.R. Freeman, F.A. Hegmann, Nat. Photonics 7, 620 (2013).
T.L. Cocker, D. Peller, P. Yu, J. Repp, R. Huber, Nature 539, 263 (2016).
E. Quinonez, J. Handali, B. Barwick, Rev. Sci. Instrum. 84, 103710 (2013).
M. Müller, A. Paarmann, R. Ernstorfer, Nat. Commun. 5, 5292 (2014).
J. Vogelsang, J. Robin, B.J. Nagy, P. Dombi, D. Rosenkranz, M. Schiek, P. Groß, C. Lienau, Nano Lett. 15, 4685 (2015).
K.J. Gaffney, H.N. Chapman, Science 316, 1444 (2007).
R.L. Sandberg, C. Song, P.W. Wachulak, D.A. Raymondson, A. Paul, B. Amirbekian, E. Lee, A.E. Sakdinawat, C. La-O-Vorakiat, M.C. Marconi, C.S. Menoni, M.M. Murnane, J.J. Rocca, H.C. Kapteyn, J. Miao, Proc. Natl. Acad. Sci. U.S.A. 105, 24 (2008).
O. Kfir, S. Zayko, C. Nolte, M. Sivis, M. Möller, B. Hebler, S.S.P.K. Arekapudi, D. Steil, S. Schäfer, M. Albrecht, O. Cohen, S. Mathias, C. Ropers, Sci. Adv. 3, eaao4641 (2017).
R.J.D. Miller, Science 343, 1108 (2014).
A.H. Zewail, Science 328, 187 (2010).
P. Musumeci, J.T. Moody, C.M. Scoby, M.S. Gutierrez, H.A. Bender, N.S. Wilcox, Rev. Sci. Instrum. 81, 13306 (2010).
S. Lahme, C. Kealhofer, F. Krausz, P. Baum, Struct. Dyn. 1, 34303 (2014).
M. Gulde, S. Schweda, G. Storeck, M. Maiti, H.K. Yu, A.M. Wodtke, S. Schafer, C. Ropers, Science 345, 200 (2014).
S.P. Weathersby, G. Brown, M. Centurion, T.F. Chase, R. Coffee, J. Corbett, J.P. Eichner, J.C. Frisch, A.R. Fry, M. Gühr, N. Hartmann, C. Hast, R. Hettel, R.K. Jobe, E.N. Jongewaard, J.R. Lewandowski, R.K. Li, A.M. Lindenberg, I. Makasyuk, J.E. May, D. McCormick, M.N. Nguyen, A.H. Reid, X. Shen, K. Sokolowski-Tinten, T. Vecchione, S.L. Vetter, J. Wu, J. Yang, H.A. Dürr, X.J. Wang, Rev. Sci. Instrum. 86, 73702 (2015).
S. Manz, A. Casandruc, D. Zhang, Y. Zhong, R.A. Loch, A. Marx, T. Hasegawa, L.C. Liu, S. Bayesteh, H. Delsim-Hashemi, M. Hoffmann, M. Felber, M. Hachmann, F. Mayet, J. Hirscht, S. Keskin, M. Hada, S.W. Epp, K. Flöttmann, R.J.D. Miller, Faraday Discuss. 177, 467 (2015).
W. Liang, S. Schäfer, A.H. Zewail, Chem. Phys. Lett. 542, 1 (2012).
A. Hanisch-Blicharski, A. Janzen, B. Krenzer, S. Wall, F. Klasing, A. Kalus, T. Frigge, M. Kammler, M. Horn-von Hoegen, Ultramicroscopy 127, 2 (2013).
T. Frigge, B. Hafke, T. Witte, B. Krenzer, C. Streubühr, A. Samad Syed, V. Mikšic´ Trontl, I. Avigo, P. Zhou, M. Ligges, D. von der Linde, U. Bovensiepen, M. Horn-von Hoegen, S. Wippermann, A. Lücke, S. Sanna, U. Gerstmann, W.G. Schmidt, Nature 544, 207 (2017).
S. Vogelgesang, G. Storeck, J.G. Horstmann, T. Diekmann, M. Sivis, S. Schramm, K. Rossnagel, S. Schäfer, C. Ropers, Nat. Phys. 14, 184 (2018).
