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Opto-Mechatronic System for Sub-Micro Shape Inspection of Innovative Optical Components for Example of Head-Up-Displays

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Fringe 2005

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References

  1. Malacara, D. (1978) Optical shop testing. John Wiley & Sons, Inc.

    Google Scholar 

  2. Petz, M., Tutsch, R. (2004): Reflection grating photogramme try for the measurement of specular surfaces, tm-Technisches Messen 71: 389–397.

    Article  Google Scholar 

  3. Jäger, G., Manske, E., Hausotte, T., Büchner, H.J. (2000) Laserinterferometrische Nanomessmaschinen, VDI-Report 1530: 15–18.

    Google Scholar 

  4. Zänkert, J.: Verbundprojekt FINO — Flexible Prototypen-und reproduzierbare Serienfabrikation innovativer Optikelemente.

    Google Scholar 

  5. Osten, W., Andrä, P., Kayser, D. (1999) Highly-resolved measurement of extended technical surfaces with scalable topometry. tm-Technisches Messen 66,Heft 11: 413–428.

    Google Scholar 

  6. Andrä, P., Ivanov, E., Osten, W. (1997) Scaled topometry — an active measurement approach for wide scale 3d surface inspection. In: Jüptner, W, Osten, W (Eds.): Proc. Fringe’97, 3rd International Workshop, Akademie Verlag Berlin: 179–189.

    Google Scholar 

  7. Schamberger, H. (1999) Keep in touch. Feinwerktechnik & Messtechnik, Jahrg. 107/12: 43–45.

    Google Scholar 

  8. Osten, W. (2000) Application of optical shape measurement for the nondestructive evaluation of complex objects. Optical Engineering Vol. 39No. 1: 232–243.

    Article  Google Scholar 

  9. Andrä, P., Steinbichler, H., Maidhof, A., Lazar, M., Thoss, F. (2002) COMET VarioZoom — A novel sensor concept for flexible optical 3-D coordinate measurement. VDI-Report 1694: 285–292.

    Google Scholar 

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Author information

Authors and Affiliations

  1. LINOS Photonics GmbH & Co. KG, Isartalstraße 43, D-80469, München, Germany

    Peter Andrä, Hans Schamberger & Johann Zänkert

Authors
  1. Peter Andrä
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  2. Hans Schamberger
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  3. Johann Zänkert
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Editor information

Editors and Affiliations

  1. Institut für Technische Optik, Universität Stuttgart, Pfaffenwaldring 9, 70569, Stuttgart, Germany

    Wolfgang Osten

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© 2006 Springer-Verlag Berlin Heidelberg

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Andrä, P., Schamberger, H., Zänkert, J. (2006). Opto-Mechatronic System for Sub-Micro Shape Inspection of Innovative Optical Components for Example of Head-Up-Displays. In: Osten, W. (eds) Fringe 2005. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-29303-5_53

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  • DOI: https://doi.org/10.1007/3-540-29303-5_53

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-26037-0

  • Online ISBN: 978-3-540-29303-3

  • eBook Packages: EngineeringEngineering (R0)

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