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Molecular mapping and markers for leaf rust resistance gene Lr24 in CIMMYT wheat line 19HRWSN-122

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Abstract

Leaf rust, caused by Puccinia triticina, is an important foliar disease of wheat (Triticum aestivum L.) worldwide. In the present study, CIMMYT line 19HRWSN-122 and 36 lines with known Lr (leaf rust resistance) genes were inoculated with 13 Chinese P. triticina pathotypes for postulation of Lr genes at the seedling stage. Line 19HRWSN-122 showed high resistance to all 13 P. triticina pathotypes in the greenhouse, indicating that it carries effective seedling resistance. This may be due to a resistance gene combination, an effective gene to all pathotypes present in China or a new resistance gene. With the objective of mapping the putatively new gene for resistance to leaf rust, 20 F1, 280 F2 plants and 254 F2:3 lines from the cross 19HRWSN-122 × Zhengzhou 5389 (susceptible) were inoculated with P. triticina pathotype THJP in the greenhouse. Results based on the F1, F2 and F2:3 lines indicated that a single dominant gene, temporarily designated LrHR122, was present in 19HRWSN-122. Bulked segregant analysis was performed on equal amounts of genomic DNA from ten resistant and ten susceptible F2:3 lines. Molecular markers polymorphic between the resistant and susceptible bulks were used to genotype F2:3 lines. LrHR122 was linked to one SSR marker, one STS marker, one SCAR marker and three EST markers on chromosome 3DL. Marker SCS1302 609 co-segregated with LrHR122, and the closest flanking markers were BE442875 and STS24-16 at genetic distances of 0.4 and 0.4 cM, respectively. Lr24 is known to be located on chromosome 3DL near LrHR122. In seedling tests, lines with both LrHR122 and Lr24 showed high resistance to all 13 Chinese P. triticina pathotypes. According to the pedigree and chromosome position LrHR122 should be Lr24. Lr24 was closely linked to one SSR marker and three EST markers in the terminal region of 3DL. These markers should be useful for marker assisted selection in breeding leaf rust resistant wheat cultivars.

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Acknowledgments

We are grateful for a critical review of this manuscript by Prof. R.A. McIntosh, Plant Breeding Institute, University of Sydney, Australia. Thirty-six lines with known Lr genes were kindly provided by CIMMYT and the USDA-ARS Cereal Disease Laboratory, University of Minnesota. This work was supported by the National Natural Science Foundation of China (31361140367) and Natural Science Foundation of Hebei Province (C2014204113).

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    Authors and Affiliations

    1. Department of Plant Pathology, College of Plant Protection, Biological Control Center for Plant Diseases and Plant Pests of Hebei, Hebei Agricultural University, 289 Lingyusi Street, Baoding, 071001, Hebei, China

      Ai-yong Qi, Pei-pei Zhang, Zai-feng Li & Da-qun Liu

    2. Institute of Crop Science, National Wheat Improvement Center, Chinese Academy of Agricultural Sciences (CAAS), 12 Zhongguancun South Street, Beijing, 100081, China

      Xian-chun Xia & Zhong-hu He

    3. International Maize and Wheat Improvement Center (CIMMYT) China Office, c/o CAAS, 12 Zhongguancun South Street, Beijing, 100081, China

      Zhong-hu He

    4. Campo Experimental Valle de Mexico INIFAP, Apdo. Postal 10, 56230, Chapingo, Edo de Mexico, Mexico

      Julio Huerta-Espino

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    Correspondence to Zai-feng Li or Da-qun Liu.

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    Ai-yong Qi and Pei-pei Zhang have contributed equally to this work.

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    Qi, Ay., Zhang, Pp., Xia, Xc. et al. Molecular mapping and markers for leaf rust resistance gene Lr24 in CIMMYT wheat line 19HRWSN-122. Euphytica 206, 57–66 (2015). https://doi.org/10.1007/s10681-015-1469-1

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