Abstract
Conventional TEM (CTEM) is referring to the basic TEM techniques, i.e., electron diffraction and imaging techniques such as bright-field (BF), dark-field (DF) and high-resolution TEM (HRTEM). These techniques, in general, provide morphology and structural analysis of the specimen material. CTEM has been used to distinguish the analytical TEM tools that appeared much later in the history of TEM, including scanning transmission electron microscopy (STEM), electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX) techniques. Analytical TEM techniques are sensitive to the chemical and electronic structures of the specimen, sometimes are capable in providing crystal structures as well. However, TEM techniques have been developing quickly in recent years and often utilize the advantages of both CTEM and analytical TEM. For example, electron diffraction techniques are considered to be CTEM. However, a newly developed technique, scanning electron nanodiffraction (SEND), has combined features of the CTEM and STEM by Tao et al. (Phys Rev Lett 103:097202, 2009). Using SEND, the variation of certain type of electronic structures can be mapped in real-space by Zuo and Tao (Scanning transmission electron microscopy: imaging and analysis. Springer, London, 2010). Moreover, some techniques that were never used in TEM have emerged and show interesting potential in a number of research areas. One of them is the secondary electron microscopy (SEM) installed in STEM, benefited from the development of the SEM detectors (Zhu et al. Nat Mater 8:808, 2009). The capability of atomic resolution EELS and EDX has exhibited a promising future that the chemical or electronic structures may be obtained simultaneously with the crystal structure. All the above accomplishments are suggesting that the difference between CTEM and analytical TEM could be diminishing in the fast development of the TEM techniques.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Aharanov, Y., Bohm, D.: Significance of electromagnetic potentials in the quantum theory. Phys. Rev. 115, 485 (1959)
Allen, L.J., McBride, W., O’Leary, N.L., Oxley, M.P.: Exit wave reconstruction at atomic resolution. Ultramicroscopy 100, 91 (2004)
Arruebo, M., Fernández-Pacheco, R., Ibarra, M.R., Santamaría, J.: Magnetic nanoparticles for drug delivery. Nanotoday 2, 22 (2007)
Asaka, T., Anan, Y., Nagai, T., Tsutsumi, S., Kuwahara, H., Kimoto, K., Tokura, Y., Matsui, Y.: Ferromagnetic domain structures and nanoclusters in Nd1/2Sr1/2MnO\(_3\). Phys. Rev. Lett. 89, 207203 (2002)
Asaka, T., Kimura, T., Nagai, T., Yu, X.Z., Kimoto, K., Tokura, Y., Matsui, Y.: Observation of magnetic ripple and nanowidth domains in a layered ferromagnet. Phys. Rev. Lett. 95, 227204 (2005)
Asaka, T., Nagao, M., Yokosawa, T., Kokui, K., Takayama-Muromachi, E., Kimoto, K., Fukuda, K., Matsui, Y.: Magnetocrystalline anisotropy behavior in the multiferroic BiMnO\(_3\) examined by Lorentz transmission electron microscopy. Appl. Phys. Lett 101, 052407 (2012)
Béché, A., Rouvière, J.L., Barnes, J.P., Cooper, D.: Dark field electron holography for strain measurement. Ultramicroscopy 111, 227 (2011)
Beleggia, M., Kasama, T., Dunin-Borkowski, R.E., Hofmann, S., Pozzi, G.: Direct measurement of the charge distribution along a biased carbon nanotube bundle using electron holography. Appl. Phys. Lett. 98, 243101 (2011)
Blumenau, A.T., Fall, C.J., Jones, R., Oberg, S., Fravenheim, T., Briddon, P.R.: Structure and motion of basal dislocations in silicon carbide. Phys. Rev. B. 68, 174108 (2003)
Bonevich, J.E., Harada, K., Matsuda, T., Kasai, H., Yoshida, T., Pozzi, G., Tonomura, A.: Electron holography observation of vortex lattice in a superconductor. Phys. Rev. Lett. 70, 2952 (1993)
Boothroyd, C.B.: Why don’t high-resolution simulations and images match? J. Microsc. 190, 99 (1998)
Boothroyd, C.B.: Quantification of high-resolution electron microscope images of amorphous carbon. Ultramicroscopy 83, 159 (2000)
Boothroyd, C.B., Dunin-Borkowski, R.E., Stobbs, W.M., Humphreys, C.J.: Quantifying the effects of amorphous layers on image contrast using energy filtered transmission electron microscopy beam-solid interact. Mater. Res. Soc. Symp. 354, 495 (1995)
Bourret, A., Desseaux, J., Renault, A.: Core structure of the lomer dislocation in germanium and silicon. Philos. Mag. A. 45, 1 (1982)
Bromwich, T.J., Kasama, T., Chong, R.K.K., Dunin-Borkowski, R.E., Petford-Long, A.K., Heinonen, O.G., Ross, C.A.: Remanent magnetic states and interactions in nano-pillars. Nanotechnology 17, 4367 (2006)
Burger, W.: Phys. Status Solidi. 4, 713 (1971a)
Burger, W.: Phys. Status Solidi. 4, 723 (1971b)
Burger, W.: Phys. Status Solidi. 13, 429 (1972)
Buxton, B.F., Eades, J.A., Steeds, J.W., Rackham, G.M.: The symmetry of electron diffraction zone axis patterns. Philos. Trans. R. Soc. Lond. Ser. A Math. Phys. Eng. Sci. 281, 171 (1976)
Cai, J., Ponce, F.A.: Study of charge distribution across interfaces in GaN/InGaN/GaN single quantum wells using electron holography. J. Appl. Phys. 91, 9856 (2002)
Chapman, J.N.: The investigation of magnetic domain structures in thin foils by electron microscopy. J. Phys. D 17, 623 (1984)
Chapman, J.N.: High resolution imaging of magnetic structures in the transmission electron microscope. Mater. Sci. Eng. B 3, 355 (1989)
Chapman, J.N., Morrison, G.R.: J. Magn. Magn. Mater. 35, 254 (1983)
Chapman, J.N., Rogers, D.J., Bernards, J.E.C.: High resolution imaging of magnetic structures in the transmission electron microscope. J. Phys. Paris Colloq. C8(Suppl. 12), 49 (1965)
Chapman, J.N., Morrison, G.R., Jakubovics, J.P., Taylor, R.A.: In: Doig, P. (eds.) Investigation of Micromagnetic Structures by STEM Electron Microscopy and Analysis, IOP Conference Series, vol. 1984, no. 68, p. 197 (1983)
Chapman, J.N., et al.: Proceeding of the Iop Conference Electron. Microscopy and Analysis 1983(68), 197–200 (1984)
Chapman, J.N., Morrison, G.R., Jakubovics, J.P., Taylor, R.A.: Determination of domain wall structures in thin foils of a soft magnetic alloy. J. Magn. Magn. Mater. 49, 277 (1985)
Chapman, J.N., McFadyen, I.R., Bernards, J.P.C.: Investigation of Cr segregation within rf-sputtered CoCr films. J. Magn. Magn. Mater. 62, 359 (1986)
Chapman, J.N., McVitie, S., McFadyen, I.R.: In: Kirschner, J., Murata, K., Venables, J.A. (eds.) Scanning Microscopy Supplement 1, p. 221. AMF O’Hare, Chicago (1987)
Chapman, J.N., McFadyen, I.R., McVitie, S.: Modified differential phase contrast Lorentz microscopy for improved imaging of magnetic structures. IEEE Trans. Magn. 26, 1506 (1990)
Chapman, J.N., Ferrier, R.P., Heyderman, L.J., McVitie, S., Nicholson, W.A.P., Bormans, B.: Micromagnetics, microstructure and microscopy. In: Proceedings of the Institute of Physics Electron and Analysis Group Conference, Electron Microscopy and Analysis 1993, pp. 1–8 (1993)
Chapman, J.N., Johnston, A.B., Heyderman, L.J., McVitie, S., Nicholson, W.A.P., Bormans, B.: Coherent magnetic imaging by TEM. IEEE Trans. Magn. 30, 4479 (1994)
Chapman, J.N., Heyderman, L.J., McVitie, S., Nicholson, W.A.P.: In: Bando, Y., Kamo, M., Haneda, H., Aizaw, T. (eds.) Proceedings of the 2nd International Symposium on Advanced Materials (ISAM’95), p. 123 (1995)
Chapman, J.N., Scheinfein, M.R.: Transmission electron microscopies of magnetic microstructures. J. Magn. Magn. Mater. 200, 729 (1999)
Charudatta, P., et al.: phys. Rev. Lett. 104, 253901 (2010)
Che, R.C., Takeguchi, M., Shimojo, M., Zhang, W., Furuya, K.: Fabrication and electron holography characterization of FePt alloy nanorods. Appl. Phys. Lett. 87, 223109 (2005)
Chen, J.H., Costan, E., van Huis, M.A., Xu, Q., Zandbergen, H.W.: Atomic pillar-based nanoprecipitates strengthen AlMgSi alloys. Science 312, 416 (2006)
Cherns, D., Barnard, J., Ponce, F.A.: Measurement of the piezoelectric field across strained InGaN/GaN layers by electron holography. Solid State Commun. 111, 281 (1999)
Chou, L.J., Chang, M.T., Chueh, Y.L., Kim, J.J., Park, H.S., Shindo, D.: Electron holography for improved measurement of microfields in nanoelectrode assemblies. Appl. Phys. Lett. 89, 023112 (2006)