H. Dömer, O. Bostanjoglo, Rev. Sci. Instrum. 74, 4369 (2003).
J.S. Kim, T. LaGrange, B.W. Reed, M.L. Taheri, M.R. Armstrong, W.E. King, N.D. Browning, G.H. Campbell, Science 321, 1472 (2008).
D.-S. Yang, O.F. Mohammed, A.H. Zewail, Proc. Natl. Acad. Sci. U.S.A. 107, 14993 (2010).
J. Sun, V.A. Melnikov, J.I. Khan, O.F. Mohammed, J. Phys. Chem. Lett. 6, 3884 (2015).
T. Van Oudheusden, E.F. De Jong, S.B. van der Geer, W.P.E.M. Op ’t Root, O.J. Luiten, B.J. Siwick, J. Appl. Phys. 102, 93501 (2007).
G. Sciaini, R.J.D. Miller, Rep. Prog. Phys. 74, 96101 (2011).
R.P. Chatelain, V.R. Morrison, C. Godbout, B.J. Siwick, Appl. Phys. Lett. 101, 81901 (2012).
C. Gerbig, A. Senftleben, S. Morgenstern, C. Sarpe, T. Baumert, New J. Phys. 17, 43050 (2015).
L. Waldecker, R. Bertoni, R. Ernstorfer, J. Appl. Phys. 117, 44903 (2015).
H. Daoud, K. Floettmann, R.J.D. Miller, Struct. Dyn. 4, 044016 (2017).
M. Reiser, Theory and Design of Charged Particle Beams, Wiley Series in Beam Physics and Accelerator Technology (Wiley, Weinheim, Germany, 2008).
D.H. Dowell, J.F. Schmerge, Phys. Rev. Spec. Top. Accel. Beams 12, 74201 (2009).
M. Kuwahara, Y. Nambo, K. Aoki, K. Sameshima, X. Jin, T. Ujihara, H. Asano, K. Saitoh, Y. Takeda, N. Tanaka, Appl. Phys. Lett. 109, 13108 (2016).
L. Kasmi, D. Kreier, M. Bradler, E. Riedle, P. Baum, New J. Phys. 17, 33008 (2015).
M. Merano, S. Collin, P. Renucci, M. Gatri, S. Sonderegger, A. Crottini, J.D. Ganière, B. Deveaud, Rev. Sci. Instrum. 76, 85108 (2005).
C. Ropers, D.R. Solli, C.P. Schulz, C. Lienau, T. Elsaesser, Phys. Rev. Lett. 98, 43907 (2007).
B. Barwick, C. Corder, J. Strohaber, N. Chandler-Smith, C. Uiterwaal, H. Batelaan, New J. Phys. 9, 142 (2007).
P. Hommelhoff, Y. Sortais, A. Aghajani-Talesh, M.A. Kasevich, Phys. Rev. Lett. 96, 77401 (2006).
R. Bormann, M. Gulde, A. Weismann, S.V. Yalunin, C. Ropers, Phys. Rev. Lett. 105, 147601 (2010).
G. Herink, D.R. Solli, M. Gulde, C. Ropers, Nature 483, 190 (2012).
D. Ehberger, J. Hammer, M. Eisele, M. Krüger, J. Noe, A. Högele, P. Hommelhoff, Phys. Rev. Lett. 114, 227601 (2015).
A. Feist, N. Bach, N. Rubiano da Silva, T. Danz, M. Möller, K.E. Priebe, T. Domröse, J.G. Gatzmann, S. Rost, J. Schauss, S. Strauch, R. Bormann, M. Sivis, S. Schäfer, C. Ropers, Ultramicroscopy 176, 63 (2017).
F. Houdellier, G.M. Caruso, S. Weber, M. Kociak, A. Arbouet, Ultramicroscopy 186, 128 (2018).
A. Paarmann, M. Gulde, M. Müller, S. Schäfer, S. Schweda, M. Maiti, C. Xu, T. Hohage, F. Schenk, C. Ropers, R. Ernstorfer, J. Appl. Phys. 112, 113109 (2012).
