Fringe 2005

The 5th International Workshop on Automatic Processing of Fringe Patterns

  • Wolfgang Osten

Table of contents

  1. Front Matter
    Pages I-XVIII
  2. Key Note

    1. R.S. Sirohi
      Pages 2-11
  3. New Methods and Tools for Data Processing

    1. Wei Wang, Zhihui Duan, Steen G. Hanson, Yoko Miyamoto, Mitsuo Takeda
      Pages 46-53
    2. C.A. Sciammarella, F.M. Sciammarella
      Pages 54-64
    3. René Dändliker
      Pages 65-73
    4. Jonathan M. Huntley, María F. Salfity, Pablo D. Ruiz, Martin J. Graves, Rhodri Cusack, Daniel A. Beauregard
      Pages 74-81
    5. Ribun Onodera, Yoshitaka Yamamoto, Yukihiro Ishii
      Pages 82-89
    6. J. A. Quiroga, D. Crespo, J. A. Gomez Pedrero, J. C. Martinez-Antón
      Pages 90-97
    7. C. Breluzeau, A. Bosseboeuf, S. Petitgrand
      Pages 98-106
    8. Tobias Haist, Marcus Reicherter, Avinash Burla, Lars Seifert, Mark Hollis, Wolfgang Osten
      Pages 126-133
    9. Yu Fu, Chenggen Quan, Cho Jui Tay, Hong Miao
      Pages 134-141
    10. Chandra Shakher, Saba Mirza, Vijay Raj Singh, Md. Mosarraf Hossain, Rajpal S Sirohi
      Pages 142-149
    11. Jan Liesener, Wolfgang Osten
      Pages 150-157
    12. Doloca Radu, Tutsch Rainer
      Pages 166-174

About these proceedings

Introduction

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields.

Topics of particular interest are:

Advanced Computer Aided Measurement Techniques;

Resolution Enhanced Technologies in Optical Metrology;

New approaches in Wide Scale 4D Optical Metrology;

Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems.

Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems.

 

Keywords

Data processing Enhanced Technologies Hybrid Measurement Technologies Measurement Systems New Optical Sensors Sensor Speckle Wide Scale 4D Optical Metrology data acquisition interferometry metrology

Editors and affiliations

  • Wolfgang Osten
    • 1
  1. 1.Institut für Technische OptikUniversität StuttgartStuttgartGermany

Bibliographic information

  • DOI https://doi.org/10.1007/3-540-29303-5
  • Copyright Information Springer-Verlag Berlin Heidelberg 2006
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Engineering
  • Print ISBN 978-3-540-26037-0
  • Online ISBN 978-3-540-29303-3
  • About this book