Chung, S., Johnson, S.R., Ding, D., Zhang, Y.H., Smith, D.J., McCartney, M.R.: Quantitative analysis of dopant distribution and activation across p-n junctions in AlGaAs/GaAs light-emitting diodes using off-axis electron holography. IEEE Trans. Electron Dev. 56, 1919 (2009)
Chung, S., Johnson, S.R., Ding, D., Zhang, Y.H., Smith, D.J., McCartney, M.R.: Quantitative dopant profiling of p-n junction in InGaAs/AlGaAs light-emitting diode using off-axis electron holography. J. Vac. Sci. Technol. B 28, C1D11 (2010)
Chung, S., Berechman, R.A., McCartney, M.R., Skowronski, M.: Electronic structure analysis of threading screw dislocations in 4H-SiC using electron holography. J. Appl. Phys. 109, 034906 (2011)
Coene, W., Janssen, G., Debeeck, M.O., Vandyck, D.: Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron-microscopy. Phys. Rev. Lett. 69, 3743 (1992)
Coene, W.M.J., Thust, A., de Beeck, M., VanDyck, D.: Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 64, 109 (1996)
Cooper, D., Truche, R., Rivallin, P., Hartmann, J.M., Laugier, F., Bertin, F., Chabli, A., Rouviere, J.L.: Medium resolution off-axis electron holography with millivolt sensitivity. Appl. Phys. Lett. 91, 143501 (2007)
Cooper, D., Barnes, J.P., Hartmann, J.M., Béché, A., Rouvière, J.L.: Dark field electron holography for quantitative strain measurements with nanometer-scale spatial resolution. Appl. Phys. Lett. 95, 053501 (2009)
Cooper, D., Béché, A., Hartmann, J.M., Carron, V., Rouvière, J.L.: Strain evolution during the silicidation of nanometer-scale SiGe semiconductor devices studied by dark field electron holography. Appl. Phys. Lett. 96, 113508 (2010a)
Cooper, D., Béché, A., Hartmann, J.M., Carron, V., Rouvière, J.L.: Strain mapping for the semiconductor industry by dark-field electron holography and nanobeam electron diffraction with nm resolution. Semicond. Sci. Technol. 25, 095012 (2010b)
Cowley, J.M.: Twenty forms of electron holography. Ultramicroscopy 41, 335 (1992)
Cowley, J.M.: Diffraction Physics, 3rd edn. North-Holland Personal Library, Amsterdam (1995)
Cowley, J.M., Moodie, A.F.: The scattering of electrons by atoms and crystals. I. A new theoretical approach. Acta Cryst. 10, 609 (1957a)
Cowley, J.M., Moodie, A.: Fourier images: I-the point source. Proc. Phys. Soc. B 70, 486 (1957b)
Cowley, J.M., Moodie, A.: Fourier images IV: the phase grating. Proc. Phys. Soc. 76, 378 (1960)
Cui, Y.R., Liu, H., Shi, Y., Li, X.M., Ma, H.Z.: Improvement of annealed method to enhance magnetic properties of lJ85 alloys. Foundry Technol. 26, 1145 (2005)
Cumings, J., Zettl, A., McCartney, M.R., Spence, J.C.H.: Electron holography of field-emitting carbon nanotubes. Phys. Rev. Lett. 88, 056804 (2002)
Daberkow, I., Herrmann, K.H., Liu, L.B., Rau, W.D.: Performance of electron image converters with yag single-crystal screen and ccd sensor. Ultramicroscopy 38, 215 (1991)
Dagotto, E.: Complexity in strongly correlated electronic systems. Science 309, 257 (2005)
de Beeck, M.O., Van Dyck, D., Coene, W.: Wave function reconstruction in HRTEM: the parabola method. Ultramicroscopy 64, 167 (1996)
De Wolff, P.M.: Pseudo-symmetry of modulated crystal-structures. Acta Cryst. A A30, 777 (1974)
De Wolff, P.M., Janssen, T., Janner, A.: The superspace groups for incommensurate crystal structures with a one-dimensional modulation. Acta Cryst. A A37, 625 (1981)
Debaerdemaeker, T., Tate, C., Woolfson, M.M.: On the application of phase relationships to complex structures. XXIV. The Sayre tangent formula. Acta Crystallogr. A A41, 286 (1985)
Deguchi, M., Tanaka, S., Tanji, T.: Determination of piezoelectric fields across InGaN/GaN quantum wells by means of electron holography. J. Electron. Mater. 39, 815 (2010)
Dekkers, N.H., de Lang, H.: Differential phase contrast in a STEM. Optik 41, 452 (1974)
den Hertog, M.I., Schmid, H., Cooper, D., Rouviere, J.L., Björk, M.T., Riel, H., Rivallin, P., Karg, S., Riess, W.: Mapping active dopants in single silicon nanowires using off-axis electron holography. Nano Lett. 9, 3837 (2009)
den Hertog, M.I., Rouviere, J.L., Schmid, H., Cooper, D., Björk, M.T., Riel, H., Dhalluin, F., Gentile, P., Ferret, P., Oehler, F., Baron, T., Rivallin, P., Karg, S., Riess, W.: Off axis holography of doped and intrinsic silico nanowires: interpretation and influence of fields in the vacuum. J. Phys. Conf. Ser. 209, 012027 (2010)
Dong, W., Baird, T., Fryer, J.R., Gilmore, C.J., Macnicol, D.D., Bricogne, G., Smith, D.J.: O’keefe, M.A., Hövmoller, S.: Electron microscopy at 1-Å resolution by entropy maximization and likelihood ranking. Nature 355, 605 (1992)
Dorset, D.L.: The accurate electron crystallographic refinement of organic structures containing heavy atoms. Acta Cryst. A 53, 356 (1997)
Dorset, D.L., Hauptman, H.A.: Direct phase determination for quasi-kinematical electron-diffraction intensity data from organic microcrystals. Ultramicroscopy 1, 195–201 (1976)
Du, K., Phillipp, F.: On the accuracy of lattice-distortion analysis directly from high-resolution transmission electron micrographs. J. Microsc. 221, 63 (2006)
Du, K., von Hochmeister, K., Phillipp, F.: Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs. Ultramicroscopy 107, 281 (2007)
Duan, X.F., Gao, M., Poeng, L.M.: Accurate measurement of phase shift in electron holography. Appl. Phys. Lett. 72, 771 (1998)
Dunin-Borkowski, R.E., McCartney, M.R., Frankel, R.B., Bazylinski, D.A., Posfai, M., Buseck, P.R.: Magnetic microstructure of magnetotactic bacteria by electron holography. Science 282, 1868 (1998a)
Dunin-Borkowski, R.E., McCartney, M.R., Kardynal, B., Smith, D.J.: Magnetic interactions within patterned cobalt nanostructures using off-axis electron holography. J. Appl. Phys. 84, 374 (1998b)
Dunin-Borkowski, R.E., McCartney, M.R., Posfai, M., Frankel, R.B., Bazylinski, D.A., Buseck, P.R.: Off-axis electron holography of magnetotactic bacteria: magnetic microstructure of strains MV-1 and MS-1. Eur. J. Mineral. 13, 671 (2001)
Egerton, R.F.: Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd edn. Springer Science+Business Media, New York (2011)
Fan, H.F., et al.: Acta Crystallogr. A 41, 163 (1985)
Formanek, P., Kittler, M.: Application of electron holography to extended defects: Schottky barriers at NiSi\(_2\) precipitates in silicon. Phys. Stat. Sol. C 2, 1878 (2005)
Frank, J.: Optik 41, 90 (1974)
Fu, Z.Q., Fan, H.F.: DIMS-a direct-method program for incommensurate modulated structures. J. Appl. Crystallogr. 27, 124 (1994)
Fu, Z.Q., Huang, D.X., Li, F.H., Li, J.Q., Zhao, Z.X., Cheng, T.Z., Fan, H.F.: Incommensurate modulation in minute crystals revealed by combining high-resolution electron microscopy and electron diffraction. Ultramicroscopy 54, 229 (1994)
Fujita, T., Chen, M.: Quantitative electron holographic tomography for a spherical object. J. Electron Microsc. 58, 301 (2009)
Fujita, T., Yamamoto, K., McCartney, M.R., Smith, D.J.: Reconstruction technique for off-axis electron holography using coarse fringes. Ultramicroscopy 106, 486 (2006)
Fujita, T., Chen, M., Wang, X., Xu, B., Inoke, K., Yamamoto, K.: J. Appl. Phys. 101, 014323 (2007)
Fukumura, T., Sugawara, H., Hasegawa, T., Tanaka, K., Sakaki, H., Kimura, T., Tokura, Y.: Spontaneous bubble domain formation in a layered ferromagnetic crystal. Science 284, 1969 (1999)
Gajdardziska-Josifovska, M.: Off-axis electron holography of hetero-inter-faces. Interf. Sci. 2, 425 (1995)
Gajdardziska-Josifovska, M., Carim, A.H.: Applications of electron holography. In: Völkl, E., Allard, L.F., Joy, D.C. (eds.) Introduction to Electron Holography. Kluwer Academic/Plenum Publishers, New York, p. 267 (1999)
Ge, B.H., Wang, Y.M., Li, X.M., Li, F.H., Song, H.L., Zhang, H.J.: A study of an incommensurately modulated structure in Ca\(_{0.28}\)Ba\(_{0.72}\)Nb\(_2\)O\(_6\) by electron microscopy. Philos. Mag. Lett. 88, 213 (2008)
Gerchberg, R.W., Saxton, W.O.: Phase determination from image and diffraction plane pictures in the electron-microscope. Optik 34, 277 (1971)
Ghiglia, D.C., Pritt, M.D.: Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software. Wiley-Interscience Publication (1998)