R. Bormann, S. Strauch, S. Schäfer, C. Ropers, J. Appl. Phys. 118, 173105 (2015).
B. Schröder, M. Sivis, R. Bormann, S. Schäfer, C. Ropers, Appl. Phys. Lett. 107, 231105 (2015).
M.Z. Hasan, C.L. Kane, Rev. Mod. Phys. 82, 3045 (2010).
A. Ichimiya, P.I. Cohen, Reflection High-Energy Electron Diffraction, Springer Series in Surface Sciences (Cambridge University Press, Cambridge, 2004).
M.A. Van Hove, W.H. Weinberg, C.-M. Chan, Low-Energy Electron Diffraction, Springer Series in Surface Sciences (Springer-Verlag, Berlin, 1986).
G. Storeck, S. Vogelgesang, M. Sivis, S. Schäfer, C. Ropers, Struct. Dyn. 4, 44024 (2017).
A. Spijkerman, J.L. de Boer, A. Meetsma, G.A. Wiegers, S. van Smaalen, Phys. Rev. B Condens. Matter 56, 13757 (1997).
K. Rossnagel, J. Phys. Condens. Matter 23, 213001 (2011).
L. Stojchevska, I. Vaskivskyi, T. Mertelj, P. Kusar, D. Svetin, S. Brazovskii, D. Mihailovic, Science 344, 177 (2014).
L. Perfetti, P.A. Loukakos, M. Lisowski, U. Bovensiepen, H. Berger, S. Biermann, P.S. Cornaglia, A. Georges, M. Wolf, Phys. Rev. Lett. 97, 67402 (2006).
S. Hellmann, C. Sohrt, M. Beye, T. Rohwer, F. Sorgenfrei, M. Marczynski-Bühlow, M. Kalläne, H. Redlin, F. Hennies, M. Bauer, A. Föhlisch, L. Kipp, W. Wurth, K. Rossnagel, New J. Phys. 14, 13062 (2012).
J.C. Petersen, S. Kaiser, N. Dean, A. Simoncig, H.Y. Liu, A.L. Cavalieri, C. Cacho, I.C.E. Turcu, E. Springate, F. Frassetto, L. Poletto, S.S. Dhesi, H. Berger, A. Cavalleri, Phys. Rev. Lett. 107, 177402 (2011).
M. Ligges, I. Avigo, D. Golež, H. Strand, Y. Beyazit, K. Hanff, F. Diekmann, L. Stojchevska, M. Kalläne, P. Zhou, K. Rossnagel, M. Eckstein, P. Werner, U. Bovensiepen, Phys. Rev. Lett. 120, 166401 (2018).
M. Eichberger, H. Schäfer, M. Krumova, M. Beyer, J. Demsar, H. Berger, G. Moriena, G. Sciaini, R.J.D. Miller, Nature 468, 799 (2010).
K. Haupt, M. Eichberger, N. Erasmus, A. Rohwer, J. Demsar, K. Rossnagel, H. Schwoerer, Phys. Rev. Lett. 116, 16402 (2016).
C. Laulhé, T. Huber, G. Lantz, A. Ferrer, S.O. Mariager, S. Grübel, J. Rittmann, J.A. Johnson, V. Esposito, A. Lübcke, L. Huber, M. Kubli, M. Savoini, V.L.R. Jacques, L. Cario, B. Corraze, E. Janod, G. Ingold, P. Beaud, S.L. Johnson, S. Ravy, Phys. Rev. Lett. 118, 247401 (2017).
W.L. McMillan, Phys. Rev. B Condens. Matter 12, 1187 (1975).
L. Wimmer, G. Herink, D.R. Solli, S.V. Yalunin, K.E. Echternkamp, C. Ropers, Nat. Phys. 10, 432 (2014).
C. Kealhofer, W. Schneider, D. Ehberger, A. Ryabov, F. Krausz, P. Baum, Science 352, 429 (2016).
D.J. Flannigan, A.H. Zewail, Acc. Chem. Res. 45, 1828 (2012).