Goodenough, J.B.: On the influence of 3d4 ions on the magnetic and crystallographic properties of magnetic oxides. J. Phys. Radium 20, 155 (1959)
Goodman, P.: A practical method of three-dimensional space-group analysis using convergent-beam electron diffraction. Acta Crystallogr. Sect. A A31, 804 (1975)
Goodman, P., Lehmpfuh, G.: Zeitschrift Fur Naturforschung Part a-Astrophysik Physik Und Physikalische Chemie A, vol. 20 (1965)
Gupta, A., Gong, G.Q., Xiao, G., Duncombe, P.R., Lecoeur, P., Trouilloud, P., Wang, Y.Y., Dravid, V.P., Sun, J.Z.: Grain-boundary effects on the magnetoresistance properties of perovskite manganite films. Phys. Rev. B. 54, R15629 (1996)
Gribelyuk, M.A., Domenicucci, A., Ronsheim, G.P.A., McMurray, J.S., Gluschenkov, O.: Application of electron holography to analysis of submicron structure. J. Vac. Sci. Technol. B 26, 408 (2008)
Gribelyuk, M.A., Adam, T.N., Ontalus, V., Ronsheim, P.R., Kimball, L., Schonenberg, K.T.: Electron holography of Si: C films and Si:C-based devices. J. Appl. Phys. 110, 063522 (2011)
Haider, M., Braunshausen, G., Schwan, E.: Correction of the spherical-aberration of a 200-kv tem by means of a hexapole-corrector. Optik 99, 167 (1995)
Haider, M., Rose, H., Uhlemann, S., Schwan, E., Kabius, B., Urban, K.: A spherical-aberration-corrected 200 kV transmission electron microscope. Ultramicroscopy 75, 53 (1998a)
Haider, M., Uhlemann, S., Schwan, E., Rose, H., Kabius, B., Urban, K.: Electron microscopy image enhanced. Nature 392, 768 (1998b)
Haine, M.E., Mulvey, T.: The formation of diffraction image with electrons in the Gabor diffraction microscope. J. Opt. Soc. Am. 42, 763 (1951)
Hale, M.E., Fuller, H.W., Rubinstein, H.: Magnetic domain observations by electron microscopy. J. Appl. Phys. 30, 789 (1959)
Han, F.S., Fan, H.F., Li, F.H.: Image processing in high-resolution electron microscopy using the direct method II. Image deconvolution. Acta Cryst. A 42, 353 (1986)
Hao, Q., Liu, Y.W., Fan, H.F.: Direct methods in superspace. I. Preliminary theory and test on the determination of incommensurate modulated structures. Acta Cryst. A 43, 820 (1987)
Harada, K., Tonomura, A., Togawa, Y., Akashi, T., Matsuda, T.: Double-biprism electron interferometry. Appl. Phys. Lett. 84, 3229 (2004)
Harada, K., Akashi, T., Togawa, Y., Matsuda, T., Tonomura, A.: Optical system for double-biprism electron holography. J. Electron Microsc. 54, 19 (2005)
Harada, K., Matsuda, T., Tonomura, A., Akashi, T., Togawa, Y.: Triple-biprism electron interferometry. J. Appl. Phys. 99, 113502 (2006)
Harrison, C.G., Leaver, K.D.: The analysis of two-dimensional domain wall structures by Lorentz microscopy. Phys. Status Solidi. A 15, 415 (1973)
Haun, J.B., Yoon, T.J., Lee, H., Weissleder, R.: Magnetic nanoparticle biosensors. Wiley Interdiscip. Rev. Nanomed. Nanobiotechnol. 2, 291 (2010)
He, W.Z., Li, F.H., Chen, H., Kawasaki, K., Oikawa, T.: Image deconvolution for defected crystals in field-emission high-resolution electron microscopy. Ultramicroscopy 70, 1 (1997)
He, J.Q., Volkov, V.V., Asaka, T., Chaudhuri, S., Budhani, R.C., Zhu, Y.: Competing two-phase coexistence in doped manganites: direct observations by in situ Lorentz electron microscopy. Phys. Rev. B. 82, 224404 (2010)
Hefferman, S.J., Chapman, J.N., McVitie, S.: In-situ magnetising experiments on small regular particles fabricated by electron beam lithography. J. Magn. Magn. Mater. 83, 223–224 (1990)
Hirsh, P.B., Howie, A., Nicholson, R.B., Pashley, D.W., Whelan, M.J.: Electron Microscopy of Thin Crystals, p. 292. Butterworths, London (1965)
Hitachi Technical Data EM Sheet No. 47
Holt, D.B.: Grain boundaries in sphalerite structure. J. Phys. Chem. Solids 25, 1385 (1964)
Horiuch, S., Cantoni, M., Tsuruta, T., Matsui, Y.: Direct observation of the interaction between a vortex lattice and dislocations in a superconducting Nb crystal. Appl. Phys. Lett. 31, 1293 (1998)
Hovmöller, S.: CRISP: crystallographic image processing on a personal computer. Ultramicroscopy 41, 121 (1992)
Hovmöller, S., Sjogren, A., Farrants, G., Sundberg, M., Marinder, B.: Accurate atomic positions from electron-microscopy. Nature. Syst. 311, 238 (1984)
Howie, A.: Hunting the Stobbs factor. Ultramicroscopy 98, 73 (2004)
Hsieh, W.K., Chen, F.R., Kai, J.J., Kirkland, A.I.: Resolution extension and exit wave reconstruction in complex HREM. Ultramicroscopy 98, 99 (2004)
Hu, J.J., Li, F.H.: Maximum entropy image deconvolution in high resolution electron microscopy. Ultramicroscopy 35, 339 (1991)
Hu, J.J., Li, F.H., Fan, H.F.: Crystal-structure determination of K\(_2\)O. 7. Nb\(_2\)O\(_5\) by combining high-resolution electron-microscopy and electron-diffraction. Ultramicroscopy 41, 387 (1992)
Huang, D.X., He, W.Z., Li, F.H.: Multiple solution in maximum entropy deconvolution of high resolution electron microscope images. Ultramicroscopy 62, 141 (1996a)
Huang, D.X., Liu, W., Gu, Y.X., Xiong, J.W., Fan, H.F., Li, F.H.: A method of electron diffraction intensity correction in combination with high-resolution electron microscopy. Acta Cryst. A 52, 152 (1996b)
Huang, S.X., Chien, C.L.: Extended Skyrmion phase in epitaxial FeGe (111) thin films. Phys. Rev. Lett. 108, 267201 (2012)
Huber Jr., E.E., Smith, D.O., Goodenough, J.B.: Domain-wall structure in Permalloy films. J. Appl. Phys. 29, 294 (1958)
Hüe, F., Hÿtch, M., Houdellier, F., Bender, H., Claverie, A.: Strain mapping of tensiley strained silicon transistors with embedded Si1-yCy source and drain by dark-field holography. Appl. Phys. Lett. 95, 073103 (2009)
Humphreys, C.J., Spence, J.C.H.: Resolution and illumination coherence in electron-microscopy. Optik 58, 125 (1981)
Hÿtch, M.J., Stobbs, W.M.: Quantitative comparison of high resolution TEM images with image simulations. Ultramicroscopy 53, 191 (1994)
Hÿtch, M.J., Dunin-Borkowski, R.E., Scheinfein, M.R., Moulin, J., Duhamel, C., Mazaleyrat, F., Champion, Y.: Vortex flux channeling in magnetic nanoparticle chains. Phys. Rev. Lett. 91, 257207 (2003)
Hÿtch, M., Houdellier, F., Hüe, F., Snoeck, E.: Nanoscale holographic interferometry for strain measurements in electronic devices. Nature 453, 1086 (2008)
Hÿtch, M., Houdellier, F., Hüe, F., Snoeck, E.: Dark-field electron holography for the measurement of geometric phase. Ultramicroscopy 111, 1328 (2011)
Ikarashi, N., Oshida, M., Miyamura, M., Saitoh, M., Mineji, A., Shishiguchi, S.: Electron holography characterization of ultra-shallow junctions in 30-nm-gate-length metal-oxide-semiconductor field-effect transistors. Jpn. J. Appl. Phys. 47, 2365 (2008)
Ikarashi, N., Toda, A., Uejima, K., Yako, K., Yamamoto, T., Hane, M.: Electron holography for analysis of deep Submicro devicesipresent status and challenges I. Vac. Sci. Technol. B 28, CID5 (2010)
Ikeda, M., Sugawara, A., Harada, K.: Twin-electron biprism. J. Electron Microsc. 60, 353 (2011)
Inoue, M., Tomita, T., Naruse, M., Akase, Z., Murakami, Y., Shindo, D.: Development of a magnetizing stage for in situ observations with electron holography and Lorentz microscopy. J. Electr. Micros. 54, 509 (2005)
Ishizuka, K., Miyazaki, M., Uyeda, N.: Improvement of electron microscope images by the direct phasing method. Acta Crystallogr. A 38, 408 (1982)
Janssen, T., Janner, A., Looijenga-vos, A., Wolff, P.M.D.: International Tables for Crystallography, vol. C. Kluwer Academic Publishers, Dordrecht (2006)
Javon, E., Gatel, C., Masseboeuf, A., Snoeck, E.: Electron holography study of the local magnetic switching process in magnetic tunnel junctions. J. Appl. Phys. 107, 093D310 (2010)
Jaynes, E.T.: Information theory and statistical mechanics. Phys. Rev. 106, 620 (1957)
Jia, C.L., Thust, A.: Investigation of atomic displacements at a Sigma 3 \(\{111\}\) twin boundary in BaTiO(3) by means of phase-retrieval electron microscopy. Phys. Rev. Lett. 82, 5052 (1999)
Jia, C.L., Urban, K.: Atomic-resolution measurement of oxygen concentration in oxide materials. Science 303, 2001 (2004)
Jia, C.L., Lentzen, M., Urban, K.: Atomic-resolution imaging of oxygen in perovskite ceramics. Science 299, 870 (2003)
Jiang, H., Li, F.H., Mao, Z.Q.: Electron crystallographic study of Bi2(Sr 0.9 La 0.1) 2CoOy. Micron 30, 417 (1999)
Johnson, K.D., Dravid, V.P.: Direct evidence for grain boundary potential barrier breakdown via in situ electron holography. Microsc. Microanal. 5, 428 (1999a)
Johnson, K.D., Dravid, V.P.: Grain boundary barrier breakdown in niobium donor doped strontium titanate using in situ electron holography. Appl. Phys. Lett. 74, 621 (1999b)
Johnston, A.B., Chapman, J.N.: The development of coherent Foucault imaging to investigate magnetic microstructure. J. Microsc. 179, 119 (1995)
Jourdain, V., Simpson, E.T., Paillet, M., Kasama, T., Dunin-Borkowski, R.E., Poncharal, P., Zahab, A., Loiseau, A., Robertson, J., Bernier, P.: Periodic inclusion of room-temperature-ferromagnetic metal phosphide nanoparticles in carbon nanotubes. J. Phys. Chem. B 110, 9759 (2006)
Junginger, F., Kläui, M., Backes, D., Rüdiger, U., Kasama, T., Dunin-Borkowski, R.E., Heyderman, L.J., Vaz, C.A.F., Bland, J.A.C.: Spin torque and heating effects in current-induced domain wall motion probed by transmission electron microscopy. Appl. Phys. Lett. 90, 132506 (2007)
Kambe, K.: Study of simultaneous reflexion in electron diffraction by crystals I. Theoretical treatment. J. Phys. Soc. Jpn. 12, 13 (1957)
Karle, J., Hauptman, H.: A theory of phase determination for the 4 types of non-centrosymmetric space groups 1P222, 2P22, 3P12, 3P22. Acta Crystallogr. 9, 635 (1956)
Kasama, T., Barpanda, P., Dunin-Borkowski, R.E., Newcomb, S.B., McCartney, M.R., Castaño, F.J., Ross, C.A.: Off-axis electron holography of individual pseudo-spin-valve thin film magnetic elements. J. Appl. Phys. 98, 013903 (2005)
Kasahara, T., Shindo, D., Yoshikawa, H., Sato, T., Kondo, K.: In situ observations of domain structures and magnetic flux distributions in Mn-Zn and Ni-Zn ferrites by Lorentz microscopy and electron holography. J. Electron. Microsc. 56, 7 (2007)
Kasama, T., Dunin-Borkowski, R.E., Scheinfein, M.R., Tripp, S.L., Liu, J., Wei, A.: Reversal of flux closure states in cobalt nanoparticle rings with coaxial magnetic pulses. Adv. Mater. 20, 4248 (2008)
Kasama, T., Church, N.S., Feinberg, J.M., Dunin-Borkowski, R.E., Harrison, R.J.: Direct observation of ferrimagnetic/ferroelastic domain interactions in magnetite below the Verwey transition. Earth Plane. Sci. Lett. 297, 10 (2010)
Kasama, T., Dunin-Borkowski, R.E., Beleggia, M.: Electron Holography of Magnetic Materials, in Holography-Different Fields of Application. ed. F. A. M. Ramírez, InTech, 53 (2011)
Kauffmann, Y., Recnik, A., Kaplan, W.D.: The accuracy of quantitative image matching for HRTEM applications. Mater. Charact. 54, 194 (2005)
Kienzle, O., Ernst, F., Mobus, G.: Reliability of atom column positions in a ternary system determined by quantitative high-resolution transmission electron microscopy. J. Microsc. 190, 144 (1998)
Kim, J.J., Shindo, D., Murakami, Y., Xia, W., Chou, L.J., Chueh, Y.L.: Direct observation of field emission in a single TaSi\(_2\) nanowire. Nano Lett. 7, 2243 (2007)
Kirkland, E.J.: Improved high resolution image processing of bright field electron micrographs. I. Theory. Ultramicroscopy 15, 151 (1984)
Kirkland, E.J., Siegel, B.M., Uyeda, N., Fujiyoshi, Y.: Improved high-resolution image-processing of bright field electron-micrographs. II. Experiment. Ultramicroscopy 17, 87 (1985)
Kirkland, E.J., Loane, R.F., Silcox, J.: Simulation of annular dark field stem images using a modified multislice method. Ultramicroscopy 23, 77 (1987)
Kohno, H., Yoshida, H., Ohno, Y., Ichikawa, S., Akita, T., Tanaka, K., Takeda, S.: Formation of silicon/silicide/oxide nanochains and their properties studied by electron holography. Thin Solid Films 204, 464 (2004)
Kossel, W., Mollenstedt, G.: Elektroneninterferenzen im konvergenten Bündel. Annalen der Physik 428, 113 (1939)
Koyama, T., Togawa, Y., Takenaka, K., Mori, S.: Ferromagnetic microstructures in the ferromagnetic metallic phase of La\(_{0.825}\)Sr\(_{0.175}\)MnO\(_{3}\). J. Appl. Phys. 111, 07B104 (2012)
Krivanek, O.L.: Method for determining coefficient of spherical aberration from a single electron micrograph. Optik 45, 97 (1976)
Kruse, P., Rosenauer, A., Gerthsen, D.: Determination of the mean inner potential in III-V semiconductors by electron holography. Ultramicroscopy 96, 11 (2003)
Kübel, C., Thust, A.: True Image—A Software Package for Focal-Series Reconstruction in HRTEM. FEI Company (2003)
Lau, J.W., Schofield, M.A., Zhu, Y.: A straightforward specimen holder modification for remnant magnetic-field measurement in TEM. Ultramicroscopy 107, 396 (2007)
Lee, M., Kang, W., Onose, Y., Tokura, Y., Ong, N.P.: Unusual hall effect anomaly in MnSi under pressure. Phys. Rev. Lett. 102, 186601 (2009)
Lehmann, M., Lichte, H.: Is there a Stobbs-factor in off-axis electron holography? Microsc. Microanal. 9, 46 (2003)
Lehmann, M., Lichte, H.: Electron holographic material and analysis at atomic dimensions. Cryst. Res. Technol. 40, 149 (2005)
Leith, E.N., Upatnieks, J.: Reconstructed wavefronts and communication theory. J. Opt. Soc. Am. 52, 1123 (1962)
Li, F.H.: Determination of crystal structures by high resolution electron microscopy. Acta Phys. Sin. 26, 193 (1977, in Chinese)
Li, F.H.: Developing image-contrast theory and analysis methods in high-resolution electron microscopy. Phys. Status Solidi A. 207, 2639 (2010)
Li, F.H., Fan, H.F.: Acta Phys. Sin. 28, 276 (1979). (in Chinese)
Li, F.H., Hashimoto, H.: Use of dynamical scattering in the structure determination of a minute fluorocarbonate mineral cebaite Ba\(_{3}\)Ce\(_{2}\) (CO\(_3\))\(_5\)F\(_2\) by high-resolution electron microscopy. Acta Crystallogr. B. 40, 454 (1984)
Li, F.H., Tang, D.: Pseudo-weak-phase-object approximation in high-resolution electron microscopy. I. Theory. Acta Crystallogr. A. 41, 376 (1985)
Li, F.H., Wang, D., He, W.Z., Jiang, H.: Amplitude correction in image deconvolution for determining crystal defects at atomic level. J. Electron Microsc. 49, 17 (2000)
Li, J.C.: Southern Iron and Steel 116, 7 (2000)
Li, L., Ketharanathan, S., Drucker, J., McCartney, M.: Study of hole accumulation in individual germanium quantum dots in p-type silicon by off-axis electron holography. Appl. Phys. Lett. 94, 232108 (2009)
Li, L., Smith, D.J., Dailey, E., Madras, P., Drucker, J., McCartney, M.R.: Observation of hole accumulation in Ge/Si core/shell nanowires using off-axis electron holography. Nano Lett. 11, 493 (2011)
Lichte, H.: Optimum focus for taking electron holograms. Ultramicroscopy 38, 13 (1991)
Lichte, H., Lehmann, M.: Electron holography-basics and applications. Rep. Prog. Phys. 71, 016102 (2008)
Lichte, H., Geiger, D., Linck, M.: Off-axis electron holography in an aberration-corrected transmission electron microscopy. Phil. Trans. R. Soc. A 367, 3773 (2009)
Lichte, H., Reibold, M., Brand, K., Lehmanm, M.: Ferroelectric electron holography. Ultramicroscopy 93, 199 (2018)
Lin, F., Chen, Q., Peng, L.M.: REW-exit-wave reconstruction and alignments for focus-variation high-resolution transmission electron microscopy images. J. Appl. Crystallogr. 40, 614 (2007)
Liu, H.H., Duan, X.K., Che, R.C., Wang, Z.F., Duan, X.F.: In situ- investigation of the magnetic domain wall in Permalloy thin film by Lorentz electron microscopy. Mater. Lett. 62, 2654 (2008)
Liu, H.H., Duan, X.K., Che, R.C., Wang, Z.F., Duan, X.F.: Measurement of the remnant magnetic-field in Lorentz mode using permalloy. Acta Metall. Sin. 22, 435 (2009a)
Liu, H.H., Duan, X.K., Che, R.C., Wang, Z.F., Duan, X.F.: In situ lorentz microscopy observation of displaced chain walls in permalloy. Mater. Trans. 50, 1660 (2009b)
Liu, H.R., Wang, Y.G., Liu, Q.X., Yang, Q.B.: A study of the potential barrier at the \(\Sigma \)13(510) tilt boundary of strontium titanate using electron holography and dynamic simulation. J. Phys. D Appl. Phys. 37, 1478 (2004)
Liu, J., Li, F.H., Wan, Z.H., Fan, H.F., Wu, X.J., Tamura, T., Tanabe, K.: Incommensurate modulated structure of "Pb"-1223 determined by combining high resolution electron microscopy and electron diffraction. Mater. Trans. JIM 39, 920 (1998)