L. Piazza, D.J. Masiel, T. LaGrange, B.W. Reed, B. Barwick, F. Carbone, Chem. Phys. 423, 79 (2013).
A. Feist, K.E. Echternkamp, J. Schauss, S.V. Yalunin, S. Schäfer, C. Ropers, Nature 521, 200 (2015).
E. Kieft, K.B. Schliep, P.K. Suri, D.J. Flannigan, Struct. Dyn. 2, 51101 (2015).
G. Cao, S. Sun, Z. Li, H. Tian, H. Yang, J. Li, Sci. Rep. 5, 8404 (2015).
K. Bücker, M. Picher, O. Crégut, T. LaGrange, B.W. Reed, S.T. Park, D.J. Masiel, F. Banhart, Ultramicroscopy 171, 8 (2016).
Y.M. Lee, Y.J. Kim, Y.-J. Kim, O.-H. Kwon, Struct. Dyn. 4, 44023 (2017).
S. Ji, L. Piazza, G. Cao, S.T. Park, B.W. Reed, D.J. Masiel, J. Weissenrieder, Struct. Dyn. 4, 54303 (2017).
W. Verhoeven, J.F.M. van Rens, E.R. Kieft, P.H.A. Mutsaers, O.J. Luiten, Ultramicroscopy 188, 85 (2018).
A. Tonomura, Electron Holography, 2nd ed., Springer Series in Optical Sciences (Springer, Berlin, 1999).
P.A. Midgley, R.E. Dunin-Borkowski, Nat. Mater. 8, 271 (2009).
J. Verbeeck, H. Tian, P. Schattschneider, Nature 467, 301 (2010).
J.M. Zuo, J.C.H. Spence, Advanced Transmission Electron Microscopy (Springer-Verlag, New York, 2017).
B. Cook, M. Bronsgeest, K. Hagen, P. Kruit, Ultramicroscopy 109, 403 (2009).
D.K. Armani, T.J. Kippenberg, S.M. Spillane, K.J. Vahala, Nature 421, 925 (2003).
M. Eichenfield, J. Chan, R.M. Camacho, K.J. Vahala, O. Painter, Nature 462, 78 (2009).
M. Aspelmeyer, T.J. Kippenberg, F. Marquardt, Rev. Mod. Phys. 86, 1391 (2014).
M. Maldovan, Nature 503, 209 (2013).
S. Volz, J. Ordonez-Miranda, A. Shchepetov, M. Prunnila, J. Ahopelto, T. Pezeril, G. Vaudel, V. Gusev, P. Ruello, E.M. Weig, M. Schubert, M. Hettich, M. Grossman, T. Dekorsy, F. Alzina, B. Graczykowski, E. Chavez-Angel, J. Sebastian Reparaz, M.R. Wagner, C.M. Sotomayor-Torres, S. Xiong, S. Neogi, D. Donadio, Eur. Phys. J. B 89, 15 (2016).
B. Barwick, H.S. Park, O. Kwon, J.S. Baskin, A.H. Zewail, Science 322, 1227 (2008).
A. Yurtsever, A.H. Zewail, Proc. Natl. Acad. Sci. U.S.A. 108, 3152 (2011).
D.R. Cremons, D.A. Plemmons, D.J. Flannigan, Nat. Commun. 7, 11230 (2016).
A. Feist, N. Rubiano da Silva, W. Liang, C. Ropers, S. Schäfer, Struct. Dyn. 5, 14302 (2018).
K.E. Echternkamp, A. Feist, S. Schäfer, C. Ropers, Nat. Phys. 12, 1000 (2016).
K.E. Priebe, C. Rathje, S.V. Yalunin, T. Hohage, A. Feist, S. Schäfer, C. Ropers, Nat. Photonics 11, 793 (2017).
Acknowledgments
We gratefully acknowledge the collaboration with our coauthors on the works discussed here. This work was funded by the Deutsche Forschungsgemeinschaft (DFG-SFB-1073, Project A05, and DFG-SPP-1840), the VolkswagenStiftung, and the European Research Council (ERC-StG “ULEED,” ID: 639119).
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Feist, A., Storeck, G., Schäfer, S. et al. Structural dynamics probed by high-coherence electron pulses. MRS Bulletin 43, 504–511 (2018). https://doi.org/10.1557/mrs.2018.153
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DOI: https://doi.org/10.1557/mrs.2018.153