Liu, J., Li, F.H., Wan, Z.H., Fan, H.F., Wu, X.J., Tamura, T., Tanabe, K.: Electron crystallographic image-processing investigation and superstructure determination for (Pb\(_{0.5}\)Sr\(_{0.3}\)Cu\(_{0.2})\)Sr\(_{2}\)(Ca\(_{0.6}\)Sr\(_{0.4})\)Cu\(_{2}\)Oy. Acta Cryst. A. 57, 540 (2001)
Liu, L.Z.Y., Rao, D.V.S., Kappers, M.J., Humphreys, C.J., Geiger, D.: Basal-plane stacking faults in non-polar GaN studied by off-axis electron holography. J. Phys. Conf. Ser. 209, 012012 (2010)
Liu, W., Wang, N., Wang, R.M., Kumar, S., Duesberg, G.S., Zhang, H.Z., Sun, K.: Atom-resolved evidence of anisotropic growth in ZnS nanotetrapods. Nano Lett. 11, 2983 (2011)
Loudon, J.C., Mathur, N.D., Midgley, P.A.: Charge-ordered ferromagnetic phase in La\(_{0.5}\)Ca\(_{0.5}\)MnO\(_{3}\). Nature 420, 797 (2018)
Lu, B., Li, F.H., Wan, Z.H., Fan, H.F., Mao, Z.Q.: Electron crystallographic Study of Bi4(Sr0.75La0.25)8Cu5Oy structure. Ultramicroscopy 70, 13 (1997a)
Lu, Q., Chen, C.C., de Loznne, A.: Observation of magnetic domain behavior in colossal magnetoresistive materials with a magnetic force microscope. Science 276, 2006 (1997b)
Marino, F.A., Cullen, D.A., Smith, D.J., McCartney, M.R., Saraniti, M.: Simulation of polarization charge on AlGaN/GaN high electron mobility transistors: comparison to electron holography. J. Appl. Phys. 107, 054516 (2010)
Marshall, A.F., Klein, L., Dodge, J.S., Ahn, C.H., Reiner, J.W., Mieville, L., Antagonazza, L., Kapitulnik, A., Geballe, T.H., Beasley, M.R.: Lorentz transmission electron microscope study of ferromagnetic domain walls in SrRuO\(_3\): Statics, dynamics, and crystal structure correlation. J. Appl. Phys. 85, 4131 (1999)
Matsuda, T., Tonomura, A., Suzuki, R., Endo, J., Osakabe, N., Umezaki, H., Tanabe, H., Sugita, Y., Fujiwara, H.: Observation of microscopic distribution of magnetic field by electron holography. J. Appl. Phys. 53, 544 (1982)
Matsuda, T., Hasegawa, S., Igarashi, M., Kobayashi, T., Naito, M., Kajiyama, H., Endo, J., Osakabe, N., Tonomura, A., Aoki, R.: Magnetic field observation of a single flux quantum by electron-holographic interferometry. Phys. Rev. Lett. 62, 2519 (1989)
Matsuda, T., Fukuhara, A., Yoshida, T., Hasegawa, S., Tonomura, A., Ru, Q.: Computer reconstruction from electron holograms and observation of fluxon dynamics. Phys. Rev. Lett. 66, 457 (1991)
Matsumoto, T., Koguchi, M., Suzuki, K., Nishimura, H., Motoyoshi, Y., Wada, N.: Ferroelectric \(90^\circ \) domain structure in a thin film of BaTiO\(_3\) fine ceramics observed by 300 kV electron holography. Appl. Phys. Lett. 92, 072902 (2008)
McCartney, M.R., Gajdardziska-Josifovska, M.: Absolute measurement of normalized thickness, \(t/{\lambda } i\), from off-axis electron holography. Ultramicroscopy 53, 283 (1994)
McCartney, M.R., Smith, D.J., Farrow, R.F.C., Marks, R.F.: Off-axis electron holography of epitaxial FePt films. J. Appl. Phys. 82, 2461 (1997)
McCartney, M.R., Ponce, F.A., Cai, J., Bour, D.P.: Mapping electrostatic potential across an AlGaN/InGaN/AlGaN diode by electron holography. Appl. Phys. Lett. 76, 3055 (2000)
McFadyen, I.R., Chapman, J.N.: EMSA Bull. 22, 64 (1992)
Mcgibbon, A.J., Pennycook, S.J., Angelo, J.E.: Direct observation of dislocation core structures in CDTE/GAAS(001). Science 269, 519 (1995)
McVitie, S., Chapman, J.N., Zhou, L., Heyderman, L.J., Nicholson, W.A.P.: In-situ magnetising experiments using coherent magnetic imaging in TEM. J. Magn. Magn. Mater. 148, 232 (1995)
Meyer, R.R., Sloan, J., Dunin-Borkowski, R.E., Kirkland, A.I., Novotny, M.C., Bailey, S.R., Hutchison, J.L., Green, M.L.H.: Discrete atom imaging of one-dimensional crystals formed within single-walled carbon nanotubes. Science 289, 1324 (2000)
Meyer, R.R., Kirkland, A.I., Saxton, W.O.: A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations. Ultramicroscopy 92, 89 (2002)
Midgley, P.A.: An introduction to off-axis electron holography. Micron 32, 167 (2001)
Mobus, G.: Retrieval of crystal defect structures from HREM images by simulated evolution I. Basic technique. Ultramicroscopy 65, 205 (1996)
Mobus, G., Gemming, T., Gumbsch, P.: The influence of phonon scattering on HREM images. Acta Crystallogr. Sect. A. 54, 83 (1998)
Mochizuki, M.: Spin-wave modes and their intense excitation effects in skyrmion crystals. Phys. Rev. Lett. 108, 017601 (2012)
Möllenstedt, G., Bayh, W.: Kontinuierliche phasenschiebung von elektronenwellen im kraftfeldfreien raum durch das magnetische vektorpotential eines solenoids. Physikalische Bl. 18, 299 (1962)
Mollenstedt, G., Wahl, H.: Elektronenholographie und Rekonstruktion mit Laserlicht. Naturwissenschaften 55, 340 (1968)
Mornet, S., Vasseur, S., Grasset, F., Duguet, E.: Magnetic nanoparticle design for medical diagnosis and therapy. J. Mater. Chem. 14, 2161 (2004)
Morrison, G.R., Chapman, J.N.: Optik 64, 1 (1983)
Morrison, G.R., Gong, H., Chapman, J.N., Hrnciar, V.: The measurement of narrow domain-wall widths in SmCo5 using differential phase contrast electron microscopy. J. Appl. Phys. 64, 1338 (1988)
Müller, E., Gerthsen, D., Brückner, P., Sholz, F., Gruber, T., Wang, A.: Probing the electrostatic potential of charged dislocations in n-GaN and n-ZnO epilayers by transmission electron holography. Phys. Rev. B. 73, 245316 (2006)
Murakami, Y., Kasai, H., Kim, J.J., Mamishin, S., Shindo, D., Mori, S., Tonomura, A.: Ferromagnetic domain nucleation and growth in colossal magnetoresistive manganite. Nat. Nanotechnol. 5, 37 (2009)
Nadarzinski, K., Ernst, F.: The atomistic structure of a Sigma = 3, (111) grain boundary in NiAl, studied by quantitative high-resolution transmission electron microscopy. Philos. Mag. A. 74, 641 (1996)
Neubauer, A., Pfleiderer, C., Binz, B., Rosch, A., Ritz, R., Niklowitz, P.G., Böni, P.: Topological hall effect in the a phase of MnSi. Phys. Rev. Lett. 102, 186602 (2009)
O’Keefe, M.A., Hetherington, C.J.D., Wang, Y.C., Nelson, E.C., Turner, J.H., Kisielowski, C., Malm, J.O., Mueller, R., Ringnalda, J., Pan, M., Thust, A.: Sub-Angstrom high-resolution transmission electron microscopy at 300 keV. Ultramicroscopy 89, 215 (2001)
Onose, Y., Okamura, Y., Seki, S., Ishiwata, S., Tokura, Y.: Observation of magnetic excitations of skyrmion crystal in a helimagnetic insulator Cu\(_2\)OSeO\(_3\). Phys. Rev. Lett. 109, 037603 (2012)
Orchowski, A., Lichte, H.: High-resolution electron holography of non-periodic structures at the example of a \(\Sigma \) = 13 grain boundary in gold. Ultramicroscopy 64, 199 (1996)
Orchowski, A., Rau, W.D., Lichte, H.: Electron holography surmounts resolution limit of electron microscopy. Phys. Rev. Lett. 74, 399 (1995)
Osakabe, N., Yoshida, K., Horiuchi, Y., Matsuda, T., Tanabe, H., Okuwaki, T., Endo, J., Fujiwar, H., Tonomura, A.: Observation of recorded magnetization pattern by electron holography. Appl. Phys. Lett. 42, 746 (1983)
Otten, M.T., Mul, P.M., Dejong, M.J.C.: Design and performance of the CM20 FEG field-emission TEM. Microsc. Microanal. Microstruct. 3, 83 (1992)
Peng, L.M., Ren, G., Dudarev, S.L., Whelan, M.J.: Debye-Waller factors and absorptive scattering factors of elemental crystals. Acta Crystallogr. Sect. A. 52, 456 (1996)
Phatak, C., Petfordtong, A.K., Graef, M.D.: Three dimensional study of the vector potential of magnetic structures. phys. Rev. Lett. 104, 253901 (2010)
Phillipp, F., Du, K., Jin-Phillipp, N.Y.: Quantitative HRTEM studies on local lattice distortions in strained materials systems. Mater. Chem. Phys. 81, 205 (2003)
Ploessl, R., Chapman, J.N., Scheinfein, M.R., Blue, J.L., Mansuripur, M., Hoffmann, H.: Micromagnetic structure of domains in Co/Pt multilayers. I. Investigations of wall structure. J. Appl. Phys. 74, 7431 (1993)
Pollard, S.D., Huang, L., Buchanan, K.S., Arena, D.A., Zhu, Y.: Direct dynamic imaging of non-adiabatic spin torque effects. Nat. Commun. 3, 1028 (2012)
Qian, W., Spence, J.C.H., Zuo, J.M.: Transmission low-energy electron diffraction (TLEED) and its application to the low-voltage point-projection micnscok. Acta Crystallogr. Sect. A49, 436 (1993)
Rau, W.D., Schwander, P., Baumann, F.H., Höppner, W., Ourmazd, A.: Two-dimensional mapping of the electrostatic potential in transistors by electron holography. Phys. Rev. Lett. 82, 2614 (1999)
Ravikumar, V., Rodrigues, R.P., Dravid, V.P.: Direct imaging of spatially varying potential and charge across internal interfaces in solids. Phys. Rev. Lett. 75, 4063 (1995)
Ravikumar, V., Rodrigues, R.P., Dravid, V.P.: Space-charge distribution across internal interfaces in electroceramics using electron holography: II, Doped grain boundaries. J. Am. Ceram. Soc. 80, 1131 (1997a)
Ravikumar, V., Rodrigues, R.P., Dravid, V.P.: Space-charge distribution across internal interfaces in electroceramics using electron holography: I, Pristine grain boundaries. J. Am. Ceram. Soc. 80, 1117 (1997b)
Reimer, L.: Springer Series in Optical Sciences, p. 36. Springer, Berlin (1984)
Reimer, L., Kohl, H.: Transmission Electron Microscopy: Physics of Image Formation, 5th edn. Springer Science+Business Media, LLC, 233 Spring Street, New York, USA (2008)
Romming, N., Hanneken, C., Menzel, M., Bickel, E.J., Wolter, B., Bergmann, V.K., Kubetzka, A., Wiesendanger, R.: Writing and deleting single magnetic skyrmions. Science 341, 636 (2013)
Rose, H.: Inhomogeneous wien filter as a corrector compensating for the chromatic and spherical-aberration of low-voltage electron-microscopes. Optik 84, 91 (1990)
Rose, H.: Nonstandard imaging methods in electron microscopy. Ultramicroscopy 2, 251 (1997)
Rose, H., Preikszas, D.: Outline of a versatile corrected LEEM. Optik 92, 31 (1992)
Rosenauer, A., Gerthsen, D.: Atomic scale strain and composition evaluation from high-resolution transmission electron microscopy images. In: Hawkes, P.W. (ed.) Advances in imaging and electron physics, p. 121. Academic Press, San Diego (1999)
Saito, K., Park, H.S., Shindo, D., Yoshizawa, Y.: J. Magn. Magn. Mater. 305, 304 (2006)
Sasaki, H., Yamamoto, K., Hirayama, T., Ootomo, S., Matsuda, T., Iwase, F., Nakasaki, R., Ishii, H.: Mapping of dopant concentration in a GaAs semiconductor by off-axis phase-shifting electron holography. Appl. Phys. Lett. 89, 244101 (2006)
Sasaki, H., Ootomo, S., Matsuda, T., Ishii, H.: Observation of carrier distribution in compound semiconductors using off-axis electron holography. Furukawa Rev. 34, 24 (2008)
Saxton, W.O.: Proceedings 11th International Congress on Electron Microscopy, Kyoto, p. 1 (1986)
Saxton, W.O.: What is the focus variation method-is it new-is it direct. Ultramicroscopy 55, 171 (1994)
Sayre, D.: The squaring method: a new method for phase determination. Acta Cryst. B5, 60–65 (1952)
Scherzer, O.: The theoretical resolution limit of the electron microscope. J. Appl. Phys., 20 (1949)
Schiske, P.: Proceedings 4th Europegn Conference on Electron Microscopy Rome, p. 145 (1968)
Schiske, P.: Image reconstruction by means of focus series. J. Microsc. Oxf. 207, 154 (2002)
Schofield, M.A., Beleggia, M., Zhu, Y., Guth, K., Jooss, C.: Direct evidence for negative grain boundary potential in Ca-doped and undoped YBa\(_2\) Cu\(_3\)O\(_7\)-x. Phys. Rev. Lett. 92, 195502 (2004)
Schofield, M.A., Beleggia, M., Lau, J.W., Zhu, Y.: Characterization of the JEM-2100F-LM TEM for electron holography and magnetic imaging. JEOL News 42, 1 (2007)
Schwander, P., Rau, W.D., Ourmazd, A.: Composition mapping at high resolution. J. Microsc. 190, 171 (1998)
Seitz, H., Ahlborn, K., Seibt, M., Schröter, W.: Sensitivity limits of strain mapping procedures using high-resolution electron microscopy. J. Microsc. 190, 184 (1998)
Seki, S., Yu, X.Z., Ishiwata, S., Tokura, Y.: Observation of skyrmions in a multiferroic material. Science 336, 198 (2012)
Shannon, C.E., Weaver, W.: The Mathematical Theory of Communication. University of Illinois Press (1949)
Shindo, D., Park, Y.G., Yoshizawa, Y.: Magnetic domain structures of Fe\(_{73.5}\)Cu\(_1\)Nb\(_3\)Si\(_{13.5}\)B\(_9\) films studied by electron holography. J. Magn. Magn. Mater. 238, 101 (2002)
Shindo, D., Park, Y.G., Gao, Y.H., Park, H.S.: Electron holography of Fe-based nanocrystalline magnetic materials. J. Appl. Phys. 95, 6521 (2004)
Sickmann, J., Formánek, P., Linck, M., Lichte, H.: Extended field of view for medium resolution electron holography at Philips CM200 microscope. EMC 1, 277 (2008)
Sickmann, J., Formánek, P., Linck, M., Muehle, U., Lichte, H.: Imaging modes for potential mapping in semiconductor devices by electron holography with improved lateral resolution. Ultramicroscopy 111, 290 (2011)
Simon, P., Tang, Z., Carrillo-Cabrera, W., Chiong, K., Böhme, B., Baitinger, M., Lichte, H., Grin, Y., Guloy, A.M.: Synthesis and electron holography studies of single crystalline nanostructures of clathrate-ii phases K\(_{x}\)Ge\(_{136}\) and Na\(_{x}\)Si\(_{136}\). J. Am. Chem. Soc. 133, 7596 (2018)
Simpson, E.T., Kasama, T., Pósfai, M., Buseck, P.R., Harrison, R.J., Dunin-Borkowski, R.E.: Magnetic induction mapping of magnetite chains in magnetotactic bacteria at room temperature and close to the Verwey transition using electron holography. J. Phys. Conf. Ser. 17, 108 (2005)
Sinkler, W., Marks, L.D.: Dynamical direct methods for everyone. Ultramicroscopy 75, 251 (1999)
Skyrme, T.H.R.: Particle states of a quantized meson field. Proc. R. Soc. A. 262, 237 (1961)
Skyrme, T.H.R.: A unified field theory of mesons and baryons. Nucl. Phys. 31, 556 (1962)
Smith, D.J., Cullen, D.A., Zhou, L., McCartney, M.R.: Application of TEM imaging, analysis and electron holography to III-nitride HEMT devices. Microelectron. Reliab. 50, 1514 (2010)
Spence, J.C.H.: High-Resolution Electron Microscopy, 3rd edn. Oxford University Press, Oxford (2003)
Spence, J.C.H., Zuo, J.M.: Electron microdiffraction. Plenum Press, New York (1992)
Spence, J.C.H., Cowley, J.M., Zuo, J.M.: Comment on "Electron holographic study of ferroelectric domain walls". Appl. Phys. Lett. 62, 2446 (1993)
Su, D.S., Jacob, T., Hansen, T.W., Wang, D., Schlogl, R., Freitag, B., Kujawa, S.: Surface chemistry of Ag particles: identification of oxide species by aberration-corrected TEM and by DFT calculations. Angew. Chem. Int. Edit. 47, 5005 (2008)
Tanaka, M., Saito, R., Sekii, H.: Point-group determination by convergent-beam electron diffraction. Acta Crystallogr. Sect. A 39 (1983)
Tang, C.Y., Li, F.H.: Restoring atomic configuration at interfaces by image deconvolution. J. Electron Microsc. 54, 445 (2005)
Tang, C.Y., Li, F.H., Wang, R., Zou, J., Zheng, X.H., Liang, J.W.: Atomic configurations of dislocation core and twin boundaries in 3C-SiC studied by high-resolution electron microscopy. Phys. Rev. B. 75, 184103 (2007)
Tang, D., Li, F.H.: A method of image-restoration for pseudo-weak-phase objects. Ultramicroscopy 25, 61 (1988)
Tang, D., Teng, C.M., Zou, J., Li, F.H.: Pseudo-weak-phase-object approximation in high-resolution electron-microscopy. II. Feasibility of directly observing Li+. Acta Cryst. B. 42, 340 (1986)
Tao, J., Niebieskikwiat, D., Varela, M., Luo, W., Schofield, M.A., Zhu, Y., Salamon, M.B., Zuo, J.M., Pantelides, S.T., Pennycook, S.J.: Direct imaging of nanoscale phase separation in La\(_{0.55}\)Ca\(_{0.45}\)MnO\(_3\): relationship to colossal magnetoresistance. Phys. Rev. Lett. 103, 097202 (2009)
Telesnin, R.V., Ilycheva, E.N., Kanavina, N.G., Osukhovskii, V.E., Shishkov, A.G.: Phys. Stat. Sol. 34, 443 (1969)
Thon, T.: Phase contrast electron microscopy. In: Valdrè, U. (ed.) Electron Microscopy in Material Science, p. 570. Academic Press, New York and London (1971)
Thust, A., Coene, W.M.J., deBeeck, M.O., VanDyck, D.: Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects. Ultramicroscopy 64, 211 (1996a)
Thust, A., Overwijk, M.H.F., Coene, W.M.J., Lentzen, M.: Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy 64, 249 (1996b)
Thust, A., Lentzen, M., Urban, K.: Nonlinear reconstruction of the exit plane-wave function from periodic high-resolution electron-microscopy images. Ultramicroscopy 53, 101 (1994)
Tian, H.F., Sun, J.R., Lü, H.B., Jin, K.J., Yang, H.X., Yu, H.C., Li, J.Q.: Electrostatic potential in manganite-based heterojunctions by electron holography. Appl. Phys. Lett. 87, 164102 (2005a)
Tian, H.F., Yu, H.C., Zhu, X.H., Wang, Y.G., Zheng, D.N., Yang, H.X., Li, J.Q.: Off-axis electron holography and microstructure of Ba\(_{0.5}\)Sr\(_{0.5}\)TiO\(_3\) thin films on LaAlO\(_3\). Phys. Rev. B. 71, 115419 (2005b)
Tonomura, A.: Electron Holography, 2nd edn. Springer Series. Springer, Berlin (1999). Opt. Sci. 70
Tonomura, A.: Direct observatian of thithertoun observable quantum phenomena by using electrons. PNAS 102, 14952 (2005)
Tonomura, A., Matsuda, T., Tanabe, H., Osakabe, N., Endo, J., Fukuhara, A., Shinagawa, K., Fujiwara, H.: Electron holography technique for investigating think ferromagnetic films. Phys. Rev. Lett. 25, 6799 (1982)
Tonomura, A., Matsuda, T., Endo, J., Arii, T., Mihama, K.: Holographic interference electron microscopy for determining specimen magnetic structure and thickness distribution. Phys. Rev. B. 34, 3397 (1986a)
Tonomura, A., Osakabe, N., Matsuda, M., Kawasaki, T., Endo, J., Yano, S., Yamada, H.: Evidence for the Aharonov-Bohm effect with magnetic field completely shielded from electron wave. Phys. Rev. Lett. 56, 792 (1986b)
Tonomura, A., Kasai, H., Kaminuma, O., Matsuda, T., Harada, K., Nakayama, Y., Shomoyama, J., Kishio, K., Hanaguri, T., Kitazawa, K., Sasae, M., Okayasu, S.: Observation of individual vortices trapped along columnar defects in high-temperature superconductors. Nature 412, 620 (2001)
Tonomura, A., Yu, X.Z., Yanagisawa, K., Matsuda, T., Onose, Y., Kanazawa, N., Park, S.H., Tokura, Y.: Real-space observation of skyrmion lattice in helimagnet MnSi thin samples. Nano Lett. 12, 1673 (2012)
Tripp, S.L., Dunin-Borkowski, R.E., Wei, A.: Flux closure in self-assembled cobalt nanoparticle rings. Angew. Chem. Int. Ed. 42, 5591 (2003)
Tsuno, K., Inoue, M.: Double gap objective lens for observing magnetic domains by means of differential phase contrast electron microscopy. Optik 67, 363 (1984)
Tsuno, K., Taoka, T.: Magnetic-field-free objective lens around a specimen for observing fine structure of ferromagnetic materials in a transmission electron microscope. J. Appl. Phys. 22, 1041 (1983)
Twitchett, C., Dunin-Borkowski, R.E., Midgley, P.A.: Quantitative electron holography of biased semiconductor devices. Phys. Rev. Lett. 88, 238302 (2002)
Twitchett-Harrison, C., Yates, T.J.V., Dunin-Borkowski, R.E., Newcomb, S.B., Midgley, P.A.: Three-dimensional electrostatic potential of a Si p-n junction revealed using tomographic electron holography. J. Phys. Conf. Ser. 26, 29 (2006)
Twitchett-Harrison, A.C., Yates, T.J.V., Newcomb, S.B., Dunin-Borkowski, R.E., Midgley, P.A.: High-resolution three-dimensional mapping of semiconductor dopant potentials. Nano Lett. 7, 2020 (2007)
Twitchett-Harrison, C., Yates, T.J.V., Dunin-Borkowski, R.E., Midgley, P.A.: Quantitative electron holographic tomography for the 3D characterisation of semiconductor device structures. Ultramicroscopy 108, 1401 (2008)
Uhlig, T., Heumann, M., Zweck, J.: Development of a specimen holder for in situ generation of pure in-plane magnetic fields in a transmission electron microscope. Ultramicroscopy 94, 193 (2003)
Unwin, P.N.T., Henderson, R.: Molecular-structure determination by electron-microscopy of unstained crystalline specimens. J. Mol. Biol. 94, 425 (1975)
Van Dyck, D., de Beeck, M.O.: Focus variation electron holography. In: Völkl, E., Allard, L.F., Joy, D.C. (eds.) Introduction to Electron Holography. Kluwer Academic/Plenum Publishers, New York (1999)
Van Dyck, D., Debeeck, M.O., Coene, W.: A new approach to object wave-function reconstruction in electron-microscopy. Optik 93, 103 (1993)
Vincent, R., Bird, D.M., Steeds, J.W.: Structure of AuGeAs determined by convergent-beam electron diffraction. I: derivation of basic structure. Philos. Mag. A Phys. Condens. Matter Struct. Defects Mech. Prop. 50, 745 (1984)
Voelkl, E., Tang, D.: Approaching routine 2\(\pi \)/1000 phase resolution for off-axis type holography. Ultramicroscopy 110, 447 (2010)
Völkl, E., Allard, L.F., Joy, D.C.: Late Pleistocene Megafaunal Extinctions: A European Perspective. Kluwer Academic/Plenum Publishers, New York (1999)
Volkov, V.V., Crew, D.C., Zhu, Y., Lewis, L.H.: Magnetic field calibration of a transmission electron microscope using a permanent magnet material. Rev. Scient. Instr. 73, 2298 (2002)
Wan, Z.H., Liu, Y.D., Fu, Z.Q., Li, Y., Cheng, T.Z., Li, F.H., Fan, H.F.: Visual computing in electron crystallography. Z. Kristallogr. 218, 308 (2003)
Wang, R.M.: Reconstruction of electron exit waves: basic theory and applications. J. Chin. Electron Microsc. Soc. (1) (2006)
Wang, Y.G., Dravid, V.P.: Determination of electrostatic characteristics at a 24 degree, [001] tilt grain boundary in a SrTiO\(_3\) bicrystal by electron holography. Phil. Mag. Lett. 82, 425 (2002)
Wang, D., Chen, H., Li, F.H., Kawasaki, K., Oikawa, T.: Atomic configuration in core structure of lomer dislocation in Si\(_{0.76}\)Ge\(_{0.24}\)/Si. Ultramicroscopy 93, 139 (2002)
Wang, H.B., Jiang, H., Li, F.H., Che, G.C., Tang, D.: A study on the position of boron atoms in (Y\(_{0.6}\)Ca\(_{0.4})\)(SrBa)(Cu \(_{2.5}\)B \(_{0.5})\)O\(_{7}\)- delta. Acta Cryst. A. A58, 494 (2002)
Wang, D., Zou, J., He, W.Z., Chen, H., Li, F.H., Kawasaki, K., Oikawa, T.: Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM. Ultramicroscopy 98, 259 (2004a)
Wang, H.B., Wang, Y.M., Li, F.H.: A further discussion on the peculiarity of maximum entropy image deconvolution in HREM. Ultramicroscopy 99, 165 (2004b)
Wang, Y.M., Wang, H.B., Li, F.H., Jia, L.S., Chen, X.L.: Maximum entropy image deconvolution applied to structure determination for crystal Nd\(_{1.85}\)Ce\(_{0.15}\)CuO\(_{4-\updelta }\). Micron 36, 393 (2005)
Wang, H.Y., Dai, X.F., Wang, Y.G., Duan, X.F., Wu, G.H.: In situ observation of magnetic domain structure in Co\(_{50}\)Ni\(_{50}\)FeGa\(_{59}\) alloy under the applied magnetic field. Mater. Trans. 48, 2255 (2007)
Wang, R.M., Dmitrieva, O., Farle, M., Dumpich, G., Ye, H.Q., Poppa, H., Kilaas, R., Kisielowski, C.: Layer resolved structural relaxation at the surface of magnetic FePt icosahedral nanoparticles. Phys. Rev. Lett. 100, 017205 (2008a)
Wang, S.X., Li, G.X.: Advances in giant magnetoresistance biosensors with magnetic nanoparticle tags: review and outlook. IEEE Trans. Magn. 44, 1687 (2008b)
Wang, Y.M., Wan, W., Wang, R., Li, F.H., Che, G.C.: Atomic configurations of twin boundaries and twinning dislocation in superconductor Y\(_{0.6}\)Na\(_{0.4}\) Ba\(_{2}\)Cu\(_{2.7}\)Zn\(_{0.3}\)O\(_{7-delta}\). Philos. Mag. Lett. 88, 481 (2008c)
Wang, Z., Yao, Y., He, X., Yang, Y., Gu, L., Wang, Y., Duan, X.: Invetigation of strain and thin film relaxation in Gexsirx/si Strained-layer superlattice by dark-fied electron holography. Mater. Trans. 53, 2019 (2012)
Wanner, M., Bach, D., Gerthsena, D., Wernerb, R., Tesche, B.: Electron holography of thin amorphous carbon films: measurement of the mean inner potential and a thickness-independent phase shift. Ultramicroscopy 106, 34 (2006)
Wei, Q., Wu, Z., Sun, K., Ponce, F.A., Hertkorn, J., Scholz, F.: Evidence of two-dimensional hole gas in p-type AlGaN/AlN/GaN heterostructures. Appl. Phys. Express 2, 121001 (2009)
Wei, Q.Y., Wu, Z.H., Ponce, F.A., Hertkorn, J., Scholz, F.: Polarization effects in 2-DEG and 2-DHG AlGaN/AlN/GaN multi-heterostructures measured by electron holography. Phys. Status solidi B 247, 1722 (2010)
Weickenmeier, A., Kohl, H.: Computation of absorptive form factors for high-energy electron diffraction. Acta Crystallogr. Sect. A 47, 590 (1991)
Wen, C., Wang, Y.M., Wan, W., Li, F.H., Liang, J.W., Zou, J.: Nature of interfacial defects and their roles in strain relaxation at highly lattice mismatched 3C-SiC/Si (001) interface. J. Appl. Phys. 106, 073522 (2009)
Wilson, A.J.C.: The probability distribution of x-ray intensities. Acta Crystallogr. 2, 318 (1949)
Wolf, D., Lubk, A., Lichte, H., Friedrich, H.: Towards automated electron holographic tomography for 3D mapping of electrostatic potentials. Ultramicroscopy 110, 390 (2010)
Wolf, D., Lichte, H., Pozzi, G., Prete, P., Lovergine, N.: Electron holographic tomography for mapping the three-dimensional distribution of electrostatic potential in III-V semiconductor nanowires. Appl. Phys. Lett. 98, 264103 (2011)
Woolfson, M.M.: An improvement of the heavy-atom method of solving crystal structures. Acta Cryst. A 9, 804 (1956)
Woolfson, M.M., Fan, H.F.: Physical and Non-Physical Methods of Solving Crystal Structure, p. 221. Cambridge University Press, Cambridge (1995)
Wu, Z.H., Stevens, M., Ponce, F.A., Lee, W., Ryou, J.H., Yoo, D., Dupuis, R.D.: Mapping the electrostatic potential across AlGaN/AlN/GaN heterostructures using electron holography. Appl. Phys. Lett. 90, 032101 (2007)
Xia, W.X., Tohara, K., Murakami, Y., Shindo, D., Ito, T., Iwasaki, Y., Tachibana, J.: Observation of magnetization of obliquely evaporated Co-CoO magnetic recording tape. IEEE Trans. Magn. 42, 3252 (2006)
Xu, Q.Y., Wang, Y., Wang, Y.G., Du, X.L., Xue, Q.K., Zhang, Z.: Polarity determination of ZnO thin films by electron holography. Appl. Phys. Lett. 84, 2067 (2004)
Xu, X., Beckman, S.P., Specht, P., Weber, E.R., Chrzan, D.C., Erni, R.P., Arslan, I., Browning, N., Bleloch, A., Kisielowski, C.: Distortion and segregation in a dislocation core region at atomic resolution. Phys. Rev. Lett. 95, 145501 (2005)
Yamamoto, K., Kawajiri, I., Tanji, T., Hibino, M., Hirayama, T.: High precision phase-shifting electron holography. J. Electron Micros. 49, 31 (2000)
Yamamoto, K., Hirayama, T., Tanji, T., Hibino, M.: Evaluation of high-precision phase-shift electron holography by using hologram simulation. Surf. Interface Anal. 35, 60 (2003)
Yamamoto, K., Hirayama, T., Tanji, T.: Off-axis electron holography without Fresnel fringes. Ultramicroscopy 101, 265 (2004)
Yamamoto, K., Sugwara, Y., McCartney, M.R., Smith, D.J.: Phase-shifting electron holography for atomic image reconstruction. Jpn. Soc. Microsc. 59, S81 (2010a)
Yamamoto, K., Iriyama, Y., Asaka, T., Hirayama, T., Fujita, H., Fisher, C.A.J., Nonaka, K., Sugita, Y., Ogumi, Z.: Dynamic visualization of the electric potential in an all-solid-state rechargeable lithium battery. Angew. Chem. Int. Ed. 49, 4414 (2010b)
Yamamoto, K., Hogg, C.R., Yamamuro, S., Hirayama, T., Majetich, S.A.: Dipolar ferromagnetic phase transition in Fe\(_{3}\)O\(_{4}\) nanoparticle arrays observed by Lorentz microscopy and electron holography. Appl. Phys. Lett. 98, 072509 (2011)
Yang, S.X., Li, F.H.: Image deconvolution for protein crystals. Ultramicroscopy 85, 51 (2000)
Yang, Y., Wang, W.X., Yan, Y., Liu, H.F., Naganuma, H., Sakul, T.S., Han, X.F., Yu, R.C.: Chemical diffusion: another factor offecting the magnetoresistance ratio in Ta/CoFeB/MgO/CoFeB/Ta magnetic tunnel junction. Appl. Phys Lett. 101, 012406 (2012a)
Yang, Y., Niu, N., Li, C., Yao, Y., Piao, G., Yu, R.C.: Electron holography characterization as a method for measurements of diameter and mean inner potential of hollow wamomaterials. Nanoscale 4, 7460 (2012b)
Yao, Y., Yang, Y., Duan, X.F., Wang, Y.G., Yu, R.C., Xu, Q.X.: Electron holography characterization of the electrostatic potential of thin high-\(\kappa \) dielectric film embedded in gate stack. Appl. Phys. Lett. 99, 163506 (2011)
Yao, Y., Li, C., Huo, Z.L., Liu, M., Zhu, C.X., Gu, C.Z., Duan, X.F., Wang, Y.G., Yu, R.C.: In situ electran holography study of charge distribution in high-kappa charge-trapping memory. Nat. Comm. 4, 2764 (2013)
Yi, G., Nicholson, W.A.P., Lim, C.K., Chapman, J.N., Mcvitie, S., Wilkinson, C.D.W.: A new design of specimen stage for in situ magnetising experiments in the transmission electron microscope. Ultramicroscopy 99, 65 (2004)
Yoo, J.H., Murakami, Y., Shindo, D., Atou, T., Kikuchi, M.: Behavior of magnetic domains in La\(_{0.46}\)Sr\(_{0.54}\)MnO\(_{3}\) during the ferromagnetic phase transformation studied by electron holography. Phys. Rev. B. 66, 212406 (2002)
Yoshida, T., Matsuda, T., Fukuhara, A., Tonomura, A.: Electron holography observation of flux-line dynamics. In: Proceedings of Boston: 50th Meeting of Electron Microscopy Society of America (1992)
Yoshida, H., Kohno, H., Ichikawa, S., Akita, T., Takeda, S.: Inner potential fluctuation in SiC nanowires with modulated interior structure. Mater. Lett. 61, 3134 (2007)
Yu, X.Z., Onose, Y., Kanazawa, N., Park, J.H., Han, J.H., Matsui, Y., Nagaosa, N., Tokura, Y.: Real-space observation of a two-dimensional skyrmion crystal. Nature 465, 901 (2010)
Yu, X.Z., Kanazawa, N., Onose, Y., Kimoto, K., Zhang, W.Z., Ishiwata, S., Matsui, Y., Tokura, Y.: Near room-temperature formation of a skyrmion crystal in thin-films of the helimagnet FeGe. Nat. Mater. 10, 106 (2011)
Yu, X.Z., Kanazawa, N., Zhang, W.Z., Nagai, T., Hara, T.T., Kimoto, K., Matsui, Y., Onose, Y., Tokura, Y.: Skyrmion flow near room temperature in an ultralow current density. Nat. Commun. 3, 988 (2012)
Yu, X.Z., DeGrave, J.P., Hara, Y., Hara, T., Jin, S., Tokura, Y.: Observation of the magnetic skyrmion lattice in a MnSi nanowire by Lorentz TEM. Nano. Lett. 13, 3755 (2013)
Yu, X.Z., Tokunaga, Y., Kaneko, Y., Zhang, W.Z., Kimoto, K., Matsui, Y., Taguchi, Y., Tokura, Y.: Biskyrmion states and their current-driven motion in a layered manganite. Nat. Commun. 5, 3198 (2014)
Yuzi, G., Yuzo, O.: In situ lorentz microscopy observation of displaced chain walls in permalloy. J. Phys. Soc. Jpn. 15, 535 (1960)
Zhang, X., Hashimoto, T., Joy, D.C.: Electron holographic study of ferroelectric domain walls. Appl. Phys. Lett. 60, 784 (1992)
Zhang, X., Joy, D.C., Zhang, Y., Hashimoto, T., Allard, L., Nolan, T.A.: Electron holography techniques for study of ferroelectric domain walls. Ultramicroscopy 51, 21 (1993)
Zheng, H., Cao, A., Weinberger, C.R., Huang, J.Y., Du, K., Wang, J., Ma, Y., Xia, Y., Mao, S.X.: Discrete plasticity in sub-10-nm-sized gold crystals. Nat. Commun. 1, 144 (2010)
Zhou, L., Cullen, D.A., Smith, D.J., McCartney, M.R., Mouti, A., Gonschorek, M., Feltin, E., Carlin, J.F., Grandjean, N.: Polarization field mapping of Al\(_{0.85}\)In\(_{0.15}\)N/AlN/GaN heterostructure. Appl. Phys. Lett. 94, 121909 (2009)
Zhou, L., Smith, D.J., McCartney, M., Xu, T., Moustakas, T.D.: Measurement of electric field across individual wurtzite GaN quantum dots using electron holography. Appl. Phys. Lett. 99, 101905 (2011)
Zhu, Y., Inada, H., Nakamura, K., Wall, J.: Imaging single atoms using secondary electrons with an aberration-corrected electron microscope. Nat. Mater. 8, 808 (2009)
Zuo, J.M.: Automated structure-factor refinement from convergent-beam electron diffraction patterns. Acta Crystallogr. Sect. A 49, 429 (1993)
Zou, X., Sundberg, M., Larine, M., Hovmoller, S.: Structure projection retrieval by image processing of HREM images taken under non-optimum defocus conditions. Ultramicroscopy 62, 103 (1996)
Zuo, J.M., Tao, J.: Scanning Transmission Electron Microscopy: Imaging and Analysis. Springer, London (2010)
Zuo, J.M., O’Keeffe, M., Rez, P., Spence, J.C.H.: Charge density of MgO: implications of precise new measurements for theory. Phys. Rev. Lett. 78, 4777 (1997a)
Zuo, J.M., Blaha, P., Schwarz, K.: The theoretical charge density of silicon: experimental testing of exchange and correlation potentials. J. Phys. Condens. Matter 9, 7541 (1997b)
Zuo, J.M., O’Keeffe, M., Rez, P., Spence, J.C.H.: Direct observation of d-orbital holes and Cu-Cu bonding in Cu\(_2\)O. Nature 401, 49 (1999)
Zuo, J.M., Gao, M., Tao, J., Li, B.Q., Twesten, R., Petrov, I.: Coherent nano-area electron diffraction. Microsc. Res. Tech. 64, 347 (2004)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Peking University Press and Springer Nature Singapore Pte Ltd.
About this chapter
Cite this chapter
Wang, R. et al. (2018). Transmission Electron Microscopy. In: Wang, R., Wang, C., Zhang, H., Tao, J., Bai, X. (eds) Progress in Nanoscale Characterization and Manipulation. Springer Tracts in Modern Physics, vol 272. Springer, Singapore. https://doi.org/10.1007/978-981-13-0454-5_3
Download citation
DOI: https://doi.org/10.1007/978-981-13-0454-5_3
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-13-0453-8
Online ISBN: 978-981-13-0454-5
